JPS63108269A - 電子機器の制御装置 - Google Patents

電子機器の制御装置

Info

Publication number
JPS63108269A
JPS63108269A JP62257051A JP25705187A JPS63108269A JP S63108269 A JPS63108269 A JP S63108269A JP 62257051 A JP62257051 A JP 62257051A JP 25705187 A JP25705187 A JP 25705187A JP S63108269 A JPS63108269 A JP S63108269A
Authority
JP
Japan
Prior art keywords
waveform
command
data
subsystem
oscilloscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62257051A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0583929B2 (enExample
Inventor
ジェームス・シー・スタンレー
ブライアン・ディー・ディーム
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JPS63108269A publication Critical patent/JPS63108269A/ja
Publication of JPH0583929B2 publication Critical patent/JPH0583929B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Digital Computer Display Output (AREA)
JP62257051A 1986-10-14 1987-10-12 電子機器の制御装置 Granted JPS63108269A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/918,430 US4884228A (en) 1986-10-14 1986-10-14 Flexible instrument control system
US918430 1986-10-14

Publications (2)

Publication Number Publication Date
JPS63108269A true JPS63108269A (ja) 1988-05-13
JPH0583929B2 JPH0583929B2 (enExample) 1993-11-30

Family

ID=25440368

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62257051A Granted JPS63108269A (ja) 1986-10-14 1987-10-12 電子機器の制御装置

Country Status (4)

Country Link
US (1) US4884228A (enExample)
EP (1) EP0265134B1 (enExample)
JP (1) JPS63108269A (enExample)
DE (1) DE3772702D1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0523147U (ja) * 1991-08-30 1993-03-26 横河電機株式会社 デジタルオシロスコープ
JP2012103186A (ja) * 2010-11-12 2012-05-31 Yokogawa Electric Corp 波形測定装置

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US5343144A (en) * 1991-02-28 1994-08-30 Sony Corporation Electronic device
NZ237767A (en) * 1992-04-09 1994-09-27 Inst Geolog Nuclear Sciences Luggage scanning by fast neutrons and gamma radiation
US5392033A (en) * 1993-01-05 1995-02-21 International Business Machines Corporation Priority generator for providing controllable guaranteed fairness in accessing a shared bus
US5537607A (en) * 1993-04-28 1996-07-16 International Business Machines Corporation Field programmable general purpose interface adapter for connecting peripheral devices within a computer system
US5566088A (en) * 1994-06-13 1996-10-15 Motorola, Inc. Modular radio test system and method
US7016811B2 (en) * 2001-08-15 2006-03-21 National Instruments Corporation Network-based system for configuring a programmable hardware element in a measurement system using hardware configuration programs generated based on a user specification
US6615148B2 (en) * 2000-05-17 2003-09-02 Tektronix, Inc. Streaming distributed test and measurement instrument
AU2002225634A1 (en) * 2000-11-17 2002-05-27 Lecroy Corporation Processing web editor for data processing in a digital oscilloscope or similar instrument
US20030004672A1 (en) * 2001-06-29 2003-01-02 National Instruments Corporation Meta-routing tool for a measurement system
US20030005154A1 (en) * 2001-06-29 2003-01-02 Thurman Robert W. Shared routing in a measurement system
US7162387B2 (en) * 2001-06-29 2007-01-09 National Instruments Corporation Measurement system graphical user interface for easily configuring measurement applications
US20030004673A1 (en) * 2001-06-29 2003-01-02 Thurman Robert W. Routing with signal modifiers in a measurement system
US20030005153A1 (en) * 2001-06-29 2003-01-02 National Instruments Corporation Dynamic routing for a measurement system
US6879926B2 (en) 2001-06-29 2005-04-12 National Instruments Corporation Measurement system software architecture for easily creating high-performance measurement applications
US7969431B2 (en) 2001-06-29 2011-06-28 National Instruments Corporation Graphical program node for generating a measurement program
US7984423B2 (en) * 2001-08-14 2011-07-19 National Instruments Corporation Configuration diagram which displays a configuration of a system
US7594220B2 (en) * 2001-08-14 2009-09-22 National Instruments Corporation Configuration diagram with context sensitive connectivity
US8290762B2 (en) * 2001-08-14 2012-10-16 National Instruments Corporation Graphically configuring program invocation relationships by creating or modifying links among program icons in a configuration diagram
US6889172B2 (en) * 2001-08-15 2005-05-03 National Instruments Corporation Network-based system for configuring a measurement system using software programs generated based on a user specification
US7043393B2 (en) * 2001-08-15 2006-05-09 National Instruments Corporation System and method for online specification of measurement hardware
US7013232B2 (en) * 2001-08-15 2006-03-14 National Insurance Corporation Network-based system for configuring a measurement system using configuration information generated based on a user specification
AU2002323409A1 (en) * 2001-08-24 2003-03-10 Martek Biosciences Boulder Corporation Products containing highly unsaturated fatty acids for use by women and their children during stages of preconception, pregnancy and lactation/post-partum
US7251752B2 (en) 2001-10-01 2007-07-31 Adams Phillip M Computerized product improvement apparatus and method
US7512931B2 (en) * 2001-11-13 2009-03-31 National Instruments Corporation Graphical program nodes for implementing a measurement state model
US7089141B2 (en) * 2001-11-13 2006-08-08 National Instruments Corporation Measurement system which uses a state model
US20040034496A1 (en) * 2002-08-13 2004-02-19 Correll Jeffrey N. Displaying functionality of a hardware device in a measurement system
US7356774B2 (en) * 2002-08-13 2008-04-08 National Instruments Corporation Grouping components of a measurement system
US7042469B2 (en) * 2002-08-13 2006-05-09 National Instruments Corporation Multiple views for a measurement system diagram
US7219306B2 (en) * 2002-08-13 2007-05-15 National Instruments Corporation Representing unspecified information in a measurement system
US7890868B2 (en) * 2002-08-13 2011-02-15 National Instruments Corporation Selecting a connectable element of a hardware device in a measurement system
US7761802B2 (en) * 2002-08-13 2010-07-20 National Instruments Corporation Expanding and collapsing components in a measurement system diagram
US7484200B2 (en) * 2002-08-14 2009-01-27 National Instruments Corporation Automatically analyzing and modifying a graphical program
US7663624B2 (en) * 2004-06-30 2010-02-16 Lecroy Corporation Report generating method and apparatus
US8010550B2 (en) * 2006-11-17 2011-08-30 Microsoft Corporation Parallelizing sequential frameworks using transactions
US7711678B2 (en) * 2006-11-17 2010-05-04 Microsoft Corporation Software transaction commit order and conflict management
US7860847B2 (en) * 2006-11-17 2010-12-28 Microsoft Corporation Exception ordering in contention management to support speculative sequential semantics
US8024714B2 (en) 2006-11-17 2011-09-20 Microsoft Corporation Parallelizing sequential frameworks using transactions
US8276167B2 (en) * 2007-03-21 2012-09-25 International Business Machines Corporation Distributed pluggable middleware services
US20110225524A1 (en) * 2010-03-10 2011-09-15 Cifra Christopher G Multi-Touch Editing in a Graphical Programming Language
TW201226917A (en) * 2010-12-29 2012-07-01 Hon Hai Prec Ind Co Ltd System and method for processing data of a oscillograph
US8713482B2 (en) 2011-07-28 2014-04-29 National Instruments Corporation Gestures for presentation of different views of a system diagram
US8782525B2 (en) 2011-07-28 2014-07-15 National Insturments Corporation Displaying physical signal routing in a diagram of a system
CN103616543A (zh) * 2013-11-19 2014-03-05 深圳麦科信仪器有限公司 一种全触控平板示波器
CN103675384B (zh) * 2013-12-07 2016-08-17 成都亿盟恒信科技有限公司 手持式多功能双通道触摸示波器及其使用方法
US11108831B2 (en) * 2019-01-04 2021-08-31 Vmware, Inc. Machine policy configuration for managed devices
CN113893123A (zh) * 2021-09-17 2022-01-07 未来穿戴技术股份有限公司 按摩数据的处理方法、装置、电子设备及存储介质

