JPS63140904A - Scattered light measuring instrument - Google Patents

Scattered light measuring instrument

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Publication number
JPS63140904A
JPS63140904A JP28928886A JP28928886A JPS63140904A JP S63140904 A JPS63140904 A JP S63140904A JP 28928886 A JP28928886 A JP 28928886A JP 28928886 A JP28928886 A JP 28928886A JP S63140904 A JPS63140904 A JP S63140904A
Authority
JP
Japan
Prior art keywords
scattered light
light
measured
scattered
cylindrical body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28928886A
Other languages
Japanese (ja)
Inventor
Kenji Sasaki
賢司 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP28928886A priority Critical patent/JPS63140904A/en
Publication of JPS63140904A publication Critical patent/JPS63140904A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To measure scattered light having a large angle of scattering by providing an optical system which converges light from a light source and makes it incident on a body to be measured and receiving the scattered light from the body to be measured by a cylinder body. CONSTITUTION:When a light source 2 is put in operation, the light emitted by the light source 2 is guided to a lens side by a beam splitter 5, converged by a condenser lens 4, and projected on the surface 1a of the body 1 to be measured 1. Consequently, the light is reflected by the surface 1a to generate regular reflected light and scattered light A corresponding to a pattern to be measured on the surface 1a. Then the regular reflected light is cut off by a stopper 7 and the scattered light A is reflected by the reflecting surface 6a of the cylinder body 6 and guided to the surface of an area array sensor 8 together with scattered light A passing through the peripheral part of the condenser lens 4. Consequently, the scattered light A not only from the condenser lens 4, but also having a large angle of scattering is detected.

Description

【発明の詳細な説明】 [発明の目的コ (産業上の利用分野) この発明は、光を被測定物に入射させそのとき生じる散
乱光から被測定物を計測する散乱光測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Purpose of the Invention (Industrial Application Field) The present invention relates to a scattered light measuring device that makes light incident on an object to be measured and measures the object from the scattered light generated at the time.

(従来の技術) 粒径の計測、被測定物の表面パターンの測定には、被測
定物に光を入射させたときに生じる散乱光を利用して行
なうようにしたものがある。
(Prior Art) There is a method for measuring particle size and measuring the surface pattern of an object to be measured using scattered light generated when light is incident on the object to be measured.

こうした測定に用いられる散乱光測定装置には、従来、
第6図に示されるように粒子など被測定物aへ光を大割
させる光路すに、被測定物aを囲むような球Cを設け、
この球Cの内面で受けた散乱光d・・・を積分により測
るもの、第7図および第8図に示されるように被測定物
aからの散乱光d・・・をレンズeを通じ光検知器fで
受けて測るもの、さらには第9図に示されるように光路
すの側方に散乱光d・・・を受ける放物面IAaを設け
る他、放物面tllqと対向して光検知器りを設けて、
光路す上の光検知器fと合せて散乱光d・・・を測るも
のなどが用いられている。
Scattered light measurement devices used for such measurements have conventionally
As shown in FIG. 6, a sphere C surrounding the object to be measured a is provided on the optical path that roughly divides the light to the object to be measured a such as a particle.
Scattered light d received on the inner surface of sphere C is measured by integration, and as shown in Figures 7 and 8, scattered light d from object a is detected through lens e. Furthermore, as shown in Fig. 9, in addition to providing a paraboloid IAa on the side of the optical path to receive the scattered light d... Set up the utensils,
A device that measures scattered light d... in combination with a photodetector f on the optical path is used.

(発明が解決しようとする問題点) ところが、積分球を利用した測定技術は、全散乱光を検
出できるものの、散乱光の角度分布が測ることができな
い欠点をもつ。また光学系(レンズe)を用いて散乱光
d・・・を光検知器fへ導く構造は、散乱角θが小さな
ときはよいものの、大きな散乱角θを測ろうとすると、
非常に大きな開口数をもつレンズeを用いるか、レンズ
eを被測定物aに対して非常に近付けなければならず、
とても難しい。加えて、反射鏡(放物面鏡f)を使う構
造は、装置自体が大がかりになる問題をもっていて、い
ずれも有効なものではなかった。
(Problems to be Solved by the Invention) However, although the measurement technique using an integrating sphere can detect the total scattered light, it has the drawback that it cannot measure the angular distribution of the scattered light. Furthermore, the structure in which the scattered light d... is guided to the photodetector f using the optical system (lens e) is good when the scattering angle θ is small, but when trying to measure a large scattering angle θ,
Either a lens e with a very large numerical aperture must be used, or the lens e must be placed very close to the object to be measured a.
Very difficult. In addition, the structure using a reflecting mirror (parabolic mirror f) has the problem that the device itself becomes large-scale, and none of them are effective.

