JPS63163151A - デイスク検査装置のレ−ザパワ−測定装置 - Google Patents
デイスク検査装置のレ−ザパワ−測定装置Info
- Publication number
- JPS63163151A JPS63163151A JP31409486A JP31409486A JPS63163151A JP S63163151 A JPS63163151 A JP S63163151A JP 31409486 A JP31409486 A JP 31409486A JP 31409486 A JP31409486 A JP 31409486A JP S63163151 A JPS63163151 A JP S63163151A
- Authority
- JP
- Japan
- Prior art keywords
- pickup
- disk
- laser power
- disc
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 29
- 238000005259 measurement Methods 0.000 abstract description 17
- 230000003287 optical effect Effects 0.000 abstract description 10
- 238000004364 calculation method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000007723 transport mechanism Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9506—Optical discs
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Manufacturing Optical Record Carriers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31409486A JPS63163151A (ja) | 1986-12-25 | 1986-12-25 | デイスク検査装置のレ−ザパワ−測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31409486A JPS63163151A (ja) | 1986-12-25 | 1986-12-25 | デイスク検査装置のレ−ザパワ−測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63163151A true JPS63163151A (ja) | 1988-07-06 |
| JPH0557654B2 JPH0557654B2 (enrdf_load_stackoverflow) | 1993-08-24 |
Family
ID=18049167
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP31409486A Granted JPS63163151A (ja) | 1986-12-25 | 1986-12-25 | デイスク検査装置のレ−ザパワ−測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63163151A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006097879A3 (en) * | 2005-03-16 | 2008-03-27 | Koninkl Philips Electronics Nv | Reflection measurements on optical disks |
-
1986
- 1986-12-25 JP JP31409486A patent/JPS63163151A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006097879A3 (en) * | 2005-03-16 | 2008-03-27 | Koninkl Philips Electronics Nv | Reflection measurements on optical disks |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0557654B2 (enrdf_load_stackoverflow) | 1993-08-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |