JPS6339100B2 - - Google Patents

Info

Publication number
JPS6339100B2
JPS6339100B2 JP58160685A JP16068583A JPS6339100B2 JP S6339100 B2 JPS6339100 B2 JP S6339100B2 JP 58160685 A JP58160685 A JP 58160685A JP 16068583 A JP16068583 A JP 16068583A JP S6339100 B2 JPS6339100 B2 JP S6339100B2
Authority
JP
Japan
Prior art keywords
power supply
supply voltage
functional block
detection circuit
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58160685A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6050938A (ja
Inventor
Keiichi Myata
Takeyoshi Inoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP58160685A priority Critical patent/JPS6050938A/ja
Publication of JPS6050938A publication Critical patent/JPS6050938A/ja
Publication of JPS6339100B2 publication Critical patent/JPS6339100B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP58160685A 1983-08-30 1983-08-30 半導体集積回路 Granted JPS6050938A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58160685A JPS6050938A (ja) 1983-08-30 1983-08-30 半導体集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58160685A JPS6050938A (ja) 1983-08-30 1983-08-30 半導体集積回路

Publications (2)

Publication Number Publication Date
JPS6050938A JPS6050938A (ja) 1985-03-22
JPS6339100B2 true JPS6339100B2 (enrdf_load_stackoverflow) 1988-08-03

Family

ID=15720250

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58160685A Granted JPS6050938A (ja) 1983-08-30 1983-08-30 半導体集積回路

Country Status (1)

Country Link
JP (1) JPS6050938A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0637145Y2 (ja) * 1986-09-01 1994-09-28 日本電信電話株式会社 耐火二重天井

Also Published As

Publication number Publication date
JPS6050938A (ja) 1985-03-22

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees