JPS6283400A - Method of improving cylinder for vapor growth of organometallic compound - Google Patents
Method of improving cylinder for vapor growth of organometallic compoundInfo
- Publication number
- JPS6283400A JPS6283400A JP21968085A JP21968085A JPS6283400A JP S6283400 A JPS6283400 A JP S6283400A JP 21968085 A JP21968085 A JP 21968085A JP 21968085 A JP21968085 A JP 21968085A JP S6283400 A JPS6283400 A JP S6283400A
- Authority
- JP
- Japan
- Prior art keywords
- dopant
- cylinder
- vapor growth
- dip tube
- organometallic compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は有機金属気相成長()letal organ
icChemical Vapor [)eposit
ion以下HO−CV[)という〉にあける)10−C
VD用シリンダーの改良法に関するものでおる。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to metal organic vapor phase epitaxy.
icChemical Vapor [)eposit
ion hereafter referred to as HO-CV [)] 10-C
This article concerns a method for improving VD cylinders.
現在、半導体レーザーの製造に当り、そのより高率化の
ためにHO−CVDを行うことはよく知られている。Currently, it is well known that HO-CVD is performed in order to increase the production efficiency of semiconductor lasers.
)10−CV[)とは、おる有機金属化合物を高温下に
あるウェーハ上にそのガスとして送り、ウェーハ上でこ
れらのガスを反応させ、この反応により生成する化合物
の単結晶薄膜を成長させることである。)10-CV[) is to send organic metal compounds as gas onto a wafer under high temperature, cause these gases to react on the wafer, and grow a single crystal thin film of the compound produced by this reaction. It is.
更に詳しく記せばウェーハ上に例えば
(Ct−13)3GaとAS)−13のガスを高温下に
あるウェーハ上で反応させ、下記反応式(CHa)aG
a +AS )−Ll −) Ga As +3C
H+によりGa ASの単結晶薄膜を成長させる方法で
ある。More specifically, for example, (Ct-13)3Ga and AS)-13 gas are reacted on a wafer under high temperature, and the following reaction formula (CHa)aG is obtained.
a+AS)-Ll-)GaAs+3C
This is a method of growing a Ga AS single crystal thin film using H+.
その際ドーパントとして他の有機金属化合物例えば(C
)la>3Znを用い、znをドープすることがよく行
われている。In this case, other organometallic compounds such as (C
) la > 3Zn and doping with Zn is often practiced.
第1図にNo−CV[)装置の概略図を示す。即ち、ウ
ェーハ1は加熱器2により高温に加熱されているが、そ
のウェーハ1上に前述の例ではAsHaはガス状である
のでシリンダーは必要としないが、(CH3) 3 G
a及びドーパントとしての(C)fa)32rlは液体
であるのでシリンダー7の中に貯え、その中のディップ
チューブ8を通して、不活性ガス3特に)−1eを流量
を制御しながら吹き込み、有機金属化合物のガス体を発
生してウェーハ上に送り、化学反応させ、その単結晶薄
膜をウェーハ上に成長させる。FIG. 1 shows a schematic diagram of the No-CV[) device. That is, the wafer 1 is heated to a high temperature by the heater 2, and in the above example, AsHa is in a gaseous state, so a cylinder is not required, but (CH3) 3 G is present on the wafer 1.
Since a and (C)fa)32rl as a dopant are liquids, they are stored in a cylinder 7, and an inert gas 3)-1e is blown into the cylinder through a dip tube 8 while controlling the flow rate to form an organometallic compound. A gas is generated and sent onto the wafer, causing a chemical reaction and growing a single crystal thin film on the wafer.
(発明が解決しようとする問題点)
NO−CVDニ# (+N T、(CHa) 3 Ga
1As 83等主原料ガスはガス口約200m/秒と
割合大量なのに反し、ドーパントへの不活性ガスの導入
量は通常1〜20rIiIl/分というように極めて僅
少のため、ディップ・チューブよりの気泡の発生状態は
極めて悪く、そのため一定のガス流量で流すことが困難
で、その結果ドーパントの注入量が不定となり、均一な
組成の結晶の薄膜化が得られない。(Problem to be solved by the invention) NO-CVD Ni# (+NT, (CHa) 3 Ga
Although the main raw material gas such as 1As 83 is relatively large at a gas inlet of approximately 200 m/sec, the amount of inert gas introduced into the dopant is usually extremely small at 1 to 20 rIiIl/min, so it is difficult to prevent bubbles from entering the dip tube. The generation conditions are extremely poor, making it difficult to flow the gas at a constant flow rate.As a result, the amount of dopant implanted becomes undefined, making it impossible to form a thin crystal film with a uniform composition.
