JPH01152255U - - Google Patents
Info
- Publication number
- JPH01152255U JPH01152255U JP5020588U JP5020588U JPH01152255U JP H01152255 U JPH01152255 U JP H01152255U JP 5020588 U JP5020588 U JP 5020588U JP 5020588 U JP5020588 U JP 5020588U JP H01152255 U JPH01152255 U JP H01152255U
- Authority
- JP
- Japan
- Prior art keywords
- signal
- normal part
- infrared
- test material
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 8
- 238000010438 heat treatment Methods 0.000 claims description 7
- 230000007547 defect Effects 0.000 claims description 4
- 230000005855 radiation Effects 0.000 claims description 4
- 230000035945 sensitivity Effects 0.000 claims description 4
- 230000003321 amplification Effects 0.000 claims 3
- 238000003199 nucleic acid amplification method Methods 0.000 claims 3
- 230000002950 deficient Effects 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
第１図はこの考案の表面欠陥探傷装置のブロツ
ク図、第２図は正常部検出回路の赤外線放射感度
の信号濃度と正常部信号の関係を示す図、第３図
は従来の表面欠陥探傷装置のブロツク図を示す。
図において、１は被検材、２は被検材１の搬送
方向、３は加熱装置、４は加熱制御装置、５は加
熱制御装置の基準入力、６は赤外線検出器、７は
信号処理回路、８は信号処理回路７の基準入力、
９は正常部検出回路、１０は被検材１の赤外線放
射感度の信号濃度、１１は被検材１の正常部信号
、１２は演算器、１３は前記演算器１２の基準赤
外線信号、１４は増巾器をそれぞれ示す。尚 図
中同一あるいは相当部分には同一符号を付して示
している。
Figure 1 is a block diagram of the surface defect detection device of this invention, Figure 2 is a diagram showing the relationship between the signal concentration of the infrared radiation sensitivity of the normal area detection circuit and the normal area signal, and Figure 3 is the conventional surface defect detection apparatus. The block diagram is shown below. In the figure, 1 is the material to be tested, 2 is the transport direction of the material to be tested 1, 3 is the heating device, 4 is the heating control device, 5 is the reference input of the heating control device, 6 is the infrared detector, and 7 is the signal processing circuit. , 8 is the reference input of the signal processing circuit 7,
9 is a normal part detection circuit, 10 is a signal concentration of the infrared radiation sensitivity of the test material 1, 11 is a normal part signal of the test material 1, 12 is an arithmetic unit, 13 is a reference infrared signal of the arithmetic unit 12, and 14 is a Each amplifier is shown. In the drawings, the same or equivalent parts are designated by the same reference numerals.
Claims (1)
傷する表面欠陥探傷装置において、被検材を加熱
する加熱装置と、前記加熱装置の加熱パワーを制
御する加熱制御装置と、被検材の欠陥部の赤外線
放射感度を検出する赤外線検出器と、前記赤外線
検出器の赤外線放射感度により、正常部を検出す
る正常部検出回路と、前記正常部検出回路の正常
部信号と基準赤外線信号との比を演算する演算器
と、前記赤外線検出器の出力を増巾し、かつ前記
演算器の出力により増巾率を可変設定出来る増巾
器と、前記増巾器の出力信号を信号処理する信号
処理回路とを具備したことを特徴とする表面欠陥
探傷装置。 A surface defect detection device that continuously detects flaws on the surface of a test material such as a pipe, a bar, or a plate includes a heating device that heats the test material, a heating control device that controls the heating power of the heating device, and a test material. an infrared detector that detects the infrared radiation sensitivity of a defective part; a normal part detection circuit that detects a normal part by the infrared radiation sensitivity of the infrared detector; and a normal part signal of the normal part detection circuit and a reference infrared signal. an arithmetic unit that amplifies the output of the infrared detector and whose amplification rate can be variably set based on the output of the amplification unit; and a signal processor that processes the output signal of the amplification unit. A surface defect detection device characterized by comprising a signal processing circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5020588U JPH01152255U (en) | 1988-04-14 | 1988-04-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5020588U JPH01152255U (en) | 1988-04-14 | 1988-04-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01152255U true JPH01152255U (en) | 1989-10-20 |
Family
ID=31276270
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5020588U Pending JPH01152255U (en) | 1988-04-14 | 1988-04-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01152255U (en) |
-
1988
- 1988-04-14 JP JP5020588U patent/JPH01152255U/ja active Pending