JPS63276300A - ピン曲り検出方法 - Google Patents

ピン曲り検出方法

Info

Publication number
JPS63276300A
JPS63276300A JP62112053A JP11205387A JPS63276300A JP S63276300 A JPS63276300 A JP S63276300A JP 62112053 A JP62112053 A JP 62112053A JP 11205387 A JP11205387 A JP 11205387A JP S63276300 A JPS63276300 A JP S63276300A
Authority
JP
Japan
Prior art keywords
pin
image
center
inspection window
gravity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62112053A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0553320B2 (enrdf_load_stackoverflow
Inventor
Hiroshi Ikeda
池田　比呂志
Sukeyuki Sasaki
佐々木　祐行
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP62112053A priority Critical patent/JPS63276300A/ja
Publication of JPS63276300A publication Critical patent/JPS63276300A/ja
Publication of JPH0553320B2 publication Critical patent/JPH0553320B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Supply And Installment Of Electrical Components (AREA)
JP62112053A 1987-05-07 1987-05-07 ピン曲り検出方法 Granted JPS63276300A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62112053A JPS63276300A (ja) 1987-05-07 1987-05-07 ピン曲り検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62112053A JPS63276300A (ja) 1987-05-07 1987-05-07 ピン曲り検出方法

Publications (2)

Publication Number Publication Date
JPS63276300A true JPS63276300A (ja) 1988-11-14
JPH0553320B2 JPH0553320B2 (enrdf_load_stackoverflow) 1993-08-09

Family

ID=14576847

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62112053A Granted JPS63276300A (ja) 1987-05-07 1987-05-07 ピン曲り検出方法

Country Status (1)

Country Link
JP (1) JPS63276300A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6738504B1 (en) 1999-08-27 2004-05-18 Shinko Electric Industries Co., Ltd Inspection apparatus for semiconductor device and parts mounter using same
JP2011047752A (ja) * 2009-08-26 2011-03-10 Teijin Fibers Ltd 紡糸口金の異常検査装置及びその方法
CN106491358A (zh) * 2016-10-31 2017-03-15 成都杰仕德科技有限公司 一种用于自动配药系统的定位装置和方法
WO2022244249A1 (ja) * 2021-05-21 2022-11-24 株式会社Fuji リード曲がり検出方法および実装装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6738504B1 (en) 1999-08-27 2004-05-18 Shinko Electric Industries Co., Ltd Inspection apparatus for semiconductor device and parts mounter using same
JP2011047752A (ja) * 2009-08-26 2011-03-10 Teijin Fibers Ltd 紡糸口金の異常検査装置及びその方法
CN106491358A (zh) * 2016-10-31 2017-03-15 成都杰仕德科技有限公司 一种用于自动配药系统的定位装置和方法
CN106491358B (zh) * 2016-10-31 2019-10-11 成都杰仕德科技有限公司 一种用于自动配药系统的定位装置和方法
WO2022244249A1 (ja) * 2021-05-21 2022-11-24 株式会社Fuji リード曲がり検出方法および実装装置

Also Published As

Publication number Publication date
JPH0553320B2 (enrdf_load_stackoverflow) 1993-08-09

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