JPS63250552A - Optical flaw displacement measuring instrument - Google Patents

Optical flaw displacement measuring instrument

Info

Publication number
JPS63250552A
JPS63250552A JP8462387A JP8462387A JPS63250552A JP S63250552 A JPS63250552 A JP S63250552A JP 8462387 A JP8462387 A JP 8462387A JP 8462387 A JP8462387 A JP 8462387A JP S63250552 A JPS63250552 A JP S63250552A
Authority
JP
Japan
Prior art keywords
divider
output
adder
flaw
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8462387A
Other languages
Japanese (ja)
Inventor
Masahiko Fukuoka
福岡 雅彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
YASUNAGA TEKKOSHO KK
Original Assignee
YASUNAGA TEKKOSHO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YASUNAGA TEKKOSHO KK filed Critical YASUNAGA TEKKOSHO KK
Priority to JP8462387A priority Critical patent/JPS63250552A/en
Publication of JPS63250552A publication Critical patent/JPS63250552A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To provide both functions for size measurement and flaw inspection by connecting both output terminals of a position detecting element to an arithmetic circuit and connecting the output terminals of the divider and adder of this circuit to a display through a data processing circuit. CONSTITUTION:A light source 3 in a measuring instrument emits a light beam to a body 2 to be measured and this light beam is reflected by a position to be measured and incident on a position detecting element 4. This element 4 sends out output signals of the same level when the light is incident on the incidence surface in the center or different output signals when the incident light deviates to one side. Both output signals are A/D-converted 7 and supplied to a subtracter 8 and the adder 9 to generate a difference signal and a sum signal, which are supplied to the divider 10 to generate a quotient signal. Data processors 11 and 12 combines the sum signal supplied from the adder 9, the quotient signal supplied from the divider 10, and raster position information generated by an instantaneous position signal generator to generate a television system image signal. Those distance image signals and flaw image signal are displayed by the distance output device 14 and flaw output device 15 of the display 13.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、被計測物の仕上がり状態を検査する光学式傷
変位計測装置に関する。ここでは仕上がり状態の検査と
は、被計測物の表面の寸法精度、例えば回転軸の表面の
凹凸および心の振れ、および板の表面の凹凸および厚さ
、すなわち被計測物と測定素子の間の距離の検査と、被
計測物の表面の傷の検査とを表している。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to an optical flaw displacement measuring device for inspecting the finished state of an object to be measured. Inspection of the finished state here refers to the dimensional accuracy of the surface of the object to be measured, such as the unevenness and center runout of the surface of the rotating shaft, and the unevenness and thickness of the surface of the plate, that is, the difference between the object to be measured and the measuring element. It represents distance inspection and inspection for flaws on the surface of the object to be measured.

従来の技術 被計測物と測定素子との間の距離は、従来位置検出素子
によって測定されている。その際位置検出素子は、2つ
の出力端子を有し、光源から放出され被計測物により反
射された光ビームが位置検出素子に入射する位置に応じ
て、これら2つの出力端子から異なった出力を発生する
。光源と位置検出素子は所定の距離だけ離して配置され
ており、光源は、波計n物が基準距離の所にある場合に
、位置検出素子の中心に反射光が達する方向に向けて光
ビームを送出する。従って被計測物までの距離が変化す
ると、反射光ビームは、位1検出素子の中心から外れ、
それにより前記2つの出力端子の出力が変化する。これ
ら出力をデータ処理技術により適当に処理すれば、被計
測物と測定素子の間の距離が検出できる。
Conventional technology The distance between an object to be measured and a measurement element is conventionally measured by a position detection element. In this case, the position detection element has two output terminals, and depending on the position where the light beam emitted from the light source and reflected by the object to be measured is incident on the position detection element, different outputs are output from these two output terminals. Occur. The light source and the position detection element are placed a predetermined distance apart, and the light source emits a light beam in the direction in which the reflected light reaches the center of the position detection element when the wave meter object is at a reference distance. Send out. Therefore, when the distance to the object to be measured changes, the reflected light beam deviates from the center of the detection element,
As a result, the outputs of the two output terminals change. By appropriately processing these outputs using data processing technology, the distance between the object to be measured and the measuring element can be detected.

