JPS63313277A - Method for checking wiring pattern - Google Patents

Method for checking wiring pattern

Info

Publication number
JPS63313277A
JPS63313277A JP62148962A JP14896287A JPS63313277A JP S63313277 A JPS63313277 A JP S63313277A JP 62148962 A JP62148962 A JP 62148962A JP 14896287 A JP14896287 A JP 14896287A JP S63313277 A JPS63313277 A JP S63313277A
Authority
JP
Japan
Prior art keywords
wiring
pattern
points
wiring pattern
overlap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62148962A
Other languages
Japanese (ja)
Inventor
Toru Nakamura
徹 中村
Jiro Kusuhara
楠原 治郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62148962A priority Critical patent/JPS63313277A/en
Publication of JPS63313277A publication Critical patent/JPS63313277A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To easily detect the overlap of wiring patterns by modeling the size of a wiring pattern expressed by real size and its allowable conductor interval on a previously fixed glid as inhibition points and checking the overlap of both the inhibition points. CONSTITUTION:Patterns with different sizes such as a facing parts fitting pattern 1, a signal wiring pattern 2, a small-diameter beer hole 3, a power supply wiring pattern 4, a large-diameter beer hole 5 for a power supply wiring are mixed on a printed board. An expanded conductor width 9 corresponding to 1/2 the allowable conductor interval determined by the fixed size is determined from the interval in each printed board. The shapes of various patterns 1-5 are expanded by the size of the width 9 to determine an artificial pattern shape 10. The intersecting points of wiring channels 6 included in the artificial pattern shape 10 are defined as intersecting points 7, and when the set inhibition points have an overlap 8, a proximity defect is decided.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はプリント基板の実装設計に係り、特に面付部品
搭載パターンのように一般の配縁パターンとは寸法の異
なるパターンが混在するプリント基板の配線パターンチ
ェック方法忙関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to the mounting design of printed circuit boards, and in particular to printed circuit boards that include patterns with dimensions different from general wiring patterns, such as surface-mounted component mounting patterns. Related to how to check the wiring pattern.

〔従来の技術〕[Conventional technology]

従来、プリント基板のパター/形状及びパターン間隙等
のチェックは情報処理学会第30回合国大会講演論文集
「プリント基板設計システム(CADAS)の設計規則
検証J(P1899−P19oo)<おいて論じられて
いるように、座標値の計算は実寸法法値(10〜10 
くリメートル程度)により行ない、その図形演算手法を
工夫する事で処理の高速化を図りてきた。
Conventionally, checks on the pattern/shape and pattern gaps of printed circuit boards were discussed in the Information Processing Society of Japan's 30th Annual Conference Proceedings "Design Rule Verification J for Printed Circuit Board Design Systems (CADAS)" (P1899-P19oo). As shown in the figure, the calculation of coordinate values is based on the actual dimension values (10 to 10
We have attempted to speed up the processing by devising graphical calculation methods.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記従来技術は配線パターンチェック時にその座標値計
算を実寸法で行なうため正確なチェックが可能であるが
、より高密度、大規模な基板をチェ、りする場合には処
理時間の増大が問題であったO 本発明の目的は配線パターンの座標値計算を簡略化しチ
ェックの高速化を図ることにある。
The above conventional technology allows accurate checking because the coordinate values are calculated using the actual dimensions when checking the wiring pattern, but when checking a higher-density, larger-scale board, an increase in processing time becomes a problem. An object of the present invention is to simplify the calculation of the coordinate values of a wiring pattern and to speed up the checking.

〔問題点を解決するための手段〕[Means for solving problems]

上記目的達成のためには、計算回数を減らす事が大切で
ある。一般に配線パターンの寸法は1/100mmある
いは1/1000瓢卑位で表現されているがその位置は
実装設計あるいは製造上の制約から100ミル格子点間
に1〜5本程度設定した配線チャネルに整合する事が多
い。
In order to achieve the above objective, it is important to reduce the number of calculations. Generally, the dimensions of the wiring pattern are expressed in 1/100 mm or 1/1000 scale, but due to mounting design or manufacturing constraints, the position matches the wiring channels set between 1 to 5 wires between 100 mil grid points. There are many things to do.

