Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
YOKO SEISAKUSHO KK
Original Assignee
YOKO SEISAKUSHO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YOKO SEISAKUSHO KKfiledCriticalYOKO SEISAKUSHO KK
Priority to JP25015583ApriorityCriticalpatent/JPS60142530A/ja
Publication of JPS60142530ApublicationCriticalpatent/JPS60142530A/ja
Publication of JPS6338862B2publicationCriticalpatent/JPS6338862B2/ja
H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
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Engineering & Computer Science
(AREA)
Manufacturing & Machinery
(AREA)
Computer Hardware Design
(AREA)
Microelectronics & Electronic Packaging
(AREA)
Power Engineering
(AREA)
Testing Of Individual Semiconductor Devices
(AREA)
Testing Or Measuring Of Semiconductors Or The Like
(AREA)