JPH0854214A - Gap measuring method - Google Patents

Gap measuring method

Info

Publication number
JPH0854214A
JPH0854214A JP18930994A JP18930994A JPH0854214A JP H0854214 A JPH0854214 A JP H0854214A JP 18930994 A JP18930994 A JP 18930994A JP 18930994 A JP18930994 A JP 18930994A JP H0854214 A JPH0854214 A JP H0854214A
Authority
JP
Japan
Prior art keywords
light
gap
light receiving
measured
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18930994A
Other languages
Japanese (ja)
Inventor
Tatsuro Sato
竜郎 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kajima Corp
Original Assignee
Kajima Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kajima Corp filed Critical Kajima Corp
Priority to JP18930994A priority Critical patent/JPH0854214A/en
Publication of JPH0854214A publication Critical patent/JPH0854214A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To obtain a highly accurate gap measuring method in which the detection space can be held in a constant state while suppressing disturbance, e.g. the effect of external light. CONSTITUTION:An optical measuring apparatus 1 is brought into tight contact with the surface of an object 11 and a light is projected from a section 6 having a light emitting element 6a arranged linearly, toward the surface of the object 1. The light reflected on the surface of the object 11 is received at a light receiving section 4 and the gap between the objects 11 is detected based on the range where the output signal from the light receiving section 4 is zero.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、発光部と受光部とを有
し受光部が密着した測定面からの反射光の量を検出する
密着型光計測装置により物体間に生じた隙間を測定する
隙間測定方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention measures a gap generated between objects by a contact type optical measuring device having a light emitting portion and a light receiving portion and detecting the amount of reflected light from a measuring surface in which the light receiving portion is in close contact. The method for measuring the gap.

【0002】[0002]

【従来の技術】物体の隙間を計測する方法としては、比
較的大きい隙間の場合はスケールやノギスのような計測
器具を用いて読取る方法や、微小な隙間の場合は隙間ゲ
ージ等を用いて測定する方法は知られている。また、外
部から直線光を斜めに投射して、CCDカメラ等でその
隙間部を撮影し画像処理する方法等も一般に使われてい
る。
2. Description of the Related Art As a method for measuring the gap between objects, a relatively large gap is read using a measuring instrument such as a scale or a caliper, and a minute gap is measured using a gap gauge or the like. How to do it is known. Further, a method of projecting linear light obliquely from the outside, photographing the gap with a CCD camera or the like, and performing image processing is also generally used.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、上記の
技術では、その検出を人間の判断で行ったり、カメラの
画像処理によっているため、計測器具の読取り誤差や画
像処理の精度や外界光の影響等の問題から安定した計測
をすることが難しく、また、計測点数が多い場合には人
手や装置の移動に時間を要し、手間のかかる面倒な仕事
であった。
However, in the above technique, since the detection is performed by human judgment or the image processing of the camera, the reading error of the measuring instrument, the accuracy of the image processing, the influence of external light, etc. It is difficult to perform stable measurement due to the above problem, and when the number of measurement points is large, it takes a lot of time to move the human hands and the device, which is a troublesome work.

【0004】したがって、本発明は、上記の問題点に鑑
み、検出空間を容易に一定の状態に保つ事ができ、外界
光の影響等の外乱に強い高精度な隙間計測方法を提供す
る事を目的としている。
Therefore, in view of the above problems, the present invention provides a highly accurate gap measuring method which can easily keep the detection space in a constant state and is resistant to disturbance such as the influence of external light. Has an aim.

【0005】[0005]

【課題を解決するための手段】本発明によれば、発光部
と受光部とを有し受光部が密着した測定面からの反射光
の量を検出する密着型光計測装置により物体間に生じた
隙間を測定する隙間測定方法において、密着型光計測装
置を被測体の表面に密着させ、前期光計測装置の線状に
配置された発光素子を有する発光部からの投射光を被測
体の表面に投射し、被測体の表面からの反射光を受光部
で受光し、受光部の信号出力が零である範囲により被測
体間の隙間を検知することを特徴とする隙間計測方法を
提供している。
According to the present invention, a contact type optical measuring device having a light emitting portion and a light receiving portion for detecting the amount of reflected light from a measuring surface with which the light receiving portion is in close contact is generated between objects. In the gap measuring method for measuring the gap, the contact type optical measuring device is brought into close contact with the surface of the DUT, and the projection light from the light emitting section having the light emitting elements arranged linearly of the optical measuring device is measured. Gap measuring method, characterized in that the light is projected onto the surface of the object, the reflected light from the surface of the measured object is received by the light receiving section, and the clearance between the measured objects is detected by the range in which the signal output of the light receiving section is zero. Are offered.

