JPS6321337B2 - - Google Patents

Info

Publication number
JPS6321337B2
JPS6321337B2 JP54087460A JP8746079A JPS6321337B2 JP S6321337 B2 JPS6321337 B2 JP S6321337B2 JP 54087460 A JP54087460 A JP 54087460A JP 8746079 A JP8746079 A JP 8746079A JP S6321337 B2 JPS6321337 B2 JP S6321337B2
Authority
JP
Japan
Prior art keywords
light
mark
optical system
slit
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54087460A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5612727A (en
Inventor
Kyoichi Suwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nippon Kogaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Kogaku KK filed Critical Nippon Kogaku KK
Priority to JP8746079A priority Critical patent/JPS5612727A/ja
Priority to US06/166,794 priority patent/US4390279A/en
Publication of JPS5612727A publication Critical patent/JPS5612727A/ja
Publication of JPS6321337B2 publication Critical patent/JPS6321337B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7073Alignment marks and their environment
    • G03F9/7076Mark details, e.g. phase grating mark, temporary mark
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7049Technique, e.g. interferometric
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Projection-Type Copiers In General (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP8746079A 1979-07-12 1979-07-12 Aligning device for ic projection exposure apparatus Granted JPS5612727A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP8746079A JPS5612727A (en) 1979-07-12 1979-07-12 Aligning device for ic projection exposure apparatus
US06/166,794 US4390279A (en) 1979-07-12 1980-07-08 Alignment device in an IC projection exposure apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8746079A JPS5612727A (en) 1979-07-12 1979-07-12 Aligning device for ic projection exposure apparatus

Publications (2)

Publication Number Publication Date
JPS5612727A JPS5612727A (en) 1981-02-07
JPS6321337B2 true JPS6321337B2 (en, 2012) 1988-05-06

Family

ID=13915480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8746079A Granted JPS5612727A (en) 1979-07-12 1979-07-12 Aligning device for ic projection exposure apparatus

Country Status (1)

Country Link
JP (1) JPS5612727A (en, 2012)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57138134A (en) * 1981-02-20 1982-08-26 Nippon Kogaku Kk <Nikon> Positioning device
JPS5927526A (ja) * 1982-08-06 1984-02-14 Hitachi Ltd 縮小投影露光装置
JPS60232552A (ja) * 1984-05-02 1985-11-19 Canon Inc 照明光学系
JPS6159829A (ja) * 1984-08-31 1986-03-27 Hitachi Ltd 縮小投影式アライメント装置

Also Published As

Publication number Publication date
JPS5612727A (en) 1981-02-07

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