JPS63308337A - Spinner - Google Patents

Spinner

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Publication number
JPS63308337A
JPS63308337A JP62144928A JP14492887A JPS63308337A JP S63308337 A JPS63308337 A JP S63308337A JP 62144928 A JP62144928 A JP 62144928A JP 14492887 A JP14492887 A JP 14492887A JP S63308337 A JPS63308337 A JP S63308337A
Authority
JP
Japan
Prior art keywords
wafer
semiconductor wafer
slider beam
spin chuck
slider
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62144928A
Other languages
Japanese (ja)
Inventor
Yoshio Kimura
義雄 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Kyushu Ltd
Original Assignee
Tokyo Electron Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Kyushu Ltd filed Critical Tokyo Electron Kyushu Ltd
Priority to JP62144928A priority Critical patent/JPS63308337A/en
Publication of JPS63308337A publication Critical patent/JPS63308337A/en
Pending legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Coating Apparatus (AREA)

Abstract

PURPOSE:To reduce the quantity of raising dust and make it possible to transfer a wafer in a short time, by transferring the wafer in the state of being supported from the rear at the time of carrying the wafer on a rotary stage. CONSTITUTION:When a semiconductor wafer 15 before treatment to be carried in a wafer carrying-in part 13 closely contacts a guide 16, the first air cylinder 21 is operated to raise a slider beam 20. Then, the semiconductor wafer 15 is placed and raised in the state of being supported up from the rear by the slider beam 20 so as to stop raising about in the position where the upper surface of the slider beam 20 is slightly lower than the underside of the treated semiconductor wafer 11 placed on the spin chuck 12. Next, while keeping the state of rising operation, the slider beam 20 is moved rightward by a carrier mechanism 18 so as to be set up where the semiconductor wafer 11 comes to be placed. Thereby, application treatment of the wafer can be performed with a small quantity of dust raising in a short time, that is, with high throughput.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は、ウェハを回転状態で塗布液に濡らしてウェハ
上に塗布するスピンナーに関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a spinner that wets a wafer with a coating liquid while rotating and applies the coating onto the wafer.

(従来の技術) 半導体製造において被処理基板例えば半導体ウェハ等を
回転させながら各種処理を行う回転式処理機として、例
えば回転するスピンチャックに上記半導体ウェハを装着
し回転処理するスピンナーが使用されることがある。
(Prior Art) In semiconductor manufacturing, a spinner is used as a rotary processing machine that performs various processing while rotating a substrate to be processed, such as a semiconductor wafer, for example, by attaching the semiconductor wafer to a rotating spin chuck and performing rotation processing. There is.

そして、このスピンナーのスピンチャックに上記処理前
の半導体ウェハを装着し、また処理済みの半導体ウェハ
を上記スピンチャックから搬出する移送手段として1例
えば特公昭56−49451号公報で開示された手段や
、TRM (TRANSFERARM)方式と呼ばれる
移送手段等が実用されている。
As a transfer means for mounting the unprocessed semiconductor wafer on the spin chuck of this spinner and transporting the processed semiconductor wafer from the spin chuck, for example, the means disclosed in Japanese Patent Publication No. 56-49451, A transfer means called the TRM (TRANSFERARM) method is in practical use.

すなわち、前者は半導体ウェハを押し出す手段により移
送するものである。また後者は第8図に示すように、例
えば回転プーリー■、環状体のOリング■等からなるベ
ルト搬送手段を備えた支持体TRM■を、半導体ウェハ
に)を装着するスピンチャック■を挾むように両側に配
r!14i!j成したものであり、上記TRM■がスピ
ンチャック■に向って前進、上昇して半導体ウェハに)
を持ち上げて移送するものである。
That is, in the former method, the semiconductor wafer is transferred by means of extrusion. As shown in Fig. 8, the latter is a support TRM equipped with a belt conveying means consisting of a rotary pulley ■, an annular O-ring ■, etc., and a spin chuck ■ which attaches the semiconductor wafer). Arranged on both sides! 14i! (The TRM ■ advances toward the spin chuck ■ and rises to the semiconductor wafer.)
It is used to lift and transport.