(問題点を解決するための手段)
そこで本発明者らは、種々検討の結果、主原料のディッ
プ・チューブには勿論であるが、特にドーパントのディ
ップ・チューブの先端にボーラスな分散器を取付けるこ
とにより良好な)10−CVDができることが分った。(Means for Solving the Problems) Therefore, as a result of various studies, the present inventors installed a bolus disperser not only at the dip tube for the main raw material, but especially at the tip of the dip tube for the dopant. It has been found that even better 10-CVD can be achieved.
(作用)
そこで、次の試験例に記す態様で、分散器としてディッ
プフィルター(NUPROFILTERヌプロフィルタ
ー)(ヌプロ カンパニイ: 4800イースト345
ストリート、ウィラウクバイ、オハイ第44094
製、4800 East 345th 5treet
。(Function) Therefore, in the manner described in the following test example, a dip filter (NUPRO FILTER) (Nupro Company: 4800 East 345) was used as a dispersion device.
44094 Street, Willaukbai, Ojai
4800 East 345th 5treet
.
Willonohby、0hio 44094)S S
−2Fシリーズの焼結フィルター各種を取付け、分散
器からの発泡の状態を観察した。Willonohby, 0hio 44094) S S
- Various types of 2F series sintered filters were installed, and the state of foaming from the disperser was observed.
試験1゜
第2図に示す装置を使用し、ビーカー15中に供試液1
4としてエタノール(液温度28℃、1、Oc、p、)
(室温29℃)を入れ、分散器13のフィルターと
して、NUPROCo、’lS S −2F シリーズ
の2.7.15.60μのものを使用し、不活性ガス9
としてNZ量10d/minでフィルターでの気泡の発
生状況を観察した。Test 1゜ Using the apparatus shown in Figure 2, test liquid 1 was placed in beaker 15.
Ethanol as 4 (liquid temperature 28℃, 1, Oc, p,)
(room temperature: 29°C), and as a filter for the disperser 13, use a filter of 2.7.15.60μ from NUPROCo's S S-2F series,
The generation of bubbles in the filter was observed at an NZ rate of 10 d/min.
その結果は何れのものも発泡の状態がよいことが分った
。The results showed that all the foaming conditions were good.
試験2゜
試験1と同様な条件で、供試液14のみエタノールに替
えてプロパツール(液温度28℃、1.76 C,p)
及び同波(液温度O℃、4.6c、p、)で同じく発泡
の状態を観察した。その結果は試験1と大体同様で発泡
の状態は極めて良好なことが分った。Test 2゜Under the same conditions as Test 1, only test solution 14 was replaced with ethanol and propatool (liquid temperature 28℃, 1.76C, p)
The state of foaming was also observed under the same wave conditions (liquid temperature: 0°C, 4.6c, p). The results were almost the same as Test 1, and it was found that the foaming condition was extremely good.
かくして、フィルターの目は、圧損等を考慮して15〜
60μ程度がよいことが分った。試験ではNUPROF
ILTERを使用したが、これに限定されることなく、
例えばプラスチックボールフィルターでもセルポールデ
ィスクでもよく、また材質的にステンレススティールと
かセラミックス製のものでも、また繊維状のものでも、
耐久性があり、はぼ均一なボーラスなものであればよく
、1〜100μの微細なボーラスな分散器を取付け、N
o−CVDさせればよいことが分った。In this way, the mesh size of the filter is 15~
It was found that about 60μ is good. NUPROF in the exam
Although using ILTER, but not limited to,
For example, it may be a plastic ball filter or a Cellpol disk, or it may be made of stainless steel or ceramics, or it may be fibrous.
As long as it is durable and has a uniform bolus, a fine bolus disperser of 1 to 100μ is installed, and N
It was found that o-CVD was sufficient.
またドーパントとしてはジアルキル亜鉛、ジアルキルカ
ドミウム、ジアルキルテルル等各種の有機金属化合物が
考えられている。Various organometallic compounds such as dialkylzinc, dialkylcadmium, and dialkyltellurium are considered as dopants.
実施例1゜
基板上に主原料として(CH3) 3 GaとAsH3
を、ドーパントとして(CI−13)zZnを夫々用い
てGa As @cVDするに際し、キャリアーガスと
してHeを使用してドーパントへの流量を15d/mi
nとし、ディップ・チューブにNUPROFILTER
S S −2Fシリーズ 7μと60μのものを使用し
、)io−CVDuたところ良好な薄膜が得られた。し
かるに該フィルターのないものでは製膜は不均一のもの
であった。Example 1゜(CH3) 3 Ga and AsH3 as main raw materials on the substrate
When performing GaAs@cVD using (CI-13)zZn as a dopant, He was used as a carrier gas and the flow rate to the dopant was set at 15 d/mi.
n and put NUPROFILTER in the dip tube.
S S -2F series 7μ and 60μ were used, and a good thin film was obtained using io-CVDu. However, in the case without the filter, the film formation was non-uniform.