一方被計測物の傷は、被計測物に光を当て、反射光を光
電素子により走査することによって検出することができ
る。
On the other hand, scratches on the object to be measured can be detected by shining light onto the object and scanning the reflected light with a photoelectric element.

発明が解決しようとする問題点 例えば研磨加工を行った後には、寸法と傷の検査が必要
である。これら2つの検査を自動的に行う場合、それぞ
れ独立の機能を有する2つの装置が必要である。それぞ
れの装置は、所定の所要場所を要し、かつそれぞれかな
り高酒なものである、また計測には所定の時間を要する
Problems to be Solved by the Invention For example, after polishing, it is necessary to inspect the dimensions and flaws. If these two tests are to be performed automatically, two devices each having independent functions are required. Each device requires a certain amount of space, each is fairly expensive, and each requires a certain amount of time to measure.

本発明の目的は、寸法の計λIと傷の検査の2つの機能
を有しかつこれら機能を同時にまたは選択的に実行可能
な計測装置を提供することにある。
An object of the present invention is to provide a measuring device that has two functions: measuring λI of dimensions and inspecting flaws, and can perform these functions simultaneously or selectively.

問題点を解決するための手段 本発明は次のようにしてこの目的を達成する。Means to solve problems The invention achieves this objective as follows.

すなわち被計測物を走査する位置検出素子の2つの出力
端子が演算回路に接続されており、この演算回路は、2
つの出力端子から生じる出力の和を形成する加算器、差
を形成する引き算器およびこの差を和で割って商を形成
する割り算器がらなり、割り算器の出力端子と加算器の
出力端子が、データ処理回路を介して傷出力装置に接続
されている。
That is, the two output terminals of the position detection element that scans the object to be measured are connected to an arithmetic circuit, and this arithmetic circuit has two output terminals.
It consists of an adder that forms the sum of the outputs arising from the two output terminals, a subtracter that forms the difference, and a divider that divides this difference by the sum to form the quotient, the output terminals of the divider and the output terminal of the adder being It is connected to the wound output device via a data processing circuit.

本発明の別の構成によれば、演算回路の割り算器の出力
端子と加算器の出方端子は、データ処理回路を介して距
離出力装置に接続されている。
According to another configuration of the present invention, the output terminal of the divider and the output terminal of the adder of the arithmetic circuit are connected to the distance output device via the data processing circuit.

さらに本発明の別の構成によれば、演算回路の割り算器
の出力端子が、データ処理回路を介して傷出力装置に接
続されている。
Furthermore, according to another configuration of the present invention, the output terminal of the divider of the arithmetic circuit is connected to the scratch output device via the data processing circuit.

作用 初めに述べたように、被計測物の表面の傷は被計測物の
表面から反射された光量を測定することにより検出でき
る。すなわち位置検出素子の2つの出力をI 1.およ
びI2とすれば、Il+I2は反射光量を表し、この反
射光■の低下が傷の存在することを表している。一方位
置検出素子の2つの出力の差を和で割った商、すなわち
(II−I2>/(T 1+I2)は、被計測物と計測
装置の間の距離を表す。
Function As stated at the beginning, flaws on the surface of the object to be measured can be detected by measuring the amount of light reflected from the surface of the object to be measured. That is, the two outputs of the position detection element are I1. and I2, Il+I2 represents the amount of reflected light, and a decrease in reflected light (2) indicates the presence of a scratch. On the other hand, the quotient obtained by dividing the difference between the two outputs of the position detection elements by the sum, that is, (II-I2>/(T1+I2)) represents the distance between the object to be measured and the measuring device.

その他に本発明は次の点に着目する。すなわち反射率の
大幅に変化する被計測物の場合、距離測定の際にも反射
光量11+I2を常に監視し、距離データの誤認を予防
する。さらに光量データは、被計測物の存在を表すので
、計測装置の起動および停止のため利用できる。また距
離データの細かい変動は、表面の傷を表すので、この距
離データは、単独でまたは光量データと組合わせて、傷
の判定に利用できる。
In addition, the present invention focuses on the following points. That is, in the case of an object to be measured whose reflectance changes significantly, the amount of reflected light 11+I2 is constantly monitored even during distance measurement to prevent misidentification of distance data. Furthermore, since the light amount data represents the presence of the object to be measured, it can be used for starting and stopping the measuring device. Moreover, since fine fluctuations in distance data represent scratches on the surface, this distance data can be used alone or in combination with light amount data to determine scratches.

