JPS6339954U - - Google Patents

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Publication number
JPS6339954U
JPS6339954U JP13235686U JP13235686U JPS6339954U JP S6339954 U JPS6339954 U JP S6339954U JP 13235686 U JP13235686 U JP 13235686U JP 13235686 U JP13235686 U JP 13235686U JP S6339954 U JPS6339954 U JP S6339954U
Authority
JP
Japan
Prior art keywords
layer
insulating film
amorphous silicon
thin film
film transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13235686U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13235686U priority Critical patent/JPS6339954U/ja
Publication of JPS6339954U publication Critical patent/JPS6339954U/ja
Pending legal-status Critical Current

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  • Bipolar Transistors (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の実施例構成図、第2図はその
製造工程説明図である。 1……絶縁基板、2……絶縁膜、3……フオト
レジスト、4……コレクタ電極、5……コレクタ
層、6……ベース電極、7……ベース層、8……
エミツタ層、9……エミツタ電極、10……薄膜
トランジスタ、11……絶縁膜。
FIG. 1 is a configuration diagram of an embodiment of the present invention, and FIG. 2 is an explanatory diagram of its manufacturing process. DESCRIPTION OF SYMBOLS 1...Insulating substrate, 2...Insulating film, 3...Photoresist, 4...Collector electrode, 5...Collector layer, 6...Base electrode, 7...Base layer, 8...
Emitter layer, 9... Emitter electrode, 10... Thin film transistor, 11... Insulating film.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 非晶質シリコンのバイポーラ型薄膜トランジス
タにおいて、ベース層と異なる第一層および該第
一層の電極を絶縁膜中に形成し、該第一層の上面
と絶縁膜の上面とをほぼ同一平面としその上部に
ベース層を配置するように構成したことを特徴と
する非晶質シリコン薄膜トランジスタ。
In an amorphous silicon bipolar thin film transistor, a first layer different from a base layer and an electrode of the first layer are formed in an insulating film, and the upper surface of the first layer and the upper surface of the insulating film are made substantially the same plane. An amorphous silicon thin film transistor characterized in that it is configured such that a base layer is disposed on top.
JP13235686U 1986-08-29 1986-08-29 Pending JPS6339954U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13235686U JPS6339954U (en) 1986-08-29 1986-08-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13235686U JPS6339954U (en) 1986-08-29 1986-08-29

Publications (1)

Publication Number Publication Date
JPS6339954U true JPS6339954U (en) 1988-03-15

Family

ID=31031665

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13235686U Pending JPS6339954U (en) 1986-08-29 1986-08-29

Country Status (1)

Country Link
JP (1) JPS6339954U (en)

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