第1図は)10−CVD装置の概略図であり、図中1・
・・ウェーハ 2・・・加熱器
3・・・不活性ガス 4.5.6・・・有機金属化合物
7・・・シリンダー 8・・・ディップ・チューブ第2
図は本発明法で使用した装置の要部説明図であり、図中
9・・・不活性ガス 10・・・圧力計11・・・フロ
ーメーター
12・・・ディップ・チューブ
13・・・分散器 14・・・供試液 15・・・ビー
カー第1図
手続補正書輸力
昭和60年11月13日
持訂庁艮官 宇rイ万兎aUS 殿
1、事件の表示
昭和60年 特許願 第219680号2、発明の名称
有機金属気相成長用シリンダーの改良法(東曹京橋ビル
)
名 称 有限会社 東洋ストラフ7−・ケミカル明
細囚の発明の詳細な説明の欄
補正の内容
1、明細書箱2頁12行目および19行目にr (CH
:l) 3 ZnJとアルヲr (CH3) 22nJ
と夫々訂正。
2、同第3頁7行目に
r200ml/秒」とあるを
r200d/分」と訂正。
3、同第4頁5行目に
「ウイラウクバイ」と必るを
「【クィラウフバイ」と削正。
4、同頁7行目に
rWillonqhby jと必るを
r W i l 1ouc+hby jと訂正。Figure 1 is a schematic diagram of a 10-CVD apparatus, in which 1.
... Wafer 2 ... Heater 3 ... Inert gas 4.5.6 ... Organometallic compound 7 ... Cylinder 8 ... Dip tube 2nd
The figure is an explanatory diagram of the main parts of the apparatus used in the method of the present invention, in which 9... Inert gas 10... Pressure gauge 11... Flow meter 12... Dip tube 13... Dispersion Container 14...Test liquid 15...Beaker Figure 1 Procedural amendments November 13, 1985 Official of the Bureau of Corrections Urimanto aUS 1, Indication of the case 1985 Patent application No. No. 219680 No. 2, Title of the invention: Method for improving cylinders for organometallic vapor phase growth (Tokyo Kyobashi Building) Name: Toyo Straf Co., Ltd. 7-Chemical Specification Column Detailed explanation of the invention Contents of amendment 1: Specification r (CH
:l) 3 ZnJ and Alwor (CH3) 22nJ
Corrected each. 2. On page 3, line 7, the text "r200ml/sec" was corrected to "r200d/min." 3. In the 5th line of page 4 of the same page, the word ``Uiraukubai'' has been changed to ``[Kuilauhubai'']. 4. On the 7th line of the same page, rWillonqhby j and must be corrected to rWillonqhbyj and rWillonqhbyj.
Claims (1)
ーパントのディップ・チューブの下部に1〜100μの
ボーラスな分散器を取付けることを特徴とする有機金属
気相成長用シリンダーの改良法。(1) An improved method for a cylinder for organometallic vapor phase epitaxy, characterized in that a bolus disperser of 1 to 100 μm is attached to the lower part of the dopant dip tube in the cylinder for organometallic vapor phase epitaxy.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21968085A JPS6283400A (en) | 1985-10-02 | 1985-10-02 | Method of improving cylinder for vapor growth of organometallic compound |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21968085A JPS6283400A (en) | 1985-10-02 | 1985-10-02 | Method of improving cylinder for vapor growth of organometallic compound |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6283400A true JPS6283400A (en) | 1987-04-16 |
Family
ID=16739289
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21968085A Pending JPS6283400A (en) | 1985-10-02 | 1985-10-02 | Method of improving cylinder for vapor growth of organometallic compound |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6283400A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5476547A (en) * | 1989-09-26 | 1995-12-19 | Canon Kabushiki Kaisha | Gas feeding device for controlled vaporization of an organometallic compound used in deposition film formation |
JP2008150709A (en) * | 2006-12-15 | 2008-07-03 | Air Products & Chemicals Inc | Splashguard and inlet diffuser for high vacuum, high flow bubbler vessel |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60131973A (en) * | 1983-12-19 | 1985-07-13 | Matsushita Electric Ind Co Ltd | Method for vaporizing organometallic compound |
-
1985
- 1985-10-02 JP JP21968085A patent/JPS6283400A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60131973A (en) * | 1983-12-19 | 1985-07-13 | Matsushita Electric Ind Co Ltd | Method for vaporizing organometallic compound |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5755885A (en) * | 1989-09-19 | 1998-05-26 | Canon Kabushiki Kaisha | Gas feeding device for controlled vaporization of an organometallic compound used in deposition film formation |
US5476547A (en) * | 1989-09-26 | 1995-12-19 | Canon Kabushiki Kaisha | Gas feeding device for controlled vaporization of an organometallic compound used in deposition film formation |
JP2008150709A (en) * | 2006-12-15 | 2008-07-03 | Air Products & Chemicals Inc | Splashguard and inlet diffuser for high vacuum, high flow bubbler vessel |
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