JPS6318868B2 - - Google Patents
Info
- Publication number
- JPS6318868B2 JPS6318868B2 JP6214081A JP6214081A JPS6318868B2 JP S6318868 B2 JPS6318868 B2 JP S6318868B2 JP 6214081 A JP6214081 A JP 6214081A JP 6214081 A JP6214081 A JP 6214081A JP S6318868 B2 JPS6318868 B2 JP S6318868B2
- Authority
- JP
- Japan
- Prior art keywords
- floating gate
- sio
- control gate
- memory cell
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 5
- 239000000969 carrier Substances 0.000 claims description 2
- 235000012239 silicon dioxide Nutrition 0.000 claims description 2
- 239000000377 silicon dioxide Substances 0.000 claims description 2
- 230000015654 memory Effects 0.000 description 21
- 229910004298 SiO 2 Inorganic materials 0.000 description 16
- 238000000034 method Methods 0.000 description 9
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 7
- 238000002347 injection Methods 0.000 description 5
- 239000007924 injection Substances 0.000 description 5
- 238000005121 nitriding Methods 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 3
- 239000002784 hot electron Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- XUFQPHANEAPEMJ-UHFFFAOYSA-N famotidine Chemical compound NC(N)=NC1=NC(CSCCC(N)=NS(N)(=O)=O)=CS1 XUFQPHANEAPEMJ-UHFFFAOYSA-N 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 241001663154 Electron Species 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
- H01L29/7881—Programmable transistors with only two possible levels of programmation
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Non-Volatile Memory (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6214081A JPS57177560A (en) | 1981-04-24 | 1981-04-24 | Semiconductor memory |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6214081A JPS57177560A (en) | 1981-04-24 | 1981-04-24 | Semiconductor memory |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57177560A JPS57177560A (en) | 1982-11-01 |
JPS6318868B2 true JPS6318868B2 (US08063081-20111122-C00115.png) | 1988-04-20 |
Family
ID=13191484
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6214081A Granted JPS57177560A (en) | 1981-04-24 | 1981-04-24 | Semiconductor memory |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57177560A (US08063081-20111122-C00115.png) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100387267B1 (ko) * | 1999-12-22 | 2003-06-11 | 주식회사 하이닉스반도체 | 멀티 레벨 플래쉬 이이피롬 셀 및 그 제조 방법 |
JP4892199B2 (ja) * | 2005-06-06 | 2012-03-07 | ルネサスエレクトロニクス株式会社 | 不揮発性半導体記憶装置の製造方法 |
-
1981
- 1981-04-24 JP JP6214081A patent/JPS57177560A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS57177560A (en) | 1982-11-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4115914A (en) | Electrically erasable non-volatile semiconductor memory | |
US4405995A (en) | Semiconductor memory drive | |
JP2848223B2 (ja) | 不揮発性半導体記憶装置の消去方法及び製造方法 | |
KR930000158B1 (ko) | 자외선소거형 불휘발성 반도체기억장치 | |
JPH0581072B2 (US08063081-20111122-C00115.png) | ||
KR100192546B1 (ko) | 플래쉬 메모리 및 이의 제조방법 | |
US4257056A (en) | Electrically erasable read only memory | |
US5643812A (en) | Method of making EEPROM flash memory cell with erase gate | |
US5716865A (en) | Method of making split gate flash EEPROM cell by separating the tunneling region from the channel | |
JP2002118184A (ja) | 不揮発性半導体記憶装置の動作方法 | |
US4467452A (en) | Nonvolatile semiconductor memory device and method of fabricating the same | |
JPH05251669A (ja) | 半導体記憶装置およびその書き換え方法 | |
KR930001888B1 (ko) | 불휘발성 반도체 기억장치 | |
JPH06104451A (ja) | 不揮発性半導体記憶装置 | |
JPS6318868B2 (US08063081-20111122-C00115.png) | ||
JP3272007B2 (ja) | 電荷トラップ膜の製造方法 | |
CA1247740A (en) | Floating gate device using a composite dielectric | |
JPH0450754B2 (US08063081-20111122-C00115.png) | ||
JPH02295169A (ja) | 不揮発性半導体記憶装置 | |
JPH09213820A (ja) | 不揮発性半導体記憶装置の製造方法 | |
KR950006232B1 (ko) | 플래쉬 이이피롬 및 그 제조방법 | |
JP3185746B2 (ja) | 不揮発性半導体記憶装置 | |
EP0069233A2 (en) | Memory array and methods of making same | |
JP3589675B2 (ja) | 半導体記憶装置 | |
JPH0730001A (ja) | 半導体装置 |