そこで実寸法で表現されている配線パターン寸法と最小
導体間隔をこの配線チャネルに整合するようにモデル化
して設定するようKした。
Therefore, we decided to model and set the wiring pattern dimensions and the minimum conductor spacing, which are expressed in actual dimensions, to match this wiring channel.

これにより座標値計算回数の低減が達成される。This achieves a reduction in the number of coordinate value calculations.

〔作用〕[Effect]

実寸法で表現されている寸法を配線チャネルに整合させ
る事により座標計算単位を数十〜千数百倍に拡大(1/
 100 wm :格子間5本チャネルで42倍、1 
/ 1000 vrlr :格子間1本チャネルで12
70倍)することができ座標計算回数を減少させる事が
できる。さらに配線パターン寸法と最小導体間隔を禁止
点として設定する事により配線パターン同志の近接を図
形演算する必要がな(なり禁止点の重なり部分のみを摘
出すれば配線パターンチェックが可能となりより高速化
できる。
By matching the dimensions expressed in the actual dimensions to the wiring channels, the coordinate calculation unit can be expanded several tens to hundreds of times (1/
100 wm: 42 times, 1 with 5 interstitial channels
/ 1000 vrlr: 12 with 1 channel between grids
70 times), thereby reducing the number of coordinate calculations. Furthermore, by setting the wiring pattern dimensions and the minimum conductor spacing as prohibited points, there is no need to perform graphical calculations to determine the proximity of wiring patterns. .

〔実施例〕〔Example〕

以下、本発明の一実施例を図面忙より詳細に説明する。 Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.

第1図は本発明を適用するプリント基板の一部を示す、
このプリント基板は小形計算機か端末機に使用されるも
ので高密度・低価格化を狙いとして、面付部品取付パタ
ーン1、信号配線用パターン2、小径ピアホール3.I
Et源配線用パターン4電源配線用の大径ピアホール5
等、寸法の異なるパターンを混在させて高密度実装を図
っている。
FIG. 1 shows a part of a printed circuit board to which the present invention is applied.
This printed circuit board is used for small computers or terminals, and is designed with the aim of achieving high density and low cost.It has a surface mounting part mounting pattern 1, a signal wiring pattern 2, a small diameter pier hole 3. I
Et source wiring pattern 4 Large diameter pier hole 5 for power supply wiring
High-density packaging is achieved by mixing patterns with different dimensions.

これらパターンの寸法や与体間隔は1/1000m程度
の実寸法で表現されている。
The dimensions and spacing of these patterns are expressed in actual dimensions of about 1/1000 m.

本発明ではこのようなパターン1〜5が混在したプリン
ト基板上に一定の間隔で配線チャネル6を設定し禁止点
7を認識する。そしてこの禁止点7より禁示点の重なり
8を認識し配線パターン7近接不良を摘出する。
In the present invention, wiring channels 6 are set at regular intervals on a printed circuit board on which such patterns 1 to 5 are mixed, and prohibited points 7 are recognized. Then, an overlap 8 of the prohibited points is recognized from the prohibited point 7, and a defect in the proximity of the wiring pattern 7 is extracted.

以下第3図及び第4図により近接不良摘出過程を示す。The process of removing adjacent defects will be shown below with reference to FIGS. 3 and 4.

(1) プリント基板毎に一定寸法で定められた許容導
体間隔よりその2分の1に当たる拡張導体幅9を決定す
る・ (2)各種のパターン1〜5の形状な拡張導体幅9の寸
法だけ拡張し、仮想パターン形状10を決定する。
(1) Determine the extended conductor width 9, which is half of the allowable conductor spacing determined as a fixed dimension for each printed circuit board. (2) Determine the extended conductor width 9 in the shapes of various patterns 1 to 5. Then, the virtual pattern shape 10 is determined.

