JPS63213118A - Apparatus for producing thin metallic film - Google Patents

Apparatus for producing thin metallic film

Info

Publication number
JPS63213118A
JPS63213118A JP4557987A JP4557987A JPS63213118A JP S63213118 A JPS63213118 A JP S63213118A JP 4557987 A JP4557987 A JP 4557987A JP 4557987 A JP4557987 A JP 4557987A JP S63213118 A JPS63213118 A JP S63213118A
Authority
JP
Japan
Prior art keywords
plate
polymer substrate
shutter plate
shutter
overlap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4557987A
Other languages
Japanese (ja)
Inventor
Kazuyoshi Honda
和義 本田
Ryuji Sugita
龍二 杉田
Kiyokazu Toma
清和 東間
Taro Nanbu
太郎 南部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP4557987A priority Critical patent/JPS63213118A/en
Publication of JPS63213118A publication Critical patent/JPS63213118A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To prevent electrification of a high-polymer substrate during a heating and melting operation and to prevent wrinkling of the film-shaped high-polymer substrate by providing a deposition preventive plate and shutter plate in such a manner that the two plates overlap on each other at >=3 times the spacing therebetween while the shutter plate is held closed. CONSTITUTION:A metallic material of an evaporation source 5 is previously heated and melted prior to vapor deposition of metal atoms in the case of un-rolling the long-sized film-shaped high-polymer substrate wound like a roll in a vacuum and adhering the metal atoms evaporating from the evaporation source 5 by an electron beam to the high-polymer substrate, then rolling again the substrate. The aperture of the deposition preventive plate 4 is held covered by the movable shutter plate 8 during this heating and melting operation. The shutter plate 8 is opened and the vapor deposition is executed after the desired evaporation state is attained. The overlap of both the plate 4 and the plate 8 is set at x>=3d with respect to the spacing (d) between the two plates while the plate 8 is held closed, by which the electrification of the high-polymer substrate by the secondary electrons and reflected electrons from the metallic material is prevented and the wrinkling of the substrate on a take-up roll is obviated.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は高分子基板上に金属薄膜をしわな(形成する為
の製造装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a manufacturing apparatus for wrinkle-forming thin metal films on polymeric substrates.

従来の技術 フィルム状の高分子基板上に金属薄膜を形成する技術は
重要であり、高品質の膜を大量に製造することが必要で
ある。その為の一方法として、ローラを用いた搬送系と
、真空蒸着法を用いた、第2図に示すような連続巻き取
り式真空蒸着法がある。即ち第2図で巻き出しロール1
がら巻き出された高分子基板2は円筒状のキャン3の周
面に沿って走行中に防着板4の開口部において電子ビー
ム10により加熱されている蒸発源5から金属薄膜の蒸
着を受けた後に巻き取りロール6に巻き取られる。この
際、バイアスローラ7とキャンの間に電圧を印加すると
、高分子基板とキャンが密着して両者間の熱伝導が良く
なり、基板温度をキャン温度で安定にコントロールでき
ると共に、蒸着時の熱負荷による基板の熱損傷や蒸着膜
のしわを防ぐことができる。
BACKGROUND OF THE INVENTION The technology of forming metal thin films on film-like polymer substrates is important, and it is necessary to produce high-quality films in large quantities. One method for this purpose is a continuous winding type vacuum evaporation method as shown in FIG. 2, which uses a conveyance system using rollers and a vacuum evaporation method. That is, in Fig. 2, unwinding roll 1
While the unwound polymer substrate 2 is running along the circumferential surface of the cylindrical can 3, a metal thin film is deposited at the opening of the deposition prevention plate 4 from the evaporation source 5 heated by the electron beam 10. After that, it is wound up on a winding roll 6. At this time, if a voltage is applied between the bias roller 7 and the can, the polymer substrate and the can will come into close contact with each other, improving heat conduction between the two, making it possible to stably control the substrate temperature at the can temperature, and also to avoid the heat generated during evaporation. Heat damage to the substrate and wrinkles in the deposited film due to load can be prevented.

ところで、金属薄膜を蒸着する場合、これに先立って予
め蒸発源の金属材料を加熱、溶融しておく必要がある。
By the way, when depositing a metal thin film, it is necessary to heat and melt the metal material of the evaporation source in advance.

この加熱、溶融作業は真空中で行われ、加熱手段として
は電子ビームが広(用いられている。この加熱、溶融作
業中にはシャッター機構により高分子基板が走行する走
行系と蒸発源を第3図のように分離して所望の蒸発状態
に達してから高分子基板を走行させ、シャッターを開い
て蒸着を行うことにより基板の熱損傷なしに希望の金属
薄膜のみを蒸着する事が出来る。
This heating and melting work is carried out in a vacuum, and an electron beam is used as the heating means. As shown in Figure 3, by separating the polymer substrate to reach the desired evaporation state, moving the polymer substrate, opening the shutter, and performing evaporation, only the desired metal thin film can be evaporated without thermal damage to the substrate.

発明が解決しようとする問題点 ところがこの場合、まだ金属薄膜が蒸着されていない部
分を巻き取るときに巻き取りロール上で第4図に示すよ
うな巻きしわが入り、それがもとでそのあとで巻き取っ
た金属薄膜形成部分にも巻き取りロール上でしわが入っ
てしまう。この様なしわは、加熱、溶融作業に時間をか
けた場合はど顕著であり、この事からしわの原因は加熱
、溶融作業中に発生した金属材料からの2次電子や反射
電子によって高分子基板が帯電してしまうためと思われ
る。ところが単に蒸発源の位置から高分子基板が見えな
いように防着板やシャッターを配置するだけではこのし
わは防ぐことが出来ない。
Problems to be Solved by the Invention However, in this case, when winding up the part on which the metal thin film has not yet been deposited, wrinkles appear on the winding roll as shown in Figure 4, which causes The part where the metal thin film is formed is also wrinkled on the take-up roll. Such wrinkles are more noticeable when heating and melting work takes a long time, and the cause of wrinkles is that secondary electrons and reflected electrons from the metal material generated during heating and melting work cause polymer molecules to This seems to be because the board becomes electrically charged. However, this wrinkle cannot be prevented simply by arranging an anti-adhesion plate or a shutter so that the polymer substrate cannot be seen from the position of the evaporation source.

本発明は、蒸発金属材料の加熱、溶融作業中に発生した
金属材料からの2次電子や反射電子によって、フィルム
状の高分子基板が帯電してしまう事を防ぎ、連続巻き取
り式真空蒸着法における巻き取りロール上でのしわの発
生を防止することを目的とする。
The present invention provides a continuous winding vacuum evaporation method that prevents a film-like polymer substrate from being charged by secondary electrons and reflected electrons from the metal material generated during heating and melting of the evaporated metal material. The purpose is to prevent wrinkles from forming on the take-up roll.

問題点を解決するための手段 ロール状に巻かれた長尺のフィルム状高分子基板を真空
中で巻きだし、電子ビーム蒸発源より蒸発した金属原子
をこれに付着させた後、再びロール状に巻き取る連続巻
き取り式の金属薄膜の製造装置において、高分子基板が
走行する走行系と蒸発源との間に一部に開口部を有する
防着板を備え、その開口部を覆う可動のシャッター板を
有し、そのシャッター板を閉じた状態において、前記防
着板と前記シャッター板とが、両者の間の間隔の3倍以
上該重なり合っている、もしくは、前記防着板と前記シ
ャッター板との重なり合いが3重以上であり、前記シャ
ッター板を閉じた状態において前記防着板と前記シャッ
ター板とが、両者の間の間隔の2倍以上、前記シャッタ
ー板の両側で重なり合っている。
Means to solve the problem A long film-like polymer substrate wound into a roll is unwound in a vacuum, metal atoms evaporated from an electron beam evaporation source are attached to it, and then it is rolled again. A continuous winding type metal thin film production device is equipped with an adhesion prevention plate having an opening in a part between the running system on which the polymer substrate runs and the evaporation source, and a movable shutter that covers the opening. plate, and when the shutter plate is closed, the adhesion-prevention plate and the shutter plate overlap each other by three times or more the distance between them, or the adhesion-prevention plate and the shutter plate overlap. overlap three times or more, and when the shutter plate is closed, the adhesion prevention plate and the shutter plate overlap on both sides of the shutter plate by at least twice the distance between them.

作用 本発明によれば、蒸発金属材料の加熱、溶融作業中に発
生した金属材料からの2次電子や反射電子によってフィ
ルム状の高分子基板が帯電してしまう事を防ぐ事が出来
、高分子基板の帯電による巻き取りロール上でのしわな
しをなくす事が出来る。
According to the present invention, it is possible to prevent a film-like polymer substrate from being charged by secondary electrons and reflected electrons from the metal material generated during heating and melting of the evaporated metal material. It is possible to eliminate wrinkles on the take-up roll due to charging of the substrate.

実施例 第5図に防着板とシャッター板との位置関係を示す。防
着板とシャッター板との間隔をd、防着板とシャッター
板との重なり量を基板走行方向の前後で共にXとした。
Embodiment FIG. 5 shows the positional relationship between the adhesion prevention plate and the shutter plate. The distance between the adhesion prevention plate and the shutter plate was d, and the amount of overlap between the adhesion prevention plate and the shutter plate was both X in the front and back of the board running direction.

このdとXを変えて実際に金属薄膜を形成した。高分子
基板としては厚さ12ミクロン、幅15craのポリイ
ミドフィルムを用いた。真空槽を2X10−6torr
まで排気した後、金属薄iとしてTi膜を500Aの厚
さに真空蒸着した。電子ビームは27o°偏向型の電子
銃より加速電圧10kVでTiに当てた。第1図の構成
でシャッターを閉じた状態でエミッション電流100m
Aで加熱、溶融作業を始め、最終的にはエミッション電
流をIAにした。加熱、溶融作業終了後、基板を15m
/分で走行させ、シャッターを開いてTi膜を蒸着した
。この時のTi膜の堆積速度は毎秒およそ4000Aで
、高分子基板上に300AのTi膜を形成した。キャン
温度は100℃であった。各ローラの電位は、キャンが
0vで、バイアスローラが一100Vである。以上の条
件下で、防着板とシャッター板との間隔d、及び防着板
とシャッター板との重なり量Xを変えてそれぞれ蒸着実
験を3回ずつ行った結果を第6図に示す。第6図で○、
△、及び×はそれぞれ3回の蒸着実験において金属薄膜
が蒸着されていない部分を巻き取るときに巻き取りロー
ル上で巻き取りしわが一度も入らなかった場合、巻き取
りしわが入ったり入らなかったりした場合、及び3回と
も巻き取りしわが入った場合を示す。第6図より、X≧
3dの範囲では巻き取りしわが入らない事が分かる。第
7図には他の例として高分子基板の走行速度を30m/
分、その他の条件は先程と同じとして高分子基板上に1
50AのTi膜を形成した場合の実験結果を示す。グラ
フ中の記号の意味は先程と同じである。第7図において
もやはりX≧3dの範囲では巻き取りしわが入らない。
A metal thin film was actually formed by changing d and X. A polyimide film with a thickness of 12 microns and a width of 15 cra was used as the polymer substrate. Vacuum chamber 2X10-6torr
After evacuating to a temperature of 500 Å, a Ti film was vacuum-deposited as a metal thin layer to a thickness of 500 Å. The electron beam was applied to Ti from a 27° deflection type electron gun at an accelerating voltage of 10 kV. Emission current is 100 m when the shutter is closed with the configuration shown in Figure 1.
Heating and melting work began at A, and finally the emission current was set to IA. After heating and melting work, the board was moved 15m.
/min, the shutter was opened, and a Ti film was deposited. The deposition rate of the Ti film at this time was approximately 4000 A per second, and a Ti film of 300 A was formed on the polymer substrate. The can temperature was 100°C. The potential of each roller is 0V for the can and 1100V for the bias roller. Under the above conditions, the deposition experiment was conducted three times each by changing the distance d between the deposition prevention plate and the shutter plate and the amount of overlap X between the deposition prevention plate and the shutter plate, and the results are shown in FIG. In Figure 6, ○,
△ and × indicate cases where there were no winding wrinkles on the winding roll when winding up the part on which the metal thin film was not deposited in three vapor deposition experiments, and whether there were winding wrinkles or no winding wrinkles. This shows the case where the paper was rolled up, and the case where wrinkles appeared after winding up all three times. From Figure 6, X≧
It can be seen that there are no winding wrinkles in the 3d range. Figure 7 shows another example in which the traveling speed of the polymer substrate is 30 m/
minutes, and other conditions are the same as before, and one layer is placed on the polymer substrate.
The experimental results are shown when a 50A Ti film is formed. The meanings of the symbols in the graph are the same as before. Also in FIG. 7, winding wrinkles do not occur within the range of X≧3d.

この様にX≧3dの範囲では巻き取りしわが入らない理
由は次の様に考えられる。即ちdが大きいほど2次電子
や反射電子が防着板とシャッター板との間を通って高分
子基板に達しやすく、これによって高分子基板が帯電し
て巻き取りしわが入りやすい。これを防止するためには
防着板とシャッター板との重なり量を多くすればよく、
dが大きい程、Xを大きくする必要がある。X≧3dと
すると、もはや2次電子や反射電子は防着板とシャッタ
ー板との間を通って高分子基板に達する事はほとんどな
(、従って高分子基板は帯電せず巻き取りしわは入らな
い。
The reason why winding wrinkles do not occur in the range of X≧3d is considered as follows. That is, the larger d is, the easier it is for secondary electrons and reflected electrons to pass between the adhesion prevention plate and the shutter plate and reach the polymer substrate, thereby charging the polymer substrate and causing wrinkles to occur when the polymer substrate is wound. In order to prevent this, it is sufficient to increase the amount of overlap between the adhesion prevention plate and the shutter plate.
The larger d is, the larger X needs to be. If X≧3d, secondary electrons and backscattered electrons almost no longer reach the polymer substrate through the gap between the anti-adhesion plate and the shutter plate (therefore, the polymer substrate is not charged and there are no wrinkles when it is rolled up). do not have.

次に第8図の様に防着板とシャッター板とを3重に重ね
合わせて加熱、溶融作業を行った場合の結果について述
べる。シャッター板の上下に防着板を設け、第9図に示
すように防着板と上下のシャッター板との間隔を共に等
しくdとした。また、防着板とシャッター板との重なり
量についても上下の防着板共、左右等量のXとした。そ
して先程と同じ様にd及びXを変えて高分子基板上にT
i1llを形成した。その他の実験条件を先程と同じに
した時の第6図及び第7図に対応する実験結果がそれぞ
れ第10図及び第11図である。防着板とシャッター板
とを3重に重ね合わせた事により、しわなしの条件は先
程よりも広がって、X≧2dであれば巻き取りしわは入
らない。
Next, we will discuss the results when heating and melting the adhesion prevention plate and shutter plate stacked three times as shown in FIG. 8. Anti-adhesion plates were provided above and below the shutter plate, and as shown in FIG. 9, the distances between the anti-adhesion plates and the upper and lower shutter plates were both set to d. In addition, regarding the amount of overlap between the anti-adhesion plate and the shutter plate, both the upper and lower anti-adhesion plates were set to have the same amount X on the left and right sides. Then, as before, change d and X and place T on the polymer substrate.
i1ll was formed. FIGS. 10 and 11 show experimental results corresponding to FIGS. 6 and 7, respectively, when other experimental conditions were kept the same as before. By stacking the adhesion-proof plate and the shutter plate in three layers, the wrinkle-free conditions are wider than before, and if X≧2d, no wrinkles will appear during winding.