この発明はこのような問題点に着目してなされたもので
、その目的とするところは、大きな開口数を使わず、か
つ被測定物との距離をあまり近付けずに、散乱光の散乱
分布および大なる散乱角の散乱光を測定することができ
るコンパクトな散乱光測定H置を提供することにある。
This invention was made with attention to these problems, and its purpose is to improve the scattering distribution of scattered light and the measurement of the scattering distribution of scattered light without using a large numerical aperture and without bringing the distance to the object to be measured too close. An object of the present invention is to provide a compact scattered light measuring device capable of measuring scattered light with a large scattering angle.

[発明の構成] (問題点を解決するための手段と作用)この発明は、光
源2からの光を集束して被測定物1に入射させる光学系
3を設け、この光学系3の出射側周囲を覆うように内面
に反射面6aをもつ筒状体6を設けて被測定物1からの
散乱光を受けるようにし、かつ筒状体6からの散乱光を
光電変換部8で光電変換して、その出力を処理する。
[Structure of the Invention] (Means and Effects for Solving the Problems) The present invention includes an optical system 3 that focuses light from a light source 2 and makes it enter the object to be measured 1, and an output side of the optical system 3. A cylindrical body 6 having a reflective surface 6a on the inner surface is provided so as to cover the surroundings to receive scattered light from the object to be measured 1, and the scattered light from the cylindrical body 6 is photoelectrically converted by a photoelectric conversion section 8. and process its output.

(実施例) 以下、この発明を第1図ないし第3図に示す第1の実施
例にもとづいて説明する。第1図は散乱光測定装置の概
略構成を示し、1は平面な上面をもつ被測定物、2は該
被測定物1の上方に出射部を横に向けて配置された光源
、3は光学系である。光学系3は、被測定物1の直上に
集光レンズ4を配する他、この集光レンズ4と光源3の
出射部との間にビームスプリッタ5を設けた構成となっ
ていて、光1112からの光を集束して被測定物1の表
面1aへ照射できるようにしている。
(Embodiment) The present invention will be described below based on a first embodiment shown in FIGS. 1 to 3. FIG. 1 shows a schematic configuration of a scattered light measuring device, in which 1 is an object to be measured with a flat upper surface, 2 is a light source placed above the object to be measured 1 with its emission part facing sideways, and 3 is an optical It is a system. The optical system 3 has a configuration in which a condenser lens 4 is disposed directly above the object to be measured 1, and a beam splitter 5 is provided between the condenser lens 4 and the output part of the light source 3. The light is focused so that it can be irradiated onto the surface 1a of the object to be measured 1.

また集光レンズ4の周囲には、第3図に示されるような
略椀形をなした筒状体6が配設されている。筒状体6は
、小開口を被測定物1の表面1aに近接させて光路沿い
に配置されている他、内面には鏡面で構成される反射面
6aが設けられていて、被測定物1の表面で散乱した散
乱光Aを小開口を通して反射面6aで受けることができ
るようにしている。またビームスプリッタ5の背部には
正反射光を遮ぎるためのストッパ7が設けられ、筒状体
6の大開口から散乱光Aのみを出射させることができる
構造にしている。
Further, around the condenser lens 4, a substantially bowl-shaped cylindrical body 6 as shown in FIG. 3 is disposed. The cylindrical body 6 is arranged along the optical path with a small opening close to the surface 1a of the object to be measured 1, and is provided with a reflective surface 6a made of a mirror surface on its inner surface. Scattered light A scattered on the surface of the reflective surface 6a can be received by the reflective surface 6a through a small aperture. Further, a stopper 7 is provided at the back of the beam splitter 5 to block the specularly reflected light, so that only the scattered light A can be emitted from the large opening of the cylindrical body 6.

こうした筒状体6の出射部側(大開口側)に、第2図に
も示されるように光電変換部1例えばエリアアレイセン
サ8(多画素イメージセンサ;光検知器)が筒状体6の
軸心とは直角な方向沿いに設けられ、散乱光Aを同心円
状の分布から検出できるようにしている。そして、この
エリアアレイセンサ8に、マイクロコンピュータで構成
される処理回路9(処理部に相当)が接続され、得られ
る散乱光分布の電気信号から、例えばパターン検査に必
要な全散乱光、散乱角の分布、ii!!乱立体乱立分角
などを求めることができるようにしている。
As shown in FIG. 2, a photoelectric conversion unit 1 such as an area array sensor 8 (multi-pixel image sensor; photodetector) is mounted on the output side (large aperture side) of the cylindrical body 6. It is provided along a direction perpendicular to the axis, so that the scattered light A can be detected from a concentric distribution. A processing circuit 9 (corresponding to a processing section) composed of a microcomputer is connected to this area array sensor 8, and from the obtained electrical signal of the scattered light distribution, the total scattered light necessary for pattern inspection, the scattering angle, etc. distribution, ii! ! It is possible to obtain the turbulent angle of turbulence.