(発叫が解決しようとする問題点) しかしながら、特公昭56−49451号公報で開示さ
れたものは、半導体ウェハを移送する搬送部が上記半導
体ウェハを上昇下降させる機構を備えていないため、上
記半導体ウェハを滑らせてスピンチャック上に装着し、
また処理済み半導体ウェハを上記スピンチャックから滑
らせて搬出するので、ダストが発生しやすい。
(Problems to be Solved by Screaming) However, the method disclosed in Japanese Patent Publication No. 56-49451 does not have a mechanism for raising and lowering the semiconductor wafer, and therefore the Slide the semiconductor wafer onto the spin chuck,
Further, since the processed semiconductor wafer is slid out of the spin chuck, dust is likely to be generated.

一方、TRM方式の装置では、半導体ウェハ処理時にT
RMは左右に後退床がる機構であるため巾方向の寸法が
大きくなり、装置全体が大型化し設備費も高くなる。
On the other hand, in TRM type equipment, T
Since the RM has a mechanism that allows the floor to move backward from side to side, its width dimension increases, making the entire device larger and increasing equipment costs.

また、ベルト搬送のため、このベルトがダスト発生の原
因となりやすい。
In addition, since the belt is conveyed, this belt is likely to cause dust generation.

本発明は、上述の従来事情に対処してなされたもので1
発塵量が極めて少なく、コンパクトで。
The present invention has been made in response to the above-mentioned conventional circumstances.
It generates extremely little dust and is compact.

短時間にウェハを移送できるスピンナーを提供しようと
するものである。
The objective is to provide a spinner that can transfer wafers in a short time.

[発明の構成〕 (問題点を解決するための手段)− すなわち本発明は、ウェハを回転状態で塗布液に濡らし
てウェハ上に塗布するスピンナーにおいて、上記ウェハ
を回転台に搬送するに際し、上記ウェハを裏面から支え
上げた状態で移送することを特徴とする。
[Structure of the Invention] (Means for Solving the Problems) - In other words, the present invention provides a spinner that wets a wafer with a coating liquid while rotating and applies the coating liquid onto the wafer. The feature is that the wafer is transferred while being supported from the back side.

(作用) 本発明のスピンナーは、ウェハを支え上げた状態で移送
する構成であるので、上記ウェハが摩擦を受けることは
ない。
(Function) Since the spinner of the present invention is configured to transport the wafer while supporting it, the wafer is not subjected to friction.

したがって、発塵量が極めて少なく、また短時間にウェ
ハを移送することができる。
Therefore, the amount of dust generated is extremely small, and the wafer can be transferred in a short time.

(実施例) 以下、本発明スピンナーの一実施例を図面を参照して説
明する。
(Example) Hereinafter, an example of the spinner of the present invention will be described with reference to the drawings.

ウェハ例えば半導体ウェハ(11)を載置吸着保持例え
ばモーター等の駆動手段(図示せず)により駆動される
ベルト搬送構成のウェハ搬入部(13)が。
A wafer loading section (13) has a belt conveyance structure and is driven by a driving means (not shown) such as a motor, on which a wafer, for example, a semiconductor wafer (11) is placed and held by suction.

他方には上記同様構成のウェハ搬出部(14)が対向し
て配置されている。また、上記ウェハ搬入部(13)の
スピンチャック(12)側には半導体ウェハ(15)の
位置決め用ガイド(16)が設けられており、ウェハ搬
入部(13)により搬入される半導体ウェハ(15)が
当接することにより、半導体ウェハ(15)が所定位置
に設定されるように構成されている。
On the other side, a wafer unloading section (14) having the same configuration as described above is disposed facing each other. Further, a guide (16) for positioning the semiconductor wafer (15) is provided on the spin chuck (12) side of the wafer loading section (13). ) is configured so that the semiconductor wafer (15) is set in a predetermined position by contacting the semiconductor wafer (15).

次に、上記ウェハ搬入部(13)ウェハ搬出部(14)
の下方部には、半導体ウェハ(11) (t5)を搬送
する搬送部(、■)が設けられている。
Next, the wafer loading section (13) and the wafer unloading section (14)
A conveying section (, ■) for conveying the semiconductor wafer (11) (t5) is provided at the lower part of the wafer.

