DE3772702D1 - Verfahren und vorrichtung zur konfiguration eines messinstruments und konfigurierbares messinstrument. - Google Patents

Verfahren und vorrichtung zur konfiguration eines messinstruments und konfigurierbares messinstrument.

Info

Publication number
DE3772702D1
DE3772702D1 DE8787308994T DE3772702T DE3772702D1 DE 3772702 D1 DE3772702 D1 DE 3772702D1 DE 8787308994 T DE8787308994 T DE 8787308994T DE 3772702 T DE3772702 T DE 3772702T DE 3772702 D1 DE3772702 D1 DE 3772702D1
Authority
DE
Germany
Prior art keywords
measuring instrument
configuring
configurable
instrument
configurable measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8787308994T
Other languages
English (en)
Inventor
James C Stanley
Brian D Diehm
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ST. CLAIR INTELLECTUAL PROPERTY CONSULTANTS, INC.,
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of DE3772702D1 publication Critical patent/DE3772702D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Digital Computer Display Output (AREA)
DE8787308994T 1986-10-14 1987-10-12 Verfahren und vorrichtung zur konfiguration eines messinstruments und konfigurierbares messinstrument. Expired - Fee Related DE3772702D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/918,430 US4884228A (en) 1986-10-14 1986-10-14 Flexible instrument control system

Publications (1)

Publication Number Publication Date
DE3772702D1 true DE3772702D1 (de) 1991-10-10

Family

ID=25440368

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787308994T Expired - Fee Related DE3772702D1 (de) 1986-10-14 1987-10-12 Verfahren und vorrichtung zur konfiguration eines messinstruments und konfigurierbares messinstrument.

Country Status (4)

Country Link
US (1) US4884228A (de)
EP (1) EP0265134B1 (de)
JP (1) JPS63108269A (de)
DE (1) DE3772702D1 (de)

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US7969431B2 (en) 2001-06-29 2011-06-28 National Instruments Corporation Graphical program node for generating a measurement program
US6965800B2 (en) * 2001-06-29 2005-11-15 National Instruments Corporation System of measurements experts and method for generating high-performance measurements software drivers
US7162387B2 (en) * 2001-06-29 2007-01-09 National Instruments Corporation Measurement system graphical user interface for easily configuring measurement applications
US20030004673A1 (en) * 2001-06-29 2003-01-02 Thurman Robert W. Routing with signal modifiers in a measurement system
US8290762B2 (en) * 2001-08-14 2012-10-16 National Instruments Corporation Graphically configuring program invocation relationships by creating or modifying links among program icons in a configuration diagram
US7594220B2 (en) * 2001-08-14 2009-09-22 National Instruments Corporation Configuration diagram with context sensitive connectivity
US7062718B2 (en) * 2001-08-14 2006-06-13 National Instruments Corporation Configuration diagram which graphically displays program relationship
US7013232B2 (en) * 2001-08-15 2006-03-14 National Insurance Corporation Network-based system for configuring a measurement system using configuration information generated based on a user specification
US7043393B2 (en) * 2001-08-15 2006-05-09 National Instruments Corporation System and method for online specification of measurement hardware
US6889172B2 (en) * 2001-08-15 2005-05-03 National Instruments Corporation Network-based system for configuring a measurement system using software programs generated based on a user specification
WO2003017945A2 (en) * 2001-08-24 2003-03-06 Martek Biosciences Boulder Corporation Products containing highly unsaturated fatty acids for use by women and their children during stages of preconception, pregnancy and lactation/post-partum
US7251752B2 (en) 2001-10-01 2007-07-31 Adams Phillip M Computerized product improvement apparatus and method
US7089141B2 (en) * 2001-11-13 2006-08-08 National Instruments Corporation Measurement system which uses a state model
US7512931B2 (en) * 2001-11-13 2009-03-31 National Instruments Corporation Graphical program nodes for implementing a measurement state model
US7890868B2 (en) * 2002-08-13 2011-02-15 National Instruments Corporation Selecting a connectable element of a hardware device in a measurement system
US7356774B2 (en) * 2002-08-13 2008-04-08 National Instruments Corporation Grouping components of a measurement system
US7761802B2 (en) * 2002-08-13 2010-07-20 National Instruments Corporation Expanding and collapsing components in a measurement system diagram
US20040034496A1 (en) * 2002-08-13 2004-02-19 Correll Jeffrey N. Displaying functionality of a hardware device in a measurement system
US7042469B2 (en) * 2002-08-13 2006-05-09 National Instruments Corporation Multiple views for a measurement system diagram
US7219306B2 (en) * 2002-08-13 2007-05-15 National Instruments Corporation Representing unspecified information in a measurement system
US7484200B2 (en) * 2002-08-14 2009-01-27 National Instruments Corporation Automatically analyzing and modifying a graphical program
US7663624B2 (en) * 2004-06-30 2010-02-16 Lecroy Corporation Report generating method and apparatus
US8024714B2 (en) 2006-11-17 2011-09-20 Microsoft Corporation Parallelizing sequential frameworks using transactions
US7860847B2 (en) * 2006-11-17 2010-12-28 Microsoft Corporation Exception ordering in contention management to support speculative sequential semantics
US7711678B2 (en) * 2006-11-17 2010-05-04 Microsoft Corporation Software transaction commit order and conflict management
US8010550B2 (en) * 2006-11-17 2011-08-30 Microsoft Corporation Parallelizing sequential frameworks using transactions
US8276167B2 (en) * 2007-03-21 2012-09-25 International Business Machines Corporation Distributed pluggable middleware services
US20110225524A1 (en) * 2010-03-10 2011-09-15 Cifra Christopher G Multi-Touch Editing in a Graphical Programming Language
JP5546423B2 (ja) * 2010-11-12 2014-07-09 横河電機株式会社 波形測定装置
TW201226917A (en) * 2010-12-29 2012-07-01 Hon Hai Prec Ind Co Ltd System and method for processing data of a oscillograph
US8782525B2 (en) 2011-07-28 2014-07-15 National Insturments Corporation Displaying physical signal routing in a diagram of a system
US8713482B2 (en) 2011-07-28 2014-04-29 National Instruments Corporation Gestures for presentation of different views of a system diagram
CN103616543A (zh) * 2013-11-19 2014-03-05 深圳麦科信仪器有限公司 一种全触控平板示波器
CN103675384B (zh) * 2013-12-07 2016-08-17 成都亿盟恒信科技有限公司 手持式多功能双通道触摸示波器及其使用方法
US11108831B2 (en) * 2019-01-04 2021-08-31 Vmware, Inc. Machine policy configuration for managed devices
CN113893123A (zh) * 2021-09-17 2022-01-07 未来穿戴技术股份有限公司 按摩数据的处理方法、装置、电子设备及存储介质

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DE3511592A1 (de) * 1985-03-27 1986-10-02 CREATEC Gesellschaft für Elektrotechnik mbH, 1000 Berlin Signalverarbeitungsgeraet

Also Published As

Publication number Publication date
EP0265134A1 (de) 1988-04-27
JPS63108269A (ja) 1988-05-13
US4884228A (en) 1989-11-28
EP0265134B1 (de) 1991-09-04
JPH0583929B2 (de) 1993-11-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: ST. CLAIR INTELLECTUAL PROPERTY CONSULTANTS, INC.,

8339 Ceased/non-payment of the annual fee