JPS63175848U - - Google Patents

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Publication number
JPS63175848U
JPS63175848U JP6756187U JP6756187U JPS63175848U JP S63175848 U JPS63175848 U JP S63175848U JP 6756187 U JP6756187 U JP 6756187U JP 6756187 U JP6756187 U JP 6756187U JP S63175848 U JPS63175848 U JP S63175848U
Authority
JP
Japan
Prior art keywords
gas
concentration
calibration curve
infrared light
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6756187U
Other languages
English (en)
Japanese (ja)
Other versions
JPH055483Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987067561U priority Critical patent/JPH055483Y2/ja
Publication of JPS63175848U publication Critical patent/JPS63175848U/ja
Application granted granted Critical
Publication of JPH055483Y2 publication Critical patent/JPH055483Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1987067561U 1987-05-06 1987-05-06 Expired - Lifetime JPH055483Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987067561U JPH055483Y2 (enrdf_load_stackoverflow) 1987-05-06 1987-05-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987067561U JPH055483Y2 (enrdf_load_stackoverflow) 1987-05-06 1987-05-06

Publications (2)

Publication Number Publication Date
JPS63175848U true JPS63175848U (enrdf_load_stackoverflow) 1988-11-15
JPH055483Y2 JPH055483Y2 (enrdf_load_stackoverflow) 1993-02-12

Family

ID=30906580

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987067561U Expired - Lifetime JPH055483Y2 (enrdf_load_stackoverflow) 1987-05-06 1987-05-06

Country Status (1)

Country Link
JP (1) JPH055483Y2 (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01229941A (ja) * 1988-03-10 1989-09-13 Toray Eng Co Ltd 赤外線式炭酸ガス分析計
JPH08327535A (ja) * 1995-06-02 1996-12-13 Meidensha Corp 光学式濃度測定装置
JP2009042192A (ja) * 2007-08-11 2009-02-26 Okayama Univ ガス濃度検出装置
JP2017194458A (ja) * 2016-04-18 2017-10-26 株式会社堀場製作所 分光分析装置及び分光分析方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS548577A (en) * 1977-06-21 1979-01-22 Sereg Soc Gas analyzer of selective radiation absorption type
JPS59187742U (ja) * 1983-06-01 1984-12-13 横河電機株式会社 ガス分析計用サンプリング装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS548577A (en) * 1977-06-21 1979-01-22 Sereg Soc Gas analyzer of selective radiation absorption type
JPS59187742U (ja) * 1983-06-01 1984-12-13 横河電機株式会社 ガス分析計用サンプリング装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01229941A (ja) * 1988-03-10 1989-09-13 Toray Eng Co Ltd 赤外線式炭酸ガス分析計
JPH08327535A (ja) * 1995-06-02 1996-12-13 Meidensha Corp 光学式濃度測定装置
JP2009042192A (ja) * 2007-08-11 2009-02-26 Okayama Univ ガス濃度検出装置
JP2017194458A (ja) * 2016-04-18 2017-10-26 株式会社堀場製作所 分光分析装置及び分光分析方法

Also Published As

Publication number Publication date
JPH055483Y2 (enrdf_load_stackoverflow) 1993-02-12

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