JPS62156863U

JPS62156863U -

Info

Publication number: JPS62156863U
Application number: JP4501086U
Authority: JP
Priority date: 1986-03-27
Filing date: 1986-03-27
Publication date: 1987-10-05

Description

[Brief explanation of the drawing]

第１図は本考案の表面欠陥探傷装置のブロツク
図、第２図は欠陥判定レベル補出正回路の原理を
示す図、第３図は従来の表面欠陥探傷装置のブロ
ツク図を示す。図において、１は被検材、２は被検材１の搬送
方向、３は加熱装置、４は加熱制御装置、５は第
１の赤外線検出器、６は信号処理回路、７は基準
判定レベル、８は第２の赤外線検出器、９は欠陥
判定レベル補正回路、１０は被検材１の正常部赤
外線放射感度変動量、１１は欠陥判定レベル補正
量をそれぞれ示す。尚、図中同一あるいは相当部
分には同一符号を付して示してある。 FIG. 1 is a block diagram of a surface defect detection apparatus according to the present invention, FIG. 2 is a diagram showing the principle of a defect determination level correction circuit, and FIG. 3 is a block diagram of a conventional surface defect detection apparatus. In the figure, 1 is the material to be tested, 2 is the transport direction of the material to be tested 1, 3 is the heating device, 4 is the heating control device, 5 is the first infrared detector, 6 is the signal processing circuit, and 7 is the standard judgment level. , 8 is a second infrared detector, 9 is a defect determination level correction circuit, 10 is a normal part infrared radiation sensitivity fluctuation amount of the specimen 1, and 11 is a defect determination level correction amount. It should be noted that the same or corresponding parts in the drawings are designated by the same reference numerals.

Claims

[Scope of utility model registration request]

A surface defect detection device that continuously detects defects on the surface of a pipe or plate material, etc. includes a heating device that heats the pipe or plate material, a heating control device that controls the heating power of the heating device, and a defective part of the pipe or plate material, etc. a first infrared detector that detects the infrared radiation sensitivity of a normal part such as a pipe or a plate;
a defect determination level correction circuit that outputs a defect determination level correction amount based on the output signal of the first infrared detector; and a reference determination level is corrected and controlled by the output of the defect determination level correction circuit, and the output of the first infrared detector. A surface defect detection device characterized by comprising a signal processing circuit that performs defect determination based on signals.