JPS63175848U - - Google Patents
Info
- Publication number
- JPS63175848U JPS63175848U JP6756187U JP6756187U JPS63175848U JP S63175848 U JPS63175848 U JP S63175848U JP 6756187 U JP6756187 U JP 6756187U JP 6756187 U JP6756187 U JP 6756187U JP S63175848 U JPS63175848 U JP S63175848U
- Authority
- JP
- Japan
- Prior art keywords
- gas
- concentration
- calibration curve
- infrared light
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000011088 calibration curve Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図は本考案の基本的構成例示図、第２図は
本考案に係るガス分析計の一実施例を示す縦断面
図、第３図は遮光板の一例を示す平面図、第４図
はその演算器のブロツク図、第５図は本実施例に
より得られたキヤリブレーシヨン曲線の一例を示
すグラフ、第６図は演算器が行う処理のフローチ
ヤート、第７図はサンプルガス圧力と補正係数ま
たは出力変化率との関係を示すグラフを表す。
１，２…光源、３…サンプルセル、４…比較セ
ル、７…遮光板、１２…検出器、１３…プリアン
プ、１５…圧力センサ、１７…演算器。
Fig. 1 is a diagram illustrating the basic configuration of the present invention, Fig. 2 is a vertical sectional view showing an embodiment of a gas analyzer according to the invention, Fig. 3 is a plan view showing an example of a light shielding plate, and Fig. 4 is a block diagram of the computing unit, Figure 5 is a graph showing an example of the calibration curve obtained by this example, Figure 6 is a flowchart of the processing performed by the computing unit, and Figure 7 is a graph showing sample gas pressure and A graph showing a relationship between a correction coefficient or an output change rate is shown. DESCRIPTION OF SYMBOLS 1, 2... Light source, 3... Sample cell, 4... Comparison cell, 7... Light shielding plate, 12... Detector, 13... Preamplifier, 15... Pressure sensor, 17... Arithmetic unit.
Claims (1)
サンプルガスに通過吸収させ、他方を濃度零また
は一定濃度の比較ガスに通過吸収させ、これら２
つの赤外線光路のエネルギー差を検出器により検
出してガスの濃度分析を行うとともに、キヤリブ
レーシヨン曲線作成時または較正時に赤外線減光
部材を較正用ガスの替わりに赤外線の光路に配置
するよう構成されたガス分析計であつて、 上記サンプルガスの圧力を検出する圧力センサ
と、 サンプルガス濃度測定時に、該検出器の検出結
果とキヤリブレーシヨン曲線とを、圧力センサの
補償下に比較し検量するガス測定手段と、 を有することを特徴とするガス分析計。[Claims for Utility Model Registration] When measuring concentration, one of the infrared rays generated from the light source is passed through and absorbed by the sample gas, and the other is passed through and absorbed by a comparison gas of zero concentration or a constant concentration;
The gas concentration analysis is performed by detecting the energy difference between the two infrared light paths using a detector, and an infrared light attenuation member is placed in the infrared light path in place of the calibration gas when creating a calibration curve or calibrating. a pressure sensor that detects the pressure of the sample gas; and a calibration curve that compares the detection results of the detector with a calibration curve under compensation of the pressure sensor when measuring the sample gas concentration. A gas analyzer comprising: a gas measuring means;
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987067561U JPH055483Y2 (en) | 1987-05-06 | 1987-05-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987067561U JPH055483Y2 (en) | 1987-05-06 | 1987-05-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63175848U true JPS63175848U (en) | 1988-11-15 |
| JPH055483Y2 JPH055483Y2 (en) | 1993-02-12 |
Family
ID=30906580
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987067561U Expired - Lifetime JPH055483Y2 (en) | 1987-05-06 | 1987-05-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH055483Y2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01229941A (en) * | 1988-03-10 | 1989-09-13 | Toray Eng Co Ltd | Infrared type carbon dioxide analyzer |
| JPH08327535A (en) * | 1995-06-02 | 1996-12-13 | Meidensha Corp | Optical concentration measurement device |
| JP2009042192A (en) * | 2007-08-11 | 2009-02-26 | Okayama Univ | Gas concentration detection device |
| JP2017194458A (en) * | 2016-04-18 | 2017-10-26 | 株式会社堀場製作所 | Spectral analysis device and spectral analysis method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS548577A (en) * | 1977-06-21 | 1979-01-22 | Sereg Soc | Gas analyzer of selective radiation absorption type |
| JPS59187742U (en) * | 1983-06-01 | 1984-12-13 | 横河電機株式会社 | Sampling device for gas analyzer |
-
1987
- 1987-05-06 JP JP1987067561U patent/JPH055483Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS548577A (en) * | 1977-06-21 | 1979-01-22 | Sereg Soc | Gas analyzer of selective radiation absorption type |
| JPS59187742U (en) * | 1983-06-01 | 1984-12-13 | 横河電機株式会社 | Sampling device for gas analyzer |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01229941A (en) * | 1988-03-10 | 1989-09-13 | Toray Eng Co Ltd | Infrared type carbon dioxide analyzer |
| JPH08327535A (en) * | 1995-06-02 | 1996-12-13 | Meidensha Corp | Optical concentration measurement device |
| JP2009042192A (en) * | 2007-08-11 | 2009-02-26 | Okayama Univ | Gas concentration detection device |
| JP2017194458A (en) * | 2016-04-18 | 2017-10-26 | 株式会社堀場製作所 | Spectral analysis device and spectral analysis method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH055483Y2 (en) | 1993-02-12 |
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