JPS6312250B2 - - Google Patents

Info

Publication number
JPS6312250B2
JPS6312250B2 JP7033380A JP7033380A JPS6312250B2 JP S6312250 B2 JPS6312250 B2 JP S6312250B2 JP 7033380 A JP7033380 A JP 7033380A JP 7033380 A JP7033380 A JP 7033380A JP S6312250 B2 JPS6312250 B2 JP S6312250B2
Authority
JP
Japan
Prior art keywords
glass
transparent plate
video signal
inspection
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7033380A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56166452A (en
Inventor
Katsumi Kokubu
Masaharu Okafuji
Osayoshi Ichinose
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Sheet Glass Co Ltd
Original Assignee
Nippon Sheet Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Sheet Glass Co Ltd filed Critical Nippon Sheet Glass Co Ltd
Priority to JP7033380A priority Critical patent/JPS56166452A/ja
Publication of JPS56166452A publication Critical patent/JPS56166452A/ja
Publication of JPS6312250B2 publication Critical patent/JPS6312250B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP7033380A 1980-05-27 1980-05-27 Detecting method for distortion defect of transparent plate Granted JPS56166452A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7033380A JPS56166452A (en) 1980-05-27 1980-05-27 Detecting method for distortion defect of transparent plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7033380A JPS56166452A (en) 1980-05-27 1980-05-27 Detecting method for distortion defect of transparent plate

Publications (2)

Publication Number Publication Date
JPS56166452A JPS56166452A (en) 1981-12-21
JPS6312250B2 true JPS6312250B2 (enrdf_load_stackoverflow) 1988-03-18

Family

ID=13428385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7033380A Granted JPS56166452A (en) 1980-05-27 1980-05-27 Detecting method for distortion defect of transparent plate

Country Status (1)

Country Link
JP (1) JPS56166452A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010507801A (ja) * 2006-10-27 2010-03-11 セミシスコ・カンパニー・リミテッド ガラス基板の品質検査装置及びその検査方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60119404A (ja) * 1983-12-01 1985-06-26 Nippon Sheet Glass Co Ltd 板ガラスの歪検査装置
JPS61162708A (ja) * 1985-01-11 1986-07-23 Inax Corp 部材表面の欠点検出装置
JPH0660805B2 (ja) * 1986-02-27 1994-08-10 東洋電子株式会社 透明フィルムのエッジ検出装置
JPH07119584B2 (ja) * 1986-09-24 1995-12-20 マツダ株式会社 プライマ塗布不良検出方法
JP7180177B2 (ja) * 2018-07-31 2022-11-30 株式会社リコー ステレオカメラシステム、移動体及びステレオカメラ装置の形成方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010507801A (ja) * 2006-10-27 2010-03-11 セミシスコ・カンパニー・リミテッド ガラス基板の品質検査装置及びその検査方法

Also Published As

Publication number Publication date
JPS56166452A (en) 1981-12-21

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