JPS63148494A - Pseudo static memory - Google Patents

Pseudo static memory

Info

Publication number
JPS63148494A
JPS63148494A JP61295838A JP29583886A JPS63148494A JP S63148494 A JPS63148494 A JP S63148494A JP 61295838 A JP61295838 A JP 61295838A JP 29583886 A JP29583886 A JP 29583886A JP S63148494 A JPS63148494 A JP S63148494A
Authority
JP
Japan
Prior art keywords
period
external address
address input
refresh
combination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61295838A
Other languages
Japanese (ja)
Inventor
Eiji Kitazawa
北沢 英二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP61295838A priority Critical patent/JPS63148494A/en
Publication of JPS63148494A publication Critical patent/JPS63148494A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To easily vary a refresh period by using an external address input signal which comes to an idle state during an antomatic refresh period, and selecting the combination of a capacity for adjusting a timer period. CONSTITUTION:Capacities CST1 and CST2 are connected in parallel with a capacity CST for adjusting the period of a timer circuit through transfer gate transistors Q1 and Q2. Buffer outputs 3 and 4 of the external address input terminal 1 and 2 are inputted to the gates of the transistors Q1 and Q2. If the level of the external address input terminal 1 becomes high, the transistor Q1 is turned ON, the capacity CST1 is connected with the capacity CST in parallel, and the refresh period is prolonged. The refresh period similarly changes even if the level of the external address input terminal 2 becomes high. With the combination of the high level and the low level of two external address input, four types of the combination of the capacities for adjustment is attained, whereby four types of refresh periods can be obtained. With selecting the optimum combination, the period of the timer circuit can be set.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、擬似スタチックメモリに関し、特に自動リフ
レッシ島のリフレッシュ周期を外部よシ変化ぜせること
のできる擬似スタチックメモリに関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a pseudo-static memory, and more particularly to a pseudo-static memory in which the refresh period of an automatic refresh island can be externally changed.

〔従来の技術〕[Conventional technology]

ダイナミック・メモリセルを用い、リフレッシ為機能を
内蔵した擬似スタチックメモリは、大容量で使い易い点
から近年市場を拡げているが、自動リフレッシ1時の消
費電流が小さいこともその大きな特長の一つである。自
動リフレジ晶時の消費電流は、す7レツシ工起動信号発
生回路を構成するタイマー回路の周期に依存し、周期が
長い程消費電流は小さい。一方、メモリセルのホールド
タイム内にリフレッシ島を完了する必要が69、タイマ
ー回路の周期の上限はこれにより決定式れる。以上よ〕
明らかなよりに、タイマー回路の周期は精度良く設定す
る必要があり、従来は例えば以下(示すような方法で行
われていた。即ち、第2因に示す従来の擬似スタティッ
クメモリにおける自動リフレッシ島起動信号発生回路に
於いて、す7レツシ島終了信号5により制御でれるMO
8トランジスタQ21.ゲートを接地したMOSトラン
ジスタQ22、ダイオード接硯石れたM(JS)ランジ
スタQ23、発振器の出力6′とMOS)ランジスタQ
23 を結合する容量CT1 およびタイマー周期調整
用の容量C8?で成るタイマー回路と、タイマー回路の
出力を受けて反転増幅するインバータとで構成でれ、イ
ンバータの出力を自動リフレッシュ起動信号として取シ
出している。
Pseudo-static memory that uses dynamic memory cells and has a built-in refresh function has expanded its market in recent years due to its large capacity and ease of use, but one of its major features is its low current consumption during automatic refresh. It is one. The current consumption during automatic refrigeration depends on the period of the timer circuit constituting the S7 resetting start signal generation circuit, and the longer the period, the smaller the current consumption. On the other hand, it is necessary to complete the refresh island within the hold time of the memory cell 69, and this determines the upper limit of the period of the timer circuit. That’s it!]
As is obvious, the period of the timer circuit needs to be set with high precision, and conventionally this has been done, for example, by the method shown below. Namely, automatic refresh island activation in the conventional pseudo-static memory shown in the second factor. In the signal generation circuit, the MO which can be controlled by the end signal 5
8 transistor Q21. MOS transistor Q22 with its gate grounded, M (JS) transistor Q23 with a grounded diode, oscillator output 6' and MOS) transistor Q
23 Capacitor CT1 for coupling and Capacitor C8 for timer cycle adjustment? It consists of a timer circuit consisting of a timer circuit, and an inverter that inverts and amplifies the output of the timer circuit, and outputs the output of the inverter as an automatic refresh activation signal.