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US920008A (en) * 1903-06-15 1909-04-27 Albert Baumgarten Cork-puller.
US3400374A (en) * 1965-06-16 1968-09-03 Robertshaw Controls Co Computerized control systems
US3702986A (en) * 1970-07-06 1972-11-14 Texas Instruments Inc Trainable entropy system
UST920008I4 (en) 1973-04-23 1974-03-05 Dynamically modifiable adaptive machine tool control system and method
US3882305A (en) * 1974-01-15 1975-05-06 Kearney & Trecker Corp Diagnostic communication system for computer controlled machine tools
JPS521287A (en) * 1975-06-21 1977-01-07 Fanuc Ltd Numeric value control device
US4104725A (en) * 1976-03-26 1978-08-01 Norland Corporation Programmed calculating input signal module for waveform measuring and analyzing instrument
US4138718A (en) * 1977-11-14 1979-02-06 Allen-Bradley Company Numerical control system with downloading capability
US4525673A (en) * 1979-12-26 1985-06-25 Varian Associates, Inc. NMR spectrometer incorporating a re-entrant FIFO
US4399502A (en) * 1981-02-19 1983-08-16 Altex Scientific Inc. Instrument control system
US4758963A (en) * 1982-09-14 1988-07-19 Analogic Corporation Modular computing oscilloscope with high speed signal memory
EP0157028B1 (en) * 1984-04-05 1989-10-25 Grumman Aerospace Corporation Programmable tester
US4630224A (en) * 1984-04-19 1986-12-16 The United States Of America As Represented By The Secretary Of The Navy Automation initialization of reconfigurable on-line automatic test system
DE3511592A1 (de) * 1985-03-27 1986-10-02 CREATEC Gesellschaft für Elektrotechnik mbH, 1000 Berlin Signalverarbeitungsgeraet

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0523147U (ja) * 1991-08-30 1993-03-26 横河電機株式会社 デジタルオシロスコープ
JP2012103186A (ja) * 2010-11-12 2012-05-31 Yokogawa Electric Corp 波形測定装置

Also Published As

Publication number Publication date
JPH0583929B2 (enExample) 1993-11-30
DE3772702D1 (de) 1991-10-10
EP0265134A1 (en) 1988-04-27
EP0265134B1 (en) 1991-09-04
US4884228A (en) 1989-11-28

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