この搬送部(豆)の搬送機構(18)には基台(19)
が取着されており搬送機構(18)により移動可能に構
成されている。
The transport mechanism (18) of this transport unit (beans) has a base (19).
is attached and configured to be movable by a transport mechanism (18).

また、搬送機構(18)の上方には、ウェハ搬入部(1
3)、スピンチャック(12)、ウェハ搬出部(14)
の外側を昇降可能に構成され、半導体ウェハ(15)を
少くとも2枚並置可能な長さ寸法を有する両側1対の搬
送部材(以後スライダービームと呼称する)(20)が
配置されている。そしてこのスライダービーム(20)
は、基台(19)に取着された2つの昇降手段1例えば
第1のエアーシリンダー(zl)、第2のエアーシリン
ダー(22)により2段階昇降可能に構成されている。
Further, above the transport mechanism (18), a wafer loading section (1
3), spin chuck (12), wafer unloading section (14)
A pair of conveying members (hereinafter referred to as slider beams) (20) on both sides are arranged so as to be movable up and down on the outside thereof, and have a length that allows at least two semiconductor wafers (15) to be placed side by side. And this slider beam (20)
is configured to be able to be raised and lowered in two stages by means of two lifting means 1, such as a first air cylinder (zl) and a second air cylinder (22), which are attached to a base (19).

次に動作を説明する。Next, the operation will be explained.

ウェハ搬入部(13)により搬入される処理前の半導体
ウェハ(15)がガイド(16)に当接すると1例えば
第1のエアーシリンダー(21)を動作させてスライダ
ービーム(20)を上昇させる。
When the unprocessed semiconductor wafer (15) carried in by the wafer carrying part (13) comes into contact with the guide (16), the slider beam (20) is raised by operating, for example, the first air cylinder (21).

ライダービーム(20)の上面部分がスピンチャック(
12)に載置された処理済みの半導体ウェハ(11)の
下面より僅かに低い程度の位置で上昇停止させる。
The top part of the lidar beam (20) is attached to the spin chuck (
The lift is stopped at a position slightly lower than the lower surface of the processed semiconductor wafer (11) placed on the substrate 12).

これを第1の上昇とする。This is called the first increase.

次に、上記上昇動作の状態を保ったまま、搬送機構(1
8)により第3図に示すようにスライダービーム(20
)を右方向に移動させ、半導体ウェハ(11)を載置可
能となるような位置に設定する。
Next, while maintaining the state of the above-mentioned upward movement, the transport mechanism (1
8), the slider beam (20
) to the right and set it to a position where the semiconductor wafer (11) can be placed.

この後、第2のエアーシリンダー(22)を動作させて
更にスライダービーム(20)を上昇させ、第4図に示
すようにスピンチャック(1z)上の半導体ウェハ(1
1yを載置上昇させる。これを第2の上昇とする。
Thereafter, the second air cylinder (22) is operated to further raise the slider beam (20), and as shown in FIG.
Place and raise 1y. This is called the second rise.

次に、搬送機W (18)によりスライダービーム(2
0)を更に右方向に移動させ、第5図に示すよう(12
)を所定位置となるように位置決めし1合わせて処理済
みの半導体ウェハ(11)がウェハ搬出部(14)によ
り搬出されるように設定する。
Next, the slider beam (2
0) further to the right, as shown in Figure 5 (12
) are positioned at predetermined positions, and the processed semiconductor wafer (11) is set so that it is carried out by the wafer carrying out section (14).

そして、第1及び第2のエアシリンダー(21)(22
)の動作を停止しスライダービーム(20)を下降させ
て、第6図に示すように処理前の半導体ウェハ(15)
をスピンチャック(12)に載置し、かつ処理済みの半
導体ウェハ(11)をウェハ搬出部(14)に載せ渡す
Then, the first and second air cylinders (21) (22
) is stopped, the slider beam (20) is lowered, and the unprocessed semiconductor wafer (15) is removed as shown in FIG.
is placed on the spin chuck (12), and the processed semiconductor wafer (11) is placed on the wafer unloading section (14).