発明の効果 本発明によれば、蒸発金属材料の加熱、溶融作業中に発
生した金属材料からの2次電子や反射電子によってフィ
ルム状の高分子基板が帯電してしまう事を防ぐ事が出来
るので、フィルム状高分子基板上に金属薄膜を、しわな
(大量に形成できる。
Effects of the Invention According to the present invention, it is possible to prevent a film-like polymer substrate from being charged by secondary electrons and reflected electrons from the metal material generated during heating and melting of the evaporated metal material. , a large amount of wrinkled metal thin film can be formed on a film-like polymer substrate.

【図面の簡単な説明】 第1図は本発明の一実施例における金属薄膜の製造装置
を示す断面図、第2図及び第3図は、従来の連続巻き取
り式真空蒸着装置を示す断面図、第4図は高分子基板の
帯電による巻き取りしわを示す斜視図、第5図は防着板
とシャッター板との位置関係を示す断面図、第6図及び
第7図は防着板とシャッター板との重なり量Xを変えて
金属薄膜を形成した時の実験結果を示すグラフ、第8図
は金属薄膜の製造装置の他の例を示す断面図、第9図は
第8図の装置における要部の位置関係を示すi面図、第
10図及び第11図は、第8図の装置において防着板と
シャッター板との重なり量Xを変えて金属薄膜を形成し
た時の実験結果を示すグラフである。 1・・・・巻き出しロール、 2・・・・高分子基板、
3・・・・キャン、 4・・・・防着板、 5・・・・
蒸発源、 6・・・・巻き取りロール、 7・・・・バ
イアスローラ、 8・・・・シャッター板、 9・・・
・電子銃、  10・・・・電子ビーム、  11・・
・・フリーローラ、 12・・・・巻き取りしわ、 1
3・・・・真空槽、 14・・・・排気系、  15・
・・・回転方向。 代理人の氏名 弁理士 中尾敏男 ほか1名第1図 第 2 図 第3図 第4図 第5図 第6図 02θ 4θ 2θ ♂θ lθθ d(屑m) 第711ffl dryyt川ン 第8用 第9図 第10図 d(次mつ
[Brief Description of the Drawings] Fig. 1 is a sectional view showing a metal thin film manufacturing apparatus according to an embodiment of the present invention, and Figs. 2 and 3 are sectional views showing a conventional continuous winding type vacuum evaporation apparatus. , FIG. 4 is a perspective view showing wrinkles caused by winding of the polymer substrate due to charging, FIG. 5 is a sectional view showing the positional relationship between the adhesion prevention plate and the shutter plate, and FIGS. A graph showing the experimental results when metal thin films were formed by varying the amount of overlap X with the shutter plate, Figure 8 is a cross-sectional view showing another example of the metal thin film manufacturing apparatus, and Figure 9 is the apparatus shown in Figure 8. Figures 10 and 11, which show the positional relationship of the main parts in the i-plane, show the experimental results when a metal thin film was formed by changing the amount of overlap X between the adhesion prevention plate and the shutter plate in the apparatus shown in Figure 8. This is a graph showing. 1... Unwinding roll, 2... Polymer substrate,
3...can, 4...anti-adhesion plate, 5...
Evaporation source, 6... Take-up roll, 7... Bias roller, 8... Shutter plate, 9...
・Electron gun, 10...Electron beam, 11...
... Free roller, 12 ... Winding wrinkle, 1
3... Vacuum chamber, 14... Exhaust system, 15...
···Direction of rotation. Name of agent: Patent attorney Toshio Nakao and one other person Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 02θ 4θ 2θ ♂θ lθθ d (waste) Figure 10 d (next