【0006】[0006]

【作用効果の説明】本発明は上記のように構成されてお
り、光計測装置の密着測定面を隙間を測定する被測体の
表面に密着させ、発光部の発光素子から光を被測体の表
面に投射し、被測体の計測ポイントの表面からの反射光
を受光部の受光素子が受光し、隙間が有ればその計測点
の受光量が零であり、信号が出力されない。また、この
計測装置は線状の発光部と受講部とを有し、線状の計測
ポイントを持つ事ができるので、同時に多点の計測が可
能である。
The present invention is configured as described above, and the contact measurement surface of the optical measuring device is brought into close contact with the surface of the object to be measured whose gap is to be measured, and light is emitted from the light emitting element of the light emitting unit. The reflected light from the surface of the measurement point of the object to be measured is received by the light receiving element of the light receiving section. If there is a gap, the amount of light received at that measurement point is zero, and no signal is output. Further, since this measuring device has a linear light emitting unit and a learning unit and can have linear measuring points, it is possible to measure multiple points at the same time.

【0007】そこで、これらの多点の計測結果を隣接す
る計測点を並べて出力表示すれば、隙間の位置とその幅
とが表示されることになる。
Therefore, if the measurement results of these multiple points are output and displayed by arranging the adjacent measurement points side by side, the position of the gap and its width are displayed.

【0008】また、表面に段差があれば、信号出力が小
となるかまたは零となるので、同様にその幅と位置とが
表示される。
Further, if there is a step on the surface, the signal output becomes small or becomes zero, so that the width and the position thereof are also displayed.

【0009】そして、計測装置の測定面は被測体に密着
されているので、外界光が入り込むことによる影響を防
止すると共に、計測ポイントの関係位置がずれることが
ないので、精度の高い測定が可能となり、操作が簡単で
ある。
Since the measuring surface of the measuring device is in close contact with the object to be measured, it is possible to prevent the influence of external light from entering and the relative position of the measuring points does not shift, so that highly accurate measurement is possible. It is possible and easy to operate.

【0010】[0010]

【実施例】以下、図面を参照して、本発明の実施例を説
明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0011】図1は本発明にかかる隙間計測方法に用い
る密着型光計測装置の例を示す斜視図で、本体1には密
着面である測定面7にV字状の溝2が設けられ、そのV
字状の溝2の測定面7に平行な底部3には線状に配置さ
れた複数の受光素子4aを有する受光部4が取付けら
れ、溝2の傾斜面5には線状に配置された複数の発光素
子6aを有する発光部6が取付けられている。
FIG. 1 is a perspective view showing an example of a close contact type optical measuring device used in the gap measuring method according to the present invention. The main body 1 is provided with a V-shaped groove 2 on a measuring surface 7 which is a close contact surface. That V
A light receiving portion 4 having a plurality of linearly arranged light receiving elements 4a is attached to a bottom portion 3 of the character-shaped groove 2 parallel to the measurement surface 7, and an inclined surface 5 of the groove 2 is linearly arranged. A light emitting unit 6 having a plurality of light emitting elements 6a is attached.

【0012】また、図2は図1のA−A断面を示し、符
号Pは測定面7上の計測ポイントPを示している。
Further, FIG. 2 shows a cross section taken along the line AA of FIG. 1, and a symbol P indicates a measurement point P on the measurement surface 7.

【0013】そして、発光部6より投射された投射光は
計測ポイントPで反射され、受光部はこの計測ポイント
Pを見る位置に配置され、計測ポイントPに於ける反射
光を受光する。そこの受光素子4aが光を受光する事
で、その受光量の変化に応じて信号出力する。
The projected light projected from the light emitting section 6 is reflected at the measurement point P, and the light receiving section is arranged at a position where the measurement point P is viewed, and the reflected light at the measurement point P is received. When the light receiving element 4a there receives light, a signal is output according to the change in the amount of received light.

【0014】以下、上記の密着型光計測装置による隙間
計測方法に付いて図3〜図8を参照して説明する。
Hereinafter, a gap measuring method using the contact type optical measuring device will be described with reference to FIGS.

【0015】図3は計測装置の本体1を被測体11aと
被測体11bとの計測面上に密着させておいた状態を示
し、被測体11aと被測体11bとの間には隙間部分G
があり、被測体11bはその上面に段差部分Sを有して
いる。
FIG. 3 shows a state in which the main body 1 of the measuring device is brought into close contact with the measurement surfaces of the objects to be measured 11a and 11b, and between the objects to be measured 11a and 11b. Gap part G
The measured object 11b has a stepped portion S on its upper surface.

【0016】図4は図3の縦断面(図3の前後方向断
面)を示し、図5は隙間や段差がない部分(図4のB−
B断面)での計測時の態様を示している。
FIG. 4 shows a vertical cross section of FIG. 3 (a cross section in the front-rear direction of FIG. 3), and FIG. 5 shows a portion having no gap or step (B-
The mode at the time of measurement in the B section) is shown.

