JPS6298234U - - Google Patents

Info

Publication number
JPS6298234U
JPS6298234U JP19047585U JP19047585U JPS6298234U JP S6298234 U JPS6298234 U JP S6298234U JP 19047585 U JP19047585 U JP 19047585U JP 19047585 U JP19047585 U JP 19047585U JP S6298234 U JPS6298234 U JP S6298234U
Authority
JP
Japan
Prior art keywords
probe card
memory element
card
wafer
advance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19047585U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0229723Y2 (enExample
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985190475U priority Critical patent/JPH0229723Y2/ja
Publication of JPS6298234U publication Critical patent/JPS6298234U/ja
Application granted granted Critical
Publication of JPH0229723Y2 publication Critical patent/JPH0229723Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP1985190475U 1985-12-10 1985-12-10 Expired JPH0229723Y2 (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985190475U JPH0229723Y2 (enExample) 1985-12-10 1985-12-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985190475U JPH0229723Y2 (enExample) 1985-12-10 1985-12-10

Publications (2)

Publication Number Publication Date
JPS6298234U true JPS6298234U (enExample) 1987-06-23
JPH0229723Y2 JPH0229723Y2 (enExample) 1990-08-09

Family

ID=31143729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985190475U Expired JPH0229723Y2 (enExample) 1985-12-10 1985-12-10

Country Status (1)

Country Link
JP (1) JPH0229723Y2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07221143A (ja) * 1995-02-20 1995-08-18 Tokyo Electron Ltd プローブ装置
WO2009144791A1 (ja) * 2008-05-28 2009-12-03 株式会社アドバンテスト 試験システムおよび書込用ウエハ
WO2009147722A1 (ja) * 2008-06-02 2009-12-10 株式会社アドバンテスト 試験用ウエハ、試験システム、および、半導体ウエハ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593537U (ja) * 1982-06-30 1984-01-11 株式会社東京精密 半導体素子検査装置の測子カ−ド

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593537U (ja) * 1982-06-30 1984-01-11 株式会社東京精密 半導体素子検査装置の測子カ−ド

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07221143A (ja) * 1995-02-20 1995-08-18 Tokyo Electron Ltd プローブ装置
WO2009144791A1 (ja) * 2008-05-28 2009-12-03 株式会社アドバンテスト 試験システムおよび書込用ウエハ
JP5351151B2 (ja) * 2008-05-28 2013-11-27 株式会社アドバンテスト 試験システム
US8624620B2 (en) 2008-05-28 2014-01-07 Advantest Corporation Test system and write wafer
WO2009147722A1 (ja) * 2008-06-02 2009-12-10 株式会社アドバンテスト 試験用ウエハ、試験システム、および、半導体ウエハ
JP5314684B2 (ja) * 2008-06-02 2013-10-16 株式会社アドバンテスト 試験用ウエハ、および、試験システム

Also Published As

Publication number Publication date
JPH0229723Y2 (enExample) 1990-08-09

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