Claims (2)

【特許請求の範囲】[Claims] (1)ロール状に巻かれた長尺のフィルム状高分子基板
を真空中で巻きだし、電子ビーム蒸発源より蒸発した金
属原子をこれに付着させた後、再びロール状に巻き取る
連続巻き取り式の金属薄膜の製造装置において、前記高
分子基板が走行する走行系と前記蒸発源との間に一部に
開口部を有する防着板を備え、その開口部を覆う可動の
シャッター板を有し、そのシャッター板を閉じた状態に
おいて、前記防着板と前記シャッター板とが、両者の間
の間隔の3倍以上該重なり合っている事を特徴とする金
属薄膜の製造装置。
(1) Continuous winding in which a long film-like polymer substrate wound into a roll is unwound in vacuum, metal atoms evaporated from an electron beam evaporation source are attached to it, and then wound into a roll again. In the metal thin film manufacturing apparatus of the formula, an adhesion prevention plate having an opening in a part is provided between the traveling system through which the polymer substrate runs and the evaporation source, and a movable shutter plate is provided to cover the opening. An apparatus for manufacturing a thin metal film, characterized in that, when the shutter plate is closed, the adhesion prevention plate and the shutter plate overlap each other by at least three times the distance between them.
(2)ロール状に巻かれた長尺のフィルム状高分子基板
を真空中で巻きだし、電子ビーム蒸発源より蒸発した金
属原子をこれに付着させた後、再びロール状に巻き取る
連続巻き取り式の金属薄膜の製造装置において、前記高
分子基板が走行する走行系と前記蒸発源との間に一部に
開口部を有する防着板を備え、その開口部を覆う可動の
シャッター板を有し、前記防着板と前記シャッター板と
の重なり合いが3重以上であり、前記シャッター板を閉
じた状態において前記防着板と前記シャッター板とが、
両者の間の間隔の2倍以上、前記シャッター板の両側で
重なり合っている事を特徴とする金属薄膜の製造装置。
(2) Continuous winding in which a long film-like polymer substrate wound into a roll is unwound in vacuum, metal atoms evaporated from an electron beam evaporation source are attached to it, and then wound into a roll again. In the metal thin film manufacturing apparatus of the formula, an adhesion prevention plate having an opening in a part is provided between the traveling system through which the polymer substrate runs and the evaporation source, and a movable shutter plate is provided to cover the opening. The deposition prevention plate and the shutter plate overlap three times or more, and when the shutter plate is closed, the deposition prevention plate and the shutter plate overlap,
A metal thin film manufacturing apparatus characterized in that the shutter plates overlap each other on both sides by at least twice the distance between them.
JP4557987A 1987-02-27 1987-02-27 Apparatus for producing thin metallic film Pending JPS63213118A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4557987A JPS63213118A (en) 1987-02-27 1987-02-27 Apparatus for producing thin metallic film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4557987A JPS63213118A (en) 1987-02-27 1987-02-27 Apparatus for producing thin metallic film

Publications (1)

Publication Number Publication Date
JPS63213118A true JPS63213118A (en) 1988-09-06

Family

ID=12723258

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4557987A Pending JPS63213118A (en) 1987-02-27 1987-02-27 Apparatus for producing thin metallic film

Country Status (1)

Country Link
JP (1) JPS63213118A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006088024A1 (en) * 2005-02-16 2006-08-24 Ulvac, Inc. Reel to reel vacuum sputtering apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006088024A1 (en) * 2005-02-16 2006-08-24 Ulvac, Inc. Reel to reel vacuum sputtering apparatus
US7670433B2 (en) 2005-02-16 2010-03-02 Ulvac, Inc. Vacuum deposition apparatus of the winding type
JP5059597B2 (en) * 2005-02-16 2012-10-24 株式会社アルバック Winding type vacuum deposition system

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