JPS6319026B2 - - Google Patents

Info

Publication number
JPS6319026B2
JPS6319026B2 JP55186692A JP18669280A JPS6319026B2 JP S6319026 B2 JPS6319026 B2 JP S6319026B2 JP 55186692 A JP55186692 A JP 55186692A JP 18669280 A JP18669280 A JP 18669280A JP S6319026 B2 JPS6319026 B2 JP S6319026B2
Authority
JP
Japan
Prior art keywords
circuit
logic
polarity
selection
waveform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55186692A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57111470A (en
Inventor
Junji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP55186692A priority Critical patent/JPS57111470A/ja
Publication of JPS57111470A publication Critical patent/JPS57111470A/ja
Publication of JPS6319026B2 publication Critical patent/JPS6319026B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55186692A 1980-12-29 1980-12-29 Logical-waveform generation circuit Granted JPS57111470A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55186692A JPS57111470A (en) 1980-12-29 1980-12-29 Logical-waveform generation circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55186692A JPS57111470A (en) 1980-12-29 1980-12-29 Logical-waveform generation circuit

Publications (2)

Publication Number Publication Date
JPS57111470A JPS57111470A (en) 1982-07-10
JPS6319026B2 true JPS6319026B2 (enrdf_load_stackoverflow) 1988-04-21

Family

ID=16192957

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55186692A Granted JPS57111470A (en) 1980-12-29 1980-12-29 Logical-waveform generation circuit

Country Status (1)

Country Link
JP (1) JPS57111470A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993014412A1 (en) * 1992-01-21 1993-07-22 Advantest Corporation Waveform shaping circuit for semiconductor testing device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5641017B2 (enrdf_load_stackoverflow) * 1974-12-28 1981-09-25

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993014412A1 (en) * 1992-01-21 1993-07-22 Advantest Corporation Waveform shaping circuit for semiconductor testing device

Also Published As

Publication number Publication date
JPS57111470A (en) 1982-07-10

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