JPH0397656U - - Google Patents
Info
- Publication number
- JPH0397656U JPH0397656U JP581990U JP581990U JPH0397656U JP H0397656 U JPH0397656 U JP H0397656U JP 581990 U JP581990 U JP 581990U JP 581990 U JP581990 U JP 581990U JP H0397656 U JPH0397656 U JP H0397656U
- Authority
- JP
- Japan
- Prior art keywords
- infrared sensor
- inspected
- infrared
- flaw detection
- detection result
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 6
- 238000001816 cooling Methods 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
第１図はこの考案の赤外線疵検出装置の一実施
例の図、第２図は従来の赤外線疵検出装置を示す
図である。
図において、１は被検査材、２は高周波電源部
、３はコイル、４は冷却部、５は赤外線センサ、
６は信号解析部、７は測長部、８は疵検出結果出
力部である。なお、各図中同一符号は同一又は相
当部分を示す。
FIG. 1 is a diagram showing an embodiment of the infrared flaw detection device of this invention, and FIG. 2 is a diagram showing a conventional infrared flaw detection device. In the figure, 1 is the material to be inspected, 2 is the high-frequency power supply section, 3 is the coil, 4 is the cooling section, 5 is the infrared sensor,
6 is a signal analysis section, 7 is a length measuring section, and 8 is a flaw detection result output section. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
部と、この急速冷却直後の被検査材表面から放射
される赤外線を電気信号に変換する赤外線センサ
と、この赤外線センサが出力する信号を解析して
疵検出を行う信号解析部と、被検査材の搬送速度
を検知して検査位置を測る測長部と、この測長部
及び上記信号解析部の測長部及び解析結果を入力
して疵検出結果を出力する疵検出結果出力部を備
えたことを特徴とする赤外線疵検出装置。 There is a cooling unit that rapidly cools the inspected material being transported, an infrared sensor that converts the infrared rays emitted from the surface of the inspected material immediately after this rapid cooling into electrical signals, and an infrared sensor that analyzes the signals output by the infrared sensor. a signal analysis section that detects flaws; a length measurement section that detects the conveyance speed of the material to be inspected and measures the inspection position; An infrared flaw detection device comprising a flaw detection result output unit that outputs a detection result.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP581990U JPH0397656U (en) | 1990-01-25 | 1990-01-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP581990U JPH0397656U (en) | 1990-01-25 | 1990-01-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0397656U true JPH0397656U (en) | 1991-10-08 |
Family
ID=31509509
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP581990U Pending JPH0397656U (en) | 1990-01-25 | 1990-01-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0397656U (en) |
-
1990
- 1990-01-25 JP JP581990U patent/JPH0397656U/ja active Pending
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