JPS6338862B2 - - Google Patents

Info

Publication number
JPS6338862B2
JPS6338862B2 JP58250155A JP25015583A JPS6338862B2 JP S6338862 B2 JPS6338862 B2 JP S6338862B2 JP 58250155 A JP58250155 A JP 58250155A JP 25015583 A JP25015583 A JP 25015583A JP S6338862 B2 JPS6338862 B2 JP S6338862B2
Authority
JP
Japan
Prior art keywords
probe
contact
support
support plate
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58250155A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60142530A (ja
Inventor
Ko Nakajima
Katsutoshi Saida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
YOKO SEISAKUSHO KK
Original Assignee
YOKO SEISAKUSHO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YOKO SEISAKUSHO KK filed Critical YOKO SEISAKUSHO KK
Priority to JP25015583A priority Critical patent/JPS60142530A/ja
Publication of JPS60142530A publication Critical patent/JPS60142530A/ja
Publication of JPS6338862B2 publication Critical patent/JPS6338862B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP25015583A 1983-12-28 1983-12-28 回路基板等の検査装置 Granted JPS60142530A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25015583A JPS60142530A (ja) 1983-12-28 1983-12-28 回路基板等の検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25015583A JPS60142530A (ja) 1983-12-28 1983-12-28 回路基板等の検査装置

Publications (2)

Publication Number Publication Date
JPS60142530A JPS60142530A (ja) 1985-07-27
JPS6338862B2 true JPS6338862B2 (cs) 1988-08-02

Family

ID=17203636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25015583A Granted JPS60142530A (ja) 1983-12-28 1983-12-28 回路基板等の検査装置

Country Status (1)

Country Link
JP (1) JPS60142530A (cs)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0789460B2 (ja) * 1991-01-30 1995-09-27 株式会社フジソク 超小形スライドスイッチの製造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4423376A (en) * 1981-03-20 1983-12-27 International Business Machines Corporation Contact probe assembly having rotatable contacting probe elements
US4506215A (en) * 1981-06-30 1985-03-19 International Business Machines Corporation Modular test probe

Also Published As

Publication number Publication date
JPS60142530A (ja) 1985-07-27

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