【0017】この時、被測体11aの表面には隙間や段
差はないので、発光部6の発光素子6aから投射された
投射光Lは被測体11aの計測ポイントPで反射され、
反射光Rは受光部4の受光素子4aで受光され、検出さ
れる。
At this time, since there are no gaps or steps on the surface of the object to be measured 11a, the projection light L projected from the light emitting element 6a of the light emitting section 6 is reflected at the measurement point P of the object to be measured 11a,
The reflected light R is received and detected by the light receiving element 4a of the light receiving unit 4.

【0018】次ぎに、図6は隙間のある場合を示し、被
測体11aと11bとの間の隙間部分Gでは、発光部か
らの投射光Lは被測体11aや11bが存在しないので
反射されず、受光部4は反射光を検出しない。
Next, FIG. 6 shows a case where there is a gap. In the gap portion G between the measured objects 11a and 11b, the projection light L from the light emitting portion is reflected because the measured objects 11a and 11b do not exist. Therefore, the light receiving unit 4 does not detect the reflected light.

【0019】また、被測体に段差Sがある場合は、図7
を参照して、発光部6からの投射光Lは被測体で反射さ
れるが、この場合は計測ポイントが正規の位置からずれ
るため(図においては離れる)、反射光Rは受光部4で
検出されないか、または反射光量が小となるため、検出
レベルが低くなる。
Further, when there is a step S on the object to be measured, FIG.
Referring to, the projection light L from the light emitting section 6 is reflected by the object to be measured, but in this case, the measurement point deviates from the normal position (in the figure, it is separated), and thus the reflected light R is received by the light receiving section 4. Since it is not detected or the reflected light amount is small, the detection level is low.

【0020】そこで、計測装置1の計測ラインに渡って
順次組合わされて生じる計測装置からの検出出力の信号
レベルを縦軸に、計測器の受光素子順列を横軸にとって
プロットすると図8に示すようになり、図8におけるa
点に相当する受講部4の受光素子を1番素子として昇順
に番号を付けると図8のb点とc点とに相当する受光素
子番号の差分が図4における隙間部分Gの間隔に相当す
る。この時、受光素子間隔が既知であれば、上記の隙間
部分Gの間隔の寸法を容易に換算ができる。
Therefore, when the signal level of the detection output from the measuring devices which is sequentially combined over the measuring line of the measuring device 1 is plotted on the vertical axis and the light receiving element permutation of the measuring instrument is plotted on the horizontal axis, it is plotted as shown in FIG. Then, in FIG.
When the light receiving elements of the learning unit 4 corresponding to the points are numbered in ascending order as the first element, the difference between the light receiving element numbers corresponding to points b and c in FIG. 8 corresponds to the gap G in FIG. . At this time, if the distance between the light receiving elements is known, it is possible to easily convert the size of the space of the gap portion G.

【0021】同様に、d点とe点との間隔が図4におけ
る段差部Sの溝幅になる。
Similarly, the distance between the points d and e becomes the groove width of the step S in FIG.

【0022】この場合、受光部4の受光素子の配置間隔
がこの計測法の分解能に相当し、この配置間隔が小であ
るものが高精度な計測が可能となる。
In this case, the arrangement interval of the light receiving elements of the light receiving unit 4 corresponds to the resolution of this measuring method, and the arrangement interval of which is small enables highly accurate measurement.

【0023】したがって、隙間の間隔寸法が高精度で簡
単に測定できる。
Therefore, it is possible to easily measure the size of the gap with high accuracy.

【0024】[0024]

【発明の効果】本発明は、上記のように構成されている
ので、以下の優れた効果を奏する。 (1) 計測装置に設けられた一定の計測空間内で検出
されるので、操作は簡単で、安定して精度が高い。 (2) 計測装置が被測体に密着されるので、外界光等
の外乱の影響が少ない。 (3) したがって、簡単に精度のよい隙間計測ができ
る。
Since the present invention is constructed as described above, it has the following excellent effects. (1) Since it is detected in a fixed measurement space provided in the measuring device, the operation is simple, stable, and highly accurate. (2) Since the measuring device is brought into close contact with the object to be measured, the influence of disturbance such as external light is small. (3) Therefore, it is possible to easily and accurately measure the gap.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例に用いる密着型光計測装置の
斜視図。
FIG. 1 is a perspective view of a contact-type optical measuring device used in an embodiment of the present invention.

【図2】図1のA−A断面図。FIG. 2 is a sectional view taken along line AA of FIG.

【図3】図1の計測装置で計測している態様を示す斜視
図。
FIG. 3 is a perspective view showing an aspect in which measurement is performed by the measuring device of FIG.

【図4】図3の縦断面図。FIG. 4 is a vertical sectional view of FIG.