つぎに、このように構成された散乱光測定装置の作用に
ついて説明する。
Next, the operation of the thus configured scattered light measuring device will be explained.

光源2を作動させると、光io!2から出射された光は
、ビームスプリッタ5でレンズ側に導かれていき、集光
レンズ4で集光されて後、被測定物1の表面1aに照射
されていく。これにより、表面1a上で反射が起き、表
面1a上の測定すべきパターン(一定)に応じた正反射
光と散乱光Aとが発生する。
When light source 2 is activated, light io! The light emitted from the device 2 is guided to the lens side by the beam splitter 5, and after being condensed by the condensing lens 4, it is irradiated onto the surface 1a of the object to be measured 1. As a result, reflection occurs on the surface 1a, and specularly reflected light and scattered light A are generated according to the (constant) pattern to be measured on the surface 1a.

そして、反射した光のうち正反射光はストッパ7でその
進行が遮られ、散乱光Aは反射面6aに反射して、集光
レンズ4の周辺部を通過する散乱光Aと共にエリアアレ
イセンサ8の表面に導かれていく。これにより、散乱光
Aがセンサ面に同心円状を描いて照射され、集光レンズ
4からだけでなく、大きな散乱角をもつ散乱光Aのもの
までも検出されていく。
Of the reflected light, the specularly reflected light is blocked from advancing by the stopper 7, and the scattered light A is reflected on the reflective surface 6a, and together with the scattered light A passing through the peripheral part of the condenser lens 4, the area array sensor 8 being guided to the surface of As a result, the scattered light A is irradiated onto the sensor surface in a concentric manner, and not only the scattered light A from the condenser lens 4 but also the scattered light A having a large scattering angle is detected.

しかるに、全散乱光Aを検出するときは処理回路9でセ
ンサー面上の光検出領域の合計を求めればよく、また散
乱角の分布を検出するときは処理回路9で同一半径上の
円輪の和を求める、さらには散乱立体角の分布は処理回
路って同一角度に有る円弧の和を求めればよい。
However, when detecting the total scattered light A, the processing circuit 9 only needs to calculate the total light detection area on the sensor surface, and when detecting the distribution of scattering angles, the processing circuit 9 calculates the total light detection area on the sensor surface. To calculate the sum, or even the distribution of the solid angle of scattering, the processing circuit can calculate the sum of circular arcs at the same angle.

かくして、大きな開口数のレンズを使ったり。Thus, using a lens with a large numerical aperture.

レンズを被測定物1に非常に近付けることになしに、大
きな散乱角の散乱光Aを測定することができる。しかも
、散乱光の角度分布を測定できることがわかる。また筒
状体6を光学系3の周囲に設ける他、筒状体6の開口端
側にエリアアレイセンサ8を設ければよいので、従来よ
うな反11 litを入射側方に設けたときにように装
置が大がかりになることもなく、コンパクト性にも浸れ
る。
Scattered light A having a large scattering angle can be measured without bringing the lens very close to the object to be measured 1. Moreover, it can be seen that the angular distribution of scattered light can be measured. In addition to providing the cylindrical body 6 around the optical system 3, it is sufficient to provide the area array sensor 8 on the open end side of the cylindrical body 6. The device does not need to be large-scale, and it is compact.

なお、第1の実施例では散乱光Aのみを検出するように
したが、ストッパ7を取除いて正反射光も散乱光Aと共
に検出するようにしてもよい。
In the first embodiment, only the scattered light A is detected, but the stopper 7 may be removed so that the specularly reflected light is also detected together with the scattered light A.

また、第1の実施例では被測定物1の表面1a上の一定
パターンを検出するようにしたが、これに限らず、被測
定物1に代わり粒子(図示しない)を流通させて、散乱
角の分布から粒径計測などをしてもよい(粒子計測)。
Further, in the first embodiment, a certain pattern on the surface 1a of the object to be measured 1 is detected, but the present invention is not limited to this. Particle size measurement may be performed based on the distribution of particles (particle measurement).