前記の演T1.操作は、A/D変換器を介して位置検出
素子の出力をデジタル値に変換した後に、マイクロプロ
セッサを用いて行うことができる。しかしながら位置検
出素子の出力をアナログ値のままで、演算増幅器に供給
し、アナログ演算を行ってもよい。
The above performance T1. The operation can be performed using a microprocessor after converting the output of the position sensing element into a digital value via an A/D converter. However, the output of the position detection element may be supplied as an analog value to the operational amplifier to perform analog calculation.

演算の結果得られた距離検査データ(距離データと光量
データからなる)と傷検査データ(距Mデータ単独また
は゛距離データと光量データからなる)は、適当なデー
タ処理を行った後、例えば陰極線管ディスプレイに表示
することができ、またはプリンタからプリントアウトす
ることができる実施例 本発明の実施例を以下図面により説明する。
The distance inspection data (consisting of distance data and light amount data) and flaw inspection data (distance M data alone or consisting of distance data and light amount data) obtained as a result of the calculation are subjected to appropriate data processing, for example, using cathode rays. DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the invention which can be displayed on a tube display or printed out from a printer will now be described with reference to the drawings.

警1図は、本発明による計測装置の第1の実施例を概略
ブロック図で示している。計測装置1内に設けられた光
源、ここではレーザーダイオード3は、レンズを通して
被計測物2に光ビーム念送出する。この光ビームは、被
計量物2の被計測位置で反射され、別のレンズを通って
位置検出素子4に入射する0位置検出素子4は、入射光
が入射面の中心に入射した場合、2つの出力端子5と6
から同じ大きさの出力信号■1と12を生じる。
Figure 1 shows a first embodiment of a measuring device according to the invention in a schematic block diagram. A light source provided in the measuring device 1, here a laser diode 3, emits a light beam to the object to be measured 2 through a lens. This light beam is reflected at the measurement position of the object to be measured 2 and passes through another lens and enters the position detection element 4. When the incident light enters the center of the entrance surface of the zero position detection element 4, two output terminals 5 and 6
produces output signals 1 and 12 of the same magnitude.

入射光が面子面上で一方の方向にずれると、I1がI2
より大きくなり、他方の方向にずれると、I2が11よ
り大きくなる。入射光のずれ量と出力信号の大きさの変
化量の間には、所定の関係が成り立っている。
When the incident light shifts in one direction on the plane, I1 becomes I2
If it becomes larger and shifts in the other direction, I2 becomes larger than 11. A predetermined relationship holds between the amount of deviation of the incident light and the amount of change in the magnitude of the output signal.

出力信号11と12は、A/D変換器7に供給され、こ
こでそれぞれデジタル信号に変換される、これらデジタ
ル信号は、続いて引き算器8と加算器9に供給され、こ
こでそれぞれ差信号11−12と和信号11+12が形
成される。この差信号と和信号は割り算器10に供給さ
れ、ここで商信号(11−12)/(11+I2)が形
成される。
The output signals 11 and 12 are fed to an A/D converter 7, where they are respectively converted into digital signals. These digital signals are subsequently fed to a subtracter 8 and an adder 9, where they are each converted into a difference signal. 11-12 and a sum signal 11+12 are formed. The difference signal and the sum signal are supplied to a divider 10, where a quotient signal (11-12)/(11+I2) is formed.

被計測物2が例えば回転軸である場合、この回転軸は、
計測中に所定の速度で回転させられ、かつ軸方向に所定
の速度で動かされる。その際被計測物には、図示されて
いない瞬時位置信号発生器が結合されている。それによ
り波計ill物2は、ラスタ状に走査され、瞬時位置信
号発生器はラスク位置情報を発生する。
If the object to be measured 2 is, for example, a rotating shaft, this rotating shaft is
During measurement, it is rotated at a predetermined speed and moved in the axial direction at a predetermined speed. An instantaneous position signal generator (not shown) is connected to the object to be measured. Thereby, the wave meter object 2 is scanned in a raster manner, and the instantaneous position signal generator generates raster position information.