以上の構成に於いて、自動リフレッシエ終了時の容量C
のプリチャージ電位を電源■ccレベT ルとした時のタイマー回路の周期T。、が次式で表わさ
れることは良く知られている。
In the above configuration, the capacity C at the end of automatic refresher
The period T of the timer circuit when the precharge potential of the power supply is set to the level T of the power supply ■cc. It is well known that , is expressed by the following equation.

VT:MOS)ランジスタのスレッシ冒ルド電圧従って
(11式に基づき最適のタイマー回路の周期を設計すれ
ば艮いわけである。
VT: MOS) transistor threshold voltage Therefore, it is possible to design the optimum period of the timer circuit based on Equation 11.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら、実際には製造上のバラツキのため設計値
通りのりスレッシ1周期を得ることは困難であシ、その
ため容量C1に着目し、所望のりフレッシ島周期が得ら
れるまで実際に製造しては容量Cs?を作シ直すことを
繰夛返すという方法か、初めから容量CSTの値を変え
た数種類の拡散製造用のマスクを用意する方法がとられ
ていた。
However, in reality, it is difficult to obtain one cycle of glue threshing as designed due to variations in manufacturing.Therefore, we focused on the capacitance C1, and carried out actual manufacturing until the desired glue fresh island cycle was obtained. Cs? The method used was to repeatedly recreate the mask, or to prepare several types of masks for diffusion manufacturing with different values of capacitance CST from the beginning.

あるいは、近年では数種類の大きさのCSTを並列にヒ
為−ズにて接続しておき、高11[のレーザ・トIJ 
Y−で最適のC8Tを測定しながら求めるという欠点が
あった。
Alternatively, in recent years, CSTs of several sizes are connected in parallel with
There was a drawback that the optimum C8T was determined while measuring Y-.

従って本発明の目的はタイマー回路の周期を容量にてト
リミングする際、経済的、短工期にてこれを行うことの
できる擬似スタテックメモリを提供することにある。
Therefore, an object of the present invention is to provide a pseudo-static memory that can trim the period of a timer circuit by capacitance, which can be done economically and in a short construction period.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の擬似スタチックメモリは、リフレッシ島終了信
号により充電され発振器の出力信号により放電するタイ
マー周期調整用の容量を複数含む自動リフレッシェ起動
信号発生回路と、アドレス入力の組合せに応じて制御さ
れ前記調整用容量の一部又は全部を選択するスイッチ回
路を備える。
The pseudo-static memory of the present invention is controlled in accordance with a combination of an automatic refresh start signal generation circuit including a plurality of capacitors for adjusting the timer cycle, which are charged by a refresh island end signal and discharged by an output signal of an oscillator, and an address input. A switch circuit is provided to select part or all of the adjustment capacitance.

〔実施例〕〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例を示す回路図である。FIG. 1 is a circuit diagram showing one embodiment of the present invention.

従来例に対しタイマー回路の周期調整用の容jL−c、
?に並列にトランスファーゲート・トランジスタQ凰。
Capacity jL-c for period adjustment of the timer circuit compared to the conventional example,
? Transfer gate transistor Qo in parallel with.