最後に、搬送機構(18)によりスライダービーム(2
0)を左方向に移動させる1以上で1サイクルの動作が
終了し、以後これを繰り返す。
Finally, the slider beam (2
0) to the left, one cycle of operation ends, and this is repeated thereafter.

なお、上記実施例では、第1第2の昇降手段として、エ
アーシリンダーを使用したものについて説明したが、本
発明はかかる実施例に限定されるものではなく、他の手
段、例えばリードスクリューを用いた直線移動機構で構
成してもよい。
In the above embodiment, an air cylinder is used as the first and second elevating means, but the present invention is not limited to this embodiment, and other means such as a lead screw may be used. It may also be configured with a linear movement mechanism.

そして、昇降手段の構成も上記説明のように第1、第2
の2つに限定されるものではなく、上記説明の第1の上
昇、第2の上昇と同様の動作が得られるものであれは、
自由に構成してもよい。
The structure of the elevating means is also the same as that of the first and second parts as explained above.
It is not limited to the above two, but as long as the same operation as the first rise and the second rise described above can be obtained,
It may be configured freely.

また、スライダービーム(20)として、上記実施例で
は半導体ウェハを少なくとも2枚同時に並置できる長さ
寸法を有する単体の搬送部材で構成したものについて説
明したが、第7図(a)に示すように通常は半導体ウェ
ハが1枚載る程度の寸法に幼 縮少し、半導体ウェハを2枚並1搬送する際には第7図
(b)に示すように外スライダービーム(20a)の内
から内スライダービーム(20b)が伸張するように構
成してもよい。
Further, in the above embodiment, the slider beam (20) is constructed of a single conveying member having a length that allows at least two semiconductor wafers to be juxtaposed at the same time, but as shown in FIG. 7(a), Normally, the size is reduced to the extent that one semiconductor wafer can be placed on it, and when transporting two semiconductor wafers at once, the inner slider beam is moved from the inside of the outer slider beam (20a) as shown in FIG. 7(b). (20b) may be expanded.

この場合、内スライダービーム(20b)の伸張距離と
等しい程度の長さだけ、ウェハ搬入部(13)とスピン
チャック(12)との間隔を短縮できるが、内スライダ
ービーム(zob)の伸縮動作が要るのでスライダービ
ーム(20)の構成が複雑となる。
In this case, the distance between the wafer loading section (13) and the spin chuck (12) can be shortened by a length equal to the extension distance of the inner slider beam (20b), but the extension and contraction movement of the inner slider beam (zob) Therefore, the structure of the slider beam (20) becomes complicated.

さらに、上記実施例ではスライダービーム(20)の動
作として、第1第2の上昇と2段階動作のものについて
説明したが、第1図においてスライダービーム(20)
をスピンチャック(12)より右側まで延長すると1回
の上昇、1回の搬送の1段階で上記動作を構成できるこ
とも考えられる。
Furthermore, in the above embodiment, the operation of the slider beam (20) was explained as a two-step operation of first and second rising, but in FIG.
It is conceivable that if the spin chuck (12) is extended to the right side of the spin chuck (12), the above operation can be configured in one step of one raising and one conveyance.

しかし1通常、スピンチャック(12)が位置するとこ
ろは1回転処理による塗布液、処理液、洗浄液等が周囲
に飛散しないように、例えばカップ状のカバー(図示せ
ず)で囲まれている。したがって処理中は上記カバー外
にスライダービーム(20)を退避させておく必要があ
り、また退避させないとスライダービーム(20)のカ
バー内に位置する部分には処理液等が付着するので好ま
しくない。
However, usually, the area where the spin chuck (12) is located is surrounded by a cup-shaped cover (not shown), for example, to prevent coating liquid, processing liquid, cleaning liquid, etc. from scattering around during one rotation process. Therefore, during processing, it is necessary to evacuate the slider beam (20) outside the cover. If the slider beam (20) is not evacuated, processing liquid or the like will adhere to the portion of the slider beam (20) located inside the cover, which is not preferable.