第1図の実施例においてデータ処理装fillおよび1
2は、加算器9から供給される和信号および割り算器l
Oから供給される商信号とラスク位置情報を組合せ、テ
レビジョン方式の画像信号を形成する。これら距離画像
信号と偽画像信号は、ディスプレイ13の距離出力装置
14および傷出力装置15によって視覚表示される。
In the embodiment of FIG.
2 is the sum signal supplied from the adder 9 and the divider l
The quotient signal supplied from O and the rask position information are combined to form a television system image signal. These distance image signals and false image signals are visually displayed by the distance output device 14 and flaw output device 15 of the display 13.

ここでは距離の判定も傷の判定も光量データと距離デー
タの両方に基づいて行っている。その際距離の判定は、
主として商(11−12)/(11+12)の値から行
われるが、同時に和11+I2を監視し、この和が大き
く変動した場合には、適当な修正が行われる。−古傷の
判定は、それぞれ商の値および和の値から独自に行うこ
とができるが、いずれか一方が傷と判定した場合に傷出
力を出すか、または両方が傷と判定した場合に傷出力を
出すかは、そのつと必要に応じて選択できる。
Here, distance determination and scratch determination are performed based on both light amount data and distance data. In this case, the distance determination is
This is mainly done from the value of the quotient (11-12)/(11+12), but at the same time the sum 11+I2 is monitored, and if this sum changes significantly, appropriate corrections are made. - Old scratches can be determined independently from the quotient value and the sum value, but if either one is determined to be a scratch, a scratch output will be output, or if both are determined to be a scratch, a scratch output will be output. You can choose whether to issue it or not depending on your needs.

第2図は、本発明の第2の実施例を示している、ここで
は距離の判定は第1の実施例と同じに行われるが、傷の
判定は、商の値だけから行われる、その場合商の値はそ
のままでも傷の判定に利用できるが、小さな傷を確実に
検出するなめ、次のようにすると有利である。すなわち
現在走査中の位置の前の所定の数の走査データを加算し
、この加算したデータの変化を見て、傷の判定を行う。
FIG. 2 shows a second embodiment of the invention, in which distance determination is performed in the same way as in the first embodiment, but flaw determination is performed only from the quotient value. Although the value of the case quotient can be used as is for determining flaws, it is advantageous to use the following method to reliably detect small flaws. That is, a predetermined number of scan data before the position currently being scanned is added, and a change in the added data is observed to determine a flaw.

このようにすれば傷による変化は常に加算データ内に存
在するが、ランダムな表面の変化による変化は一部相殺
され、その結果傷による変化が強調される。
In this way, changes due to scratches are always present in the summed data, but changes due to random surface changes are partially canceled out, and as a result, changes due to scratches are emphasized.

発明の効果 本発明による計測装置によれば、センサとして使用する
光電素子およびそれに付随する周辺素子が、従来のもの
の半分ですむので、経済的であり、かつ装置の所要場所
も大幅に減少する。さらに寸法の計測と傷の検査は、−
回の手続で同時に行われるので、計測時間も大幅に短縮
される。
Effects of the Invention According to the measuring device according to the present invention, the photoelectric element used as a sensor and its accompanying peripheral elements are half the amount of conventional ones, so it is economical and the space required for the device is significantly reduced. Furthermore, dimension measurement and flaw inspection are
Since the measurements are performed simultaneously in one procedure, the measurement time is also significantly shortened.

また傷の判定および距離の測定は、それぞれ距離データ
と光量データの両方を利用して行うことができるので、
結果は確実であり、表面状態の悪い被計測物(色むら等
のあるもの)であっても、正確な判定を行うことができ
る。
In addition, damage determination and distance measurement can be performed using both distance data and light amount data, respectively.
The results are reliable, and accurate judgments can be made even on objects with poor surface conditions (those with uneven color, etc.).

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明による計測装置の第1の実施例を示す
ブロック図、第2図は、第2の実施例を示すブロック図
である。 1−計測装置、2−被計測物、3−光源、4−位置検出
素子、7−A/D変換器、8−引き算器、9−加算器、
1〇−割り算器、11.12−データ処理回路、13−
ディスプレイ、14−距離出力装置、15−傷出力装置
FIG. 1 is a block diagram showing a first embodiment of a measuring device according to the present invention, and FIG. 2 is a block diagram showing a second embodiment. 1-Measuring device, 2-Object to be measured, 3-Light source, 4-Position detecting element, 7-A/D converter, 8-Subtractor, 9-Adder,
10-Divider, 11.12-Data processing circuit, 13-
Display, 14-distance output device, 15-flaw output device

Claims (3)

【特許請求の範囲】[Claims] (1)位置検出素子の2つの出力端子が演算回路に接続
されており、この演算回路は、2つの出力端子から生じ
る出力の和を形成する加算器、差を形成する引き算器お
よびこの差を和で割つて商を形成する割り算器からなり
、割り算器の出力端子と加算器の出力端子が、データ処
理回路を介して傷出力装置に接続されていることを特徴
とする、光学式傷変位計測装置。
(1) The two output terminals of the position detection element are connected to an arithmetic circuit, which includes an adder that forms the sum of the outputs generated from the two output terminals, a subtracter that forms the difference, and a subtracter that forms the difference. An optical flaw displacement device comprising a divider that divides by a sum to form a quotient, and an output terminal of the divider and an output terminal of the adder are connected to a flaw output device via a data processing circuit. Measuring device.
(2)位置検出素子の2つの出力端子が演算回路に接続
されており、この演算回路は、2つの出力端子から生じ
る出力の和を形成する加算器、差を形成する引き算器お
よびこの差を和で割つて商を形成する割り算器からなり
、割り算器の出力端子と加算器の出力端子が、データ処
理回路を介して距離出力装置に接続されていることを特
徴とする、光学式傷変位計測装置。
(2) The two output terminals of the position sensing element are connected to an arithmetic circuit, which includes an adder that forms the sum of the outputs generated from the two output terminals, a subtracter that forms the difference, and a subtracter that forms the difference. Optical scratch displacement comprising a divider that divides by a sum to form a quotient, and an output terminal of the divider and an output terminal of the adder are connected to a distance output device via a data processing circuit. Measuring device.
(3)位置検出素子の2つの出力端子が演算回路に接続
されており、この演算回路は、2つの出力端子から生じ
る出力の和を形成する加算器、差を形成する引き算器お
よびこの差を和で割つて商を形成する割り算器からなり
、割り算器の出力端子が、データ処理回路を介して傷出
力装置に接続されていることを特徴とする、光学式傷変
位計測装置。
(3) The two output terminals of the position detection element are connected to an arithmetic circuit, which includes an adder that forms the sum of the outputs generated from the two output terminals, a subtracter that forms the difference, and a subtracter that forms the difference. An optical flaw displacement measuring device comprising a divider that divides by a sum to form a quotient, and an output terminal of the divider is connected to a flaw output device via a data processing circuit.
JP8462387A 1987-04-08 1987-04-08 Optical flaw displacement measuring instrument Pending JPS63250552A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8462387A JPS63250552A (en) 1987-04-08 1987-04-08 Optical flaw displacement measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8462387A JPS63250552A (en) 1987-04-08 1987-04-08 Optical flaw displacement measuring instrument

Publications (1)

Publication Number Publication Date
JPS63250552A true JPS63250552A (en) 1988-10-18

Family

ID=13835805

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8462387A Pending JPS63250552A (en) 1987-04-08 1987-04-08 Optical flaw displacement measuring instrument

Country Status (1)

Country Link
JP (1) JPS63250552A (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57105831A (en) * 1980-12-19 1982-07-01 Matsushita Electric Ind Co Ltd Detector for optical position
JPS5990007A (en) * 1982-11-16 1984-05-24 Olympus Optical Co Ltd Optical size measuring device
JPS60169706A (en) * 1984-02-14 1985-09-03 Olympus Optical Co Ltd Surface-state measuring device
JPS60186705A (en) * 1984-03-06 1985-09-24 Agency Of Ind Science & Technol Optical roughness gauge

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57105831A (en) * 1980-12-19 1982-07-01 Matsushita Electric Ind Co Ltd Detector for optical position
JPS5990007A (en) * 1982-11-16 1984-05-24 Olympus Optical Co Ltd Optical size measuring device
JPS60169706A (en) * 1984-02-14 1985-09-03 Olympus Optical Co Ltd Surface-state measuring device
JPS60186705A (en) * 1984-03-06 1985-09-24 Agency Of Ind Science & Technol Optical roughness gauge

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