Q3を介した容量CCが接続されてお久S’l’l  
  WkT2 トランジスタQx、Qsのゲートには、外部アドレス入
力端子1.2のパブ7丁出力3,4が入力された構成と
なっている。この構成に於いては、本来自動リフレッシ
ュ時にはアイドル状態にある外部アドレス入力端子を利
用してCs、rの容量を可変させ、リフレッシ島周期を
変えられることは明らかである。即ち、外部アドレス入
力端子1がハイレベルになるとトランジスタQ1がON
し容量C3T□が容量C3アと並列につながる。 した
がって式(1)よシ明らかなように、リフレッシ島周期
は長くなる。外部アドレス入力端子2が/1イレベルに
なった時も同様にリフレッシ島周期は変化する。以上の
ように2つの外部アドレス入力のハイレベル、ロウレベ
ルの組合せによりここでは4通シのi11整用容量の組
合せが可能となシ、リフレツZ&周期が4通シ得られる
ことになる。このうち最適の組合せを選択することによ
りタイマー回路の周期を設定することができる。
It is long since the capacitor CC via Q3 is connected.
The gates of the WkT2 transistors Qx and Qs are configured such that the outputs 3 and 4 of the external address input terminal 1.2 are input. In this configuration, it is clear that the refresh island period can be changed by varying the capacitances of Cs and r by using the external address input terminals which are normally in an idle state during automatic refresh. That is, when external address input terminal 1 becomes high level, transistor Q1 turns on.
The capacitor C3T□ is connected in parallel with the capacitor C3a. Therefore, as is clear from equation (1), the refresh island period becomes longer. The refresh island period changes similarly when the external address input terminal 2 reaches the /1 level. As described above, by combining the high level and low level of the two external address inputs, four combinations of i11 adjustment capacitances are possible, and four reflex Z& cycles are obtained. The cycle of the timer circuit can be set by selecting the optimal combination among these.

更に多くの外部アドレス端子を使うことにより実現でき
るリフレッシ島周期の数は外部アドレス端子数nの2の
1乗組(26)得られることになシ、更に細い設定が可
能となることは明白である。したがって所望とするりス
レッシ1周期を決定する容量CsTが外部アドレスの組
合せにより短い製造期間で経済的に設定することができ
る。
The number of refresh island cycles that can be realized by using more external address terminals is the set of 2 to the 1 power of the number of external address terminals n (26), and it is clear that even narrower settings are possible. . Therefore, the capacitance CsT that determines one cycle of the desired threshold can be set economically in a short manufacturing period by combining external addresses.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、自動リフレッシ、期間中
7アイドル状態となる外部アドレス入力信号を使用しタ
イマー周期調整用容量の組合せを選択することにより、
簡単にリフレッシ島周期を可変できる効果がある。
As explained above, the present invention uses an external address input signal that is in an idle state during the automatic refresh period and selects a combination of capacitors for adjusting the timer cycle.
This has the effect of easily varying the refresh island cycle.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す回路図、第2図は従来
例の回路図である。 1.2・・・・・・外部アドレス大刀端子、3.4・・
・・・・アドレス・バッファー出力信号、5・山・・リ
フレッシェ終了信号、6・・・・・・発振器出方信号。 第1 図
FIG. 1 is a circuit diagram showing one embodiment of the present invention, and FIG. 2 is a circuit diagram of a conventional example. 1.2... External address long sword terminal, 3.4...
... Address buffer output signal, 5. Mountain... Refresh end signal, 6... Oscillator output signal. Figure 1

Claims (1)

【特許請求の範囲】[Claims] リフレッシュ終了信号により充電され発振器の出力信号
により放電するタイマー周期調整用の容量を複数含む自
動リフレッシュ起動信号発生回路と、アドレス入力の組
合せに応じて制御され前記調整用容量の一部又は全部を
選択するスイッチ回路を備えた擬似スタチックメモリ。
an automatic refresh start signal generation circuit including a plurality of capacitors for timer period adjustment that are charged by a refresh end signal and discharged by an output signal of an oscillator; and a part or all of the adjustment capacitors are selected by being controlled according to a combination of an address input. Pseudo-static memory with a switching circuit.
JP61295838A 1986-12-11 1986-12-11 Pseudo static memory Pending JPS63148494A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61295838A JPS63148494A (en) 1986-12-11 1986-12-11 Pseudo static memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61295838A JPS63148494A (en) 1986-12-11 1986-12-11 Pseudo static memory

Publications (1)

Publication Number Publication Date
JPS63148494A true JPS63148494A (en) 1988-06-21

Family

ID=17825838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61295838A Pending JPS63148494A (en) 1986-12-11 1986-12-11 Pseudo static memory

Country Status (1)

Country Link
JP (1) JPS63148494A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08129885A (en) * 1994-10-28 1996-05-21 Nec Corp Semiconductor memory

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08129885A (en) * 1994-10-28 1996-05-21 Nec Corp Semiconductor memory

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