(3)仮想パターン形状10に含まれる配線チャネル6
の交点を禁止点7とする。ここで禁示点7はどのパター
ンによる禁示点かを認識しておく。
(3) Wiring channel 6 included in virtual pattern shape 10
Let the intersection point be the prohibited point 7. Here, it is recognized which pattern the forbidden point 7 is based on.

(4)設定された禁止点70重なりをチェ、りし禁止点
の重なり8を摘出する。そしてその重なりがどのパター
ンによるものかをチェックしそのパターンを近接不良と
して指摘する。
(4) Check the set 70 overlapping prohibited points, and extract 8 overlapping prohibited points. Then, it is checked which pattern causes the overlap, and the pattern is pointed out as a proximity defect.

これら処理のフローを第5図に示す。The flow of these processes is shown in FIG.

〔発明の効果〕〔Effect of the invention〕

本発明によれば同一基板の配線パターン近接条件チェッ
ク時間を短縮することができる。
According to the present invention, it is possible to shorten the time required to check wiring pattern proximity conditions on the same board.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を適用する基板を示す説明図
、第2図は適用結果の説明図、第3図及び第4図は適用
する過程を示す説明図、第5図はその処理フロー図であ
る◎ 1・・・面付部品取付パターン、2・・・信号配線用パ
ターン、3・・・小径ピアホール、4・・・を源配線用
パターン、5・・・大径ピアホール、6・・・配線チャ
ネル。 7・・・禁止点、8・・・禁示点の重なり、9・・・拡
張導体幅、10・・・径想パターン形状・ 代理人弁理士 小 川 勝 男ヲ 筋 1 口 X 病2国 第 3 固 n
Fig. 1 is an explanatory diagram showing a substrate to which an embodiment of the present invention is applied, Fig. 2 is an explanatory diagram of the application result, Figs. 3 and 4 are explanatory diagrams showing the application process, and Fig. 5 is an explanatory diagram of the application result. It is a process flow diagram. ◎ 1... surface-mounted component mounting pattern, 2... pattern for signal wiring, 3... small diameter pier hole, 4... pattern for source wiring, 5... large diameter pier hole, 6...Wiring channel. 7...Prohibited points, 8...Overlap of prohibited points, 9...Extended conductor width, 10...Conceptual pattern shape・Representative Patent Attorney Masaru Ogawa Man-oriented 1.X Disease 2.Country 3rd hard n

Claims (1)

【特許請求の範囲】[Claims] 1、ライン幅、パッド径等寸法の異なる配線パターンが
混在するプリント基板において、実寸法で表現されてい
る配線パターン寸法とその許容導体間隔を予め定めたグ
リッド上に禁示点としてモデル化することにより、禁止
点の重複をチェックする事のみで配線パターンのショー
ト、近接不良を摘出可能とすることを特徴とする配線パ
ターンチェック方法。
1. In a printed circuit board where wiring patterns with different dimensions such as line width and pad diameter coexist, the wiring pattern dimensions expressed in actual dimensions and their allowable conductor spacing are modeled as forbidden points on a predetermined grid. Accordingly, a wiring pattern checking method is characterized in that it is possible to detect short-circuits and proximity defects in wiring patterns only by checking the overlap of prohibited points.
JP62148962A 1987-06-17 1987-06-17 Method for checking wiring pattern Pending JPS63313277A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62148962A JPS63313277A (en) 1987-06-17 1987-06-17 Method for checking wiring pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62148962A JPS63313277A (en) 1987-06-17 1987-06-17 Method for checking wiring pattern

Publications (1)

Publication Number Publication Date
JPS63313277A true JPS63313277A (en) 1988-12-21

Family

ID=15464552

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62148962A Pending JPS63313277A (en) 1987-06-17 1987-06-17 Method for checking wiring pattern

Country Status (1)

Country Link
JP (1) JPS63313277A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0896004A (en) * 1994-09-26 1996-04-12 Nec Corp Design rule verification system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0896004A (en) * 1994-09-26 1996-04-12 Nec Corp Design rule verification system

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