JPS63159757U - - Google Patents
Info
- Publication number
- JPS63159757U JPS63159757U JP5273387U JP5273387U JPS63159757U JP S63159757 U JPS63159757 U JP S63159757U JP 5273387 U JP5273387 U JP 5273387U JP 5273387 U JP5273387 U JP 5273387U JP S63159757 U JPS63159757 U JP S63159757U
- Authority
- JP
- Japan
- Prior art keywords
- light
- inspected
- lens
- conversion member
- photoelectric conversion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 claims 5
- 230000007547 defect Effects 0.000 claims 5
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000012806 monitoring device Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
第１図は本考案の検査装置の一実施例を示す正
面図、第２図は第１図の監視装置で用いる受光器
の一実施例を示す断面図、第３図は第２図の３−
３線に沿つて得た断面図、第４図は信号処理回路
の一実施例を示すブロツク線図、第５図は電気信
号の波形を示す図である。
１０：検査装置、１２：被検査体、１４：支持
機構、２４：被検査体の駆動機構、３０：投光器
、３８：受光器、４２：レンズ、４６：マスク、
４８：受光素子、６０：処理回路。
FIG. 1 is a front view showing an embodiment of the inspection device of the present invention, FIG. 2 is a sectional view showing an embodiment of the light receiver used in the monitoring device of FIG. 1, and FIG. −
4 is a block diagram showing one embodiment of the signal processing circuit, and FIG. 5 is a diagram showing the waveform of an electric signal. 10: inspection device, 12: object to be inspected, 14: support mechanism, 24: drive mechanism for the object to be inspected, 30: light projector, 38: light receiver, 42: lens, 46: mask,
48: Light receiving element, 60: Processing circuit.
Claims (1)
つつ該被検査体の表面の瑕疵の有無を検査する装
置であつて、前記被検査体の長手方向の所定の長
さ範囲の部位の表面全体に光を照射する投光手段
と、前記被検査体の前記部位からの乱反射光を受
光し、受光量に対応した電気信号を出力する受光
手段と、該受光手段の出力信号を処理して前記瑕
疵の有無を特定する電気信号を発生する処理手段
とを含み、前記投光手段は複数の投光器を備え、
前記受光手段は複数の受光器を備える、長尺部材
の瑕疵検査装置。 (2) 前記投光器は、前記被検査体の移動方向を
含む面内を指向される光線を発生するように配置
されている、実用新案登録請求の範囲第(1)項に
記載の長尺部材の瑕疵検査装置。 (3) 前記受光器は、前記被検査体の前記部位か
らの光を通過させるレンズと、該レンズを通過し
た光を受け、受光量に応じた電気信号を発生する
光電変換部材と、該光電変換部材の前記レンズの
側に配置され、前記光電変換部材の視野を制限す
べく前記レンズを通過した光の一部が前記光電部
材に到達することを許すスリツトを有するマスク
とを備え、前記マスクは前記スリツトが前記光電
変換部材に投影された前記被検査体の像を横切る
方向へ伸びるように配置されている、実用新案登
録請求の範囲第(1)項に記載の長尺部材の瑕疵検
査装置。[Claims for Utility Model Registration] (1) An apparatus for inspecting the presence or absence of defects on the surface of a long object to be inspected while moving the object in the longitudinal direction, the apparatus comprising: light projecting means for irradiating light onto the entire surface of a region within a predetermined length range; light receiving means for receiving diffusely reflected light from the region of the object to be inspected and outputting an electrical signal corresponding to the amount of received light; processing means for processing the output signal of the light receiving means to generate an electric signal for identifying the presence or absence of the defect, the light projecting means comprising a plurality of light projectors,
A defect inspection device for a long member, wherein the light receiving means includes a plurality of light receivers. (2) The elongated member according to claim (1) of the utility model registration, wherein the projector is arranged so as to generate a light beam directed in a plane including the moving direction of the object to be inspected. Defect inspection equipment. (3) The light receiver includes a lens that allows light from the part of the object to be inspected to pass through, a photoelectric conversion member that receives the light that has passed through the lens and generates an electrical signal according to the amount of received light, and the photoelectric conversion member that receives the light that has passed through the lens and generates an electrical signal according to the amount of light received a mask disposed on a side of the lens of the conversion member, the mask having a slit that allows part of the light that has passed through the lens to reach the photoelectric member in order to limit the field of view of the photoelectric conversion member; Defect inspection of a long member according to claim (1) of the registered utility model, wherein the slit is arranged so as to extend in a direction transverse to the image of the object to be inspected projected on the photoelectric conversion member. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5273387U JPS63159757U (en) | 1987-04-09 | 1987-04-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5273387U JPS63159757U (en) | 1987-04-09 | 1987-04-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63159757U true JPS63159757U (en) | 1988-10-19 |
Family
ID=30878162
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5273387U Pending JPS63159757U (en) | 1987-04-09 | 1987-04-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63159757U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05296942A (en) * | 1992-04-15 | 1993-11-12 | Sumitomo Electric Ind Ltd | Device for detecting bubble within linear body resin covering |
-
1987
- 1987-04-09 JP JP5273387U patent/JPS63159757U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05296942A (en) * | 1992-04-15 | 1993-11-12 | Sumitomo Electric Ind Ltd | Device for detecting bubble within linear body resin covering |
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