【図5】図4のB−B断面における作用を説明する図。5A and 5B are views for explaining the operation in the BB cross section of FIG.

【図6】図4のC−C断面における作用を説明する図。6A and 6B are views for explaining the action in the CC cross section of FIG. 4;

【図7】図4のD−D断面における作用を説明する図。7A and 7B are views for explaining the action in the DD cross section of FIG. 4;

【図8】隙間を表す検出出力の例を示す図。FIG. 8 is a diagram showing an example of detection output indicating a gap.

【符号の説明】[Explanation of symbols]

1…本体 2…溝 3…底部 4…受光部 5…傾斜部 6…発光部 7…密着測定部 11…被測体 DESCRIPTION OF SYMBOLS 1 ... Main body 2 ... Groove 3 ... Bottom part 4 ... Light receiving part 5 ... Inclined part 6 ... Light emitting part 7 ... Adhesion measuring part 11 ... Measured object

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 発光部と受光部とを有し受光部が密着し
た測定面からの反射光の量を検出する密着型光計測装置
により物体間に生じた隙間を測定する隙間測定方法にお
いて、密着型光計測装置を被測体の表面に密着させ、前
期光計測装置の線状に配置された発光素子を有する発光
部からの投射光を被測体の表面に投射し、被測体の表面
からの反射光を受光部で受光し、受光部の信号出力が零
である範囲により被測体間の隙間を検知することを特徴
とする隙間計測方法。
1. A gap measuring method for measuring a gap generated between objects by a contact type optical measuring device which has a light emitting part and a light receiving part and detects the amount of reflected light from a measurement surface where the light receiving part is in close contact, The contact-type optical measuring device is brought into close contact with the surface of the object to be measured, and the projection light from the light-emitting portion having the light-emitting elements arranged linearly of the optical measuring device is projected onto the surface of the object to be measured. A gap measuring method characterized in that reflected light from the surface is received by a light receiving section, and the gap between the measured objects is detected by a range in which the signal output of the light receiving section is zero.
JP18930994A 1994-08-11 1994-08-11 Gap measuring method Pending JPH0854214A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18930994A JPH0854214A (en) 1994-08-11 1994-08-11 Gap measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18930994A JPH0854214A (en) 1994-08-11 1994-08-11 Gap measuring method

Publications (1)

Publication Number Publication Date
JPH0854214A true JPH0854214A (en) 1996-02-27

Family

ID=16239194

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18930994A Pending JPH0854214A (en) 1994-08-11 1994-08-11 Gap measuring method

Country Status (1)

Country Link
JP (1) JPH0854214A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002333309A (en) * 2001-05-09 2002-11-22 Disco Abrasive Syst Ltd Apparatus and method for measuring chipping
JP2014001648A (en) * 2012-06-15 2014-01-09 Toshiba Corp Method for measuring disc wheel clearance in steam turbine and disc wheel clearance measurement sensor
CN111811423A (en) * 2019-04-12 2020-10-23 株式会社三丰 Shape measuring device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002333309A (en) * 2001-05-09 2002-11-22 Disco Abrasive Syst Ltd Apparatus and method for measuring chipping
JP2014001648A (en) * 2012-06-15 2014-01-09 Toshiba Corp Method for measuring disc wheel clearance in steam turbine and disc wheel clearance measurement sensor
CN111811423A (en) * 2019-04-12 2020-10-23 株式会社三丰 Shape measuring device

Similar Documents

Publication Publication Date Title
US4631519A (en) Position measuring apparatus
US4988886A (en) Moire distance measurement method and apparatus
US5319442A (en) Optical inspection probe
JPH10253351A (en) Range finder
GB2126444A (en) Position measuring apparatus
JPH02129518A (en) Photoelectric position measuring apparatus
JP4215220B2 (en) Surface inspection method and surface inspection apparatus
US4993830A (en) Depth and distance measuring system
JPH0854214A (en) Gap measuring method
JP4534877B2 (en) Optical sensor device
RU2248093C1 (en) Optoelectronic converter of position-code type
JPH05322562A (en) Electronic level and level rod therefor
JP3016502B2 (en) Surface roughness measuring device
JP2942906B2 (en) Electronic level device
JPS6034699B2 (en) hardness tester
JP2000258146A (en) Radiation thickness measurement device
JPH06307816A (en) Non-contact plate width measuring device
JPS58132896A (en) Conpound sensor
JPH0621776B2 (en) Image clarity measurement method
JP2006184091A (en) In-plane direction displacement gauge
JP3319666B2 (en) Edge detection device
JPS6234264Y2 (en)
JPH0781841B2 (en) Thickness measuring device
JPH01272126A (en) Apparatus for inspecting lead bend of semiconductor device
JP2003329425A (en) Method and device for measuring surface shape