さらに第1の実施例では、エリアアレイセンサ8を用い
たが、第4図に示される第2の実施例のようにリニアア
レイセンサ1oを用いて散乱光の散乱角度分布のみを知
るようにしても、第5図に示される第3の実施例のよう
に4つに分割された分割型センサ11を用いて散乱光立
体角の分布を知るようにしてもよい。
Further, in the first embodiment, the area array sensor 8 is used, but as in the second embodiment shown in FIG. 4, a linear array sensor 1o is used to know only the scattering angle distribution of the scattered light. Alternatively, the distribution of the solid angle of the scattered light may be determined using a divided sensor 11 divided into four parts as in the third embodiment shown in FIG.

加えて第1の実施例では、椀形の筒状体6を用いたが、
これに限らず、円筒状あるいは円錐状などの筒状体でも
よい。もちろん、分割タイプの筒状体でもよく、その構
造には限定されるものではない。
In addition, in the first embodiment, the bowl-shaped cylindrical body 6 was used;
The material is not limited to this, and may be a cylindrical body, such as a cylindrical shape or a conical shape. Of course, a split type cylindrical body may be used, and the structure is not limited to this.

[発明の効果コ 以上説明したようにこの発明によれば、大きな開口数を
使わず、かつ被測定物との距離をあまり近付けずに、大
なる散乱角の散乱光を測定することができる。しかも、
散乱光の角度分布も測定することができる。そのうえ、
装置がコンパクトですむ利点もあり、性能のよい散乱光
測定装置を提供することができる。
[Effects of the Invention] As explained above, according to the present invention, it is possible to measure scattered light at a large scattering angle without using a large numerical aperture and without bringing the object to be measured very close. Moreover,
The angular distribution of scattered light can also be measured. Moreover,
There is also the advantage that the device is compact, and a scattered light measuring device with good performance can be provided.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の第1の実施例の散乱光測定装置を示
す断面図、第2図はその光電変換部を示す平面図、第3
図はその筒状体を示す斜視図、第4図はこの発明の第2
の実施例を示す平面図、第5図はこの発明の第3の実施
例を示す平面図、第6図ないし第9図はそれぞれ異なる
従来の散乱光測定装置の側面図である。 1・・・被測定物、2・・・光源、6・・・筒状体、8
・・・エリアアレイセンサ(光電変換部)、9・・・処
理回路(処理部)、A・・・散乱光。 出願人代理人 弁理士 鈴江武彦 第1図 第3図 第 5 図 89  図
FIG. 1 is a sectional view showing a scattered light measuring device according to a first embodiment of the present invention, FIG. 2 is a plan view showing a photoelectric conversion section thereof, and FIG.
The figure is a perspective view showing the cylindrical body, and FIG.
FIG. 5 is a plan view showing a third embodiment of the present invention, and FIGS. 6 to 9 are side views of different conventional scattered light measuring devices. 1... Object to be measured, 2... Light source, 6... Cylindrical body, 8
...Area array sensor (photoelectric conversion unit), 9...Processing circuit (processing unit), A...Scattered light. Applicant's agent Patent attorney Takehiko Suzue Figure 1 Figure 3 Figure 5 Figure 89

Claims (3)

【特許請求の範囲】[Claims] (1)光源と、この光源からの光を集束して被測定物に
入射させる光学系と、この光学系の出射側周囲を覆うよ
うに設けられた前記被測定物からの散乱光を受けるため
の反射面を内面にもつ筒状体と、この筒状体からの散乱
光を光電変換する光電変換部と、この光電変換部からの
出力を処理する処理部とを具備したことを特徴する散乱
光測定装置。
(1) A light source, an optical system that focuses the light from the light source and makes it incident on the object to be measured, and a device for receiving scattered light from the object that is provided to cover the output side of the optical system. A scattering device comprising: a cylindrical body having a reflective surface on its inner surface; a photoelectric conversion section that photoelectrically converts scattered light from the cylindrical body; and a processing section that processes output from the photoelectric conversion section. Light measurement device.
(2)光電変換部は、分割型センサ、あるいは多画素イ
メージセンサより構成されていることを特徴する特許請
求の範囲第1項に記載の散乱光測定装置。
(2) The scattered light measuring device according to claim 1, wherein the photoelectric conversion section is composed of a split type sensor or a multi-pixel image sensor.
(3)光電変換部は、散乱光を正反射光と共に受けるも
のであることを特徴とする特許請求の範囲第1項に記載
の散乱光測定装置。
(3) The scattered light measuring device according to claim 1, wherein the photoelectric conversion section receives scattered light together with specularly reflected light.
JP28928886A 1986-12-04 1986-12-04 Scattered light measuring instrument Pending JPS63140904A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28928886A JPS63140904A (en) 1986-12-04 1986-12-04 Scattered light measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28928886A JPS63140904A (en) 1986-12-04 1986-12-04 Scattered light measuring instrument