上記の理由によりスライダービーム(20)は上記実施
例のように構成するのが好ましい。
For the above reasons, it is preferable that the slider beam (20) be constructed as in the above embodiment.

〔発明の効果〕〔Effect of the invention〕

上述のように1本発明のスピンナーによれば、発塵量が
極めて少なく、短時間即ち高スルーブツトでウェハを塗
布処理することができる。
As described above, according to the spinner of the present invention, the amount of dust generated is extremely small, and wafers can be coated in a short time, that is, with high throughput.

【図面の簡単な説明】[Brief explanation of the drawing]

第1回は本発明スピンナーの一実施例を示す構成図、第
2図〜第6図は第1図の動作の説明図、第7図は第1図
のスライダービームの一変形図、第8図は従来例を示す
構成図である。 11、15・・・半導体ウェハ 12・・・スピンチャ
ック13・・・ウェハ搬入部   14・・・ウェハ搬
出部16・・・ガイド      H・・・搬送部18
・・・搬送機構     19・・・基台、スーD 冊・・・スライダービーム 21・・・第1のエアーシリンダー 22・・・第2のエアーシリンダー 特許出願人  チル九州株式会社 第3図 第4図 、11 第5図 16図 第8図
The first part is a configuration diagram showing an embodiment of the spinner of the present invention, FIGS. 2 to 6 are explanatory diagrams of the operation of FIG. 1, FIG. 7 is a modification of the slider beam in FIG. 1, and FIG. The figure is a configuration diagram showing a conventional example. 11, 15...Semiconductor wafer 12...Spin chuck 13...Wafer loading section 14...Wafer unloading section 16...Guide H...Transporting section 18
...Conveyance mechanism 19...Base, Sue D Book...Slider beam 21...First air cylinder 22...Second air cylinder Patent applicant Chill Kyushu Co., Ltd. Figure 3 Figure 4 Figure, 11 Figure 5 Figure 16 Figure 8

Claims (1)

【特許請求の範囲】[Claims] ウェハを回転状態で塗布液に濡らしてウェハ上に塗布す
るスピンナーにおいて、上記ウェハを回転台に搬送する
に際し、上記ウェハを裏面から支え上げた状態で移送す
ることを特徴とするスピンナー。
A spinner that wets a wafer with a coating liquid while rotating and applies the coating onto the wafer, characterized in that when the wafer is transferred to a rotary table, the wafer is transferred while being supported from the back side.
JP62144928A 1987-06-10 1987-06-10 Spinner Pending JPS63308337A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62144928A JPS63308337A (en) 1987-06-10 1987-06-10 Spinner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62144928A JPS63308337A (en) 1987-06-10 1987-06-10 Spinner

Publications (1)

Publication Number Publication Date
JPS63308337A true JPS63308337A (en) 1988-12-15

Family

ID=15373469

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62144928A Pending JPS63308337A (en) 1987-06-10 1987-06-10 Spinner

Country Status (1)

Country Link
JP (1) JPS63308337A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015074818A (en) * 2013-10-11 2015-04-20 Dowaサーモテック株式会社 Carburization hardening facility

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JPS6017919A (en) * 1983-07-11 1985-01-29 Hitachi Ltd Handling method and apparatus of wafer
JPS6165435A (en) * 1984-09-07 1986-04-04 Dainippon Screen Mfg Co Ltd Method of substrate surface treatment and device therefor
JPS61222147A (en) * 1985-03-19 1986-10-02 Fujitsu Ltd Mechanism for aligning wafer position
JPS61228645A (en) * 1985-04-02 1986-10-11 Nippon Kogaku Kk <Nikon> Substrate positioning apparatus
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JPS6261333A (en) * 1985-09-11 1987-03-18 Hitachi Ltd Cleaning device
JPS6262541A (en) * 1985-09-12 1987-03-19 Mitsubishi Electric Corp Centering device for wafer conveyor
JPS62141731A (en) * 1985-12-16 1987-06-25 Nissin Electric Co Ltd Wafer handling apparatus

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5038471A (en) * 1973-08-08 1975-04-09
JPS5712745B2 (en) * 1979-04-13 1982-03-12
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