Publications (1)

Publication Number Publication Date
JPS63140904A true JPS63140904A (en) 1988-06-13

Family

ID=17741236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28928886A Pending JPS63140904A (en) 1986-12-04 1986-12-04 Scattered light measuring instrument

Country Status (1)

Country Link
JP (1) JPS63140904A (en)

Cited By (10)

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WO1997012226A1 (en) * 1995-09-25 1997-04-03 Tencor Instruments Improved system for surface inspection
US6538730B2 (en) 2001-04-06 2003-03-25 Kla-Tencor Technologies Corporation Defect detection system
US6606153B2 (en) 1994-03-24 2003-08-12 Kla-Tencor Corporation Process and assembly for non-destructive surface inspections
FR2860869A1 (en) * 2003-10-10 2005-04-15 Optis Light intensity measuring device for characterizing aircraft signature has aspherical lens and reflector generating beams with inclination angles, with beams not crossing, and measuring unit measuring intensity of rays based on angles
WO2005036141A1 (en) * 2003-10-10 2005-04-21 Optis Portable device for measuring the light intensity of an object, and use of one such device
US7064821B2 (en) 1997-09-19 2006-06-20 Kla-Tencor Technologies Corporation Sample inspection system
US7116413B2 (en) 2002-09-13 2006-10-03 Kla-Tencor Corporation Inspection system for integrated applications
US7119897B2 (en) 1997-09-19 2006-10-10 Kla-Tencor Technologies Corporation Sample inspection system
JP2010122193A (en) * 2008-11-21 2010-06-03 Fujitsu Ltd Shape-measuring device of three dimensional structures
US8379196B2 (en) 2009-06-08 2013-02-19 Sumco Corporation Method for judging whether semiconductor wafer is non-defective wafer by using laser scattering method

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6606153B2 (en) 1994-03-24 2003-08-12 Kla-Tencor Corporation Process and assembly for non-destructive surface inspections
US7477371B2 (en) 1994-03-24 2009-01-13 Kla-Tencor Corporation Process and assembly for non-destructive surface inspections
US7102744B2 (en) 1994-03-24 2006-09-05 Kla-Tencor Corporation Process and assembly for non-destructive surface inspections
WO1997012226A1 (en) * 1995-09-25 1997-04-03 Tencor Instruments Improved system for surface inspection
US7119897B2 (en) 1997-09-19 2006-10-10 Kla-Tencor Technologies Corporation Sample inspection system
US7064821B2 (en) 1997-09-19 2006-06-20 Kla-Tencor Technologies Corporation Sample inspection system
US7079238B2 (en) 1997-09-19 2006-07-18 Kla-Tencor Technologies Corporation Sample inspection system
US6538730B2 (en) 2001-04-06 2003-03-25 Kla-Tencor Technologies Corporation Defect detection system
US6862096B2 (en) 2001-04-06 2005-03-01 Kla-Tencor Corporation Defect detection system
US7116413B2 (en) 2002-09-13 2006-10-03 Kla-Tencor Corporation Inspection system for integrated applications
FR2860869A1 (en) * 2003-10-10 2005-04-15 Optis Light intensity measuring device for characterizing aircraft signature has aspherical lens and reflector generating beams with inclination angles, with beams not crossing, and measuring unit measuring intensity of rays based on angles
US7130033B2 (en) 2003-10-10 2006-10-31 Optis Portable device for measuring the light intensity from an object, and the use of such a device
JP2007508532A (en) * 2003-10-10 2007-04-05 オプティス Portable devices for measuring light intensity from objects and uses of such devices
WO2005036141A1 (en) * 2003-10-10 2005-04-21 Optis Portable device for measuring the light intensity of an object, and use of one such device
JP2010122193A (en) * 2008-11-21 2010-06-03 Fujitsu Ltd Shape-measuring device of three dimensional structures
US8379196B2 (en) 2009-06-08 2013-02-19 Sumco Corporation Method for judging whether semiconductor wafer is non-defective wafer by using laser scattering method
EP3290910A1 (en) 2009-06-08 2018-03-07 Sumco Corporation Method for judging whether semiconductor wafer is non-defective wafer by using laser scattering method

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