JPS6279109A - Ic chip distributing mechanism - Google Patents

Abstract

PURPOSE:To distribute chips at a high speed by furnishing an inclined rail on a rotary plate so as to allow chips such as ICs to glide, installing a stopper on the rail with possibility of moving vertically, and by providing a distributing rail around said rotary plate so as to receive chips. CONSTITUTION:Each IC chip 4 fed by an inspection device glides on a guide rail 12 to get to an inclined rail 5. If any failure is not discerned on the IC, it is advanced to a distributing rail 9a. When the inspection device gives a signal to inform a failure, a stopper 6 sinks to stop the chip 4 and put a rotary plate 3 into rotation, which will stop at one of the arc-shaped rails 9h-9f specified according to the failure chip 4 is sensed by sensors installed between the arc-shaped rails 9h-9f, and accommodation is made in a collection box at the tip of the rail concerned.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a sorting mechanism for IC chips and other chips used when sorting ICs and other chips.

(Prior art) For example, a DIP type IC has many bottles on both sides of the package, and if one is missing or bent, it will cause trouble in the subsequent process, so it is necessary to inspect the condition of the bottles in advance. . Inspection equipment for this purpose is well known, but
Since there was no equipment that could perform high-speed and accurate testing,
The applicant has developed a method and apparatus for rapidly and accurately inspecting the condition of bottles, some of which have already been filed. The present invention has been made to sort ICs tested by the testing device at high speed according to test results, and can form part of a bin testing device.

(Technical Problem) Accordingly, in the above example, the purpose of the present invention is to select ICs with no abnormalities, those with abnormalities, and
Furthermore, it is an object of the present invention to provide a sorting mechanism for chips such as ICs that can be photographed and sorted according to the form of the abnormality, and that can be incorporated into other devices or used together with those devices. .

(Technical Means) The present invention that achieves the above object includes installing an inclined rail on which chips such as ICs slide on a rotating plate supported by a rotating shaft on a base, and stopping the chips on the rail. A stopper is provided so as to be movable up and down and rotatable together with the rotary plate, the vertical movement axis of the stopper is supported in contact with an elevating body placed below the rotary plate, and chips are received from an inclined rail around the rotary plate. This is a sorting mechanism for chips such as ICs, which has a configuration in which two or more sorting rails are installed at appropriate intervals, and the elevating body is connected to an elevating shaft to move a stopper up and down independently of the rotation of a rotary plate.

The mechanism with the above configuration is not only an IC but also a DI.
There is a possibility that it can be applied almost as is to other chips that can be transported, such as P-type ICs, by making slight design changes to the rails, etc.

(Example) To explain the present invention in detail with reference to an example, when it is applied to the IC bottle inspection device illustrated in FIG.
The mechanism of the present invention is incorporated in the position.

A is a device that sends out ICs stored in storage sheaths for inspection one by one, B is a device that inspects the intervals, bends, defects, and other conditions of IC bins, and C is a sorter incorporating the mechanism of the present invention. Device D indicates a device that re-inserts an IC with no abnormality into a storage sheath.

In Figures 1 to 3, 1 is the base of the sorting device C, 2
3 is a rotating shaft protruding from the center of the cylindrical pulse motor 11 fixed thereon, 3 is a circular rotary plate rotatably provided at the upper end of the rotating shaft 2, and 4 is a DIP type IC chip, which is used for inspection at the previous stage. It slides under its own weight while straddling the inclined rail 5 installed on the rotary plate 3 with the same inclination as the guide rail 12 extending from the device B. Reference numeral 6 denotes a gate-shaped stopper, which consists of a stopping member 13 that crosses directly above the inclined rail 5 and vertically moving shafts 7.7 provided at both ends of the stopping member 13. Both vertically moving shafts 7 pass through the rotary plate 3 and move downwardly. It protrudes and comes into contact with the upper surface of an elevating body 8, which will be described later. 14 indicates a guide sleeve for the vertically moving shaft 7.7. Further, reference numeral 15 denotes a detachment prevention guide provided in parallel above the inclined rail 5, so that the chip 4 on the inclined rail 5 is connected to the rotary plate 3.
The stopper 6 is designed so that it does not groove during operation.
It is cut off at this point.

8 is the above-mentioned elevating body, 8a is its center hole through which the rotating shaft 2 passes, 16 is a circular sliding surface on which the vertical movement shaft 7 moves while contacting it, and 17.17 is on both sides of the sliding surface 16. A protruding hooked hand towel connecting piece connects the plungers of two air cylinders 18, which are the driving sources for raising and lowering the elevating body 8, that is, the elevating shaft 1.
The upper end of 0.10 is fixed. Reference numeral 9 indicates a sorting rail, and in this embodiment, there is a straight rail 9a that sends chips 4 with no abnormality to the next process, and an arcuate rail 9a that sorts chips 4 according to the form of abnormality such as incorrect bin spacing, bent or missing bottles, etc. It is composed of rails 9b to 9f, and each rail 98 to 9f is connected to a rotating plate 3.
Around the periphery of, the straight rail 9a further includes an inclined rail 5 and
They are each installed on the base 1 so as to be in line with the guide rail 12 from the previous stage. Also, 19.20 is chip 4
shows a pair of sensors for detecting the passage of.

(Operation of the invention) The operation based on the above configuration is explained as follows.
The C chip 4 slides on the guide rail 12 from the inspection device B and reaches the inclined rail 5 of the main mechanism C. In this embodiment, if there is no abnormality in the chip 4, the stopper 6 is activated by a signal from the inspection device. At the raised position, the chips 4 are passed directly to the straight rail 9a of the sorting rail 9 without stopping, and sent to the storage device CD. Now, suppose that the inspection device sends a signal indicating some kind of abnormality in the bottle, the stopper 6 remains in the lowered position (solid line in Figure 2) and stops the chips 4 that are being fed. The pulse motor 11 operates and rotates by a predetermined angle, so the rotary plate 3 moves the chip 4 on the inclined rail 5 to the stopper 6.
The chip 4 is rotated while being stopped at a position on the arcuate rails 9b to 9f determined by the signal, and the stopper 6 is raised to release the chip 4. The passage of the chip 4 is detected by sensors 19 and 20, and the chip 4 is collected in a storage case for abnormal chips arranged at the tip of the rail or in another collection box, and it is further determined whether the chip 4 is usable or not. If any of the rails 9b to 9f is already unusable, it is possible to direct the bins to other rails based on the information from the sensors 19 and 20. At this stage, the bins are sorted according to the type of abnormality. , it becomes easier to determine whether or not it can be used later, and other invasive processes.

(Effects of the Invention) Therefore, according to the present invention, since the stopper is provided to stop the chip sliding on the inclined rail, it is possible to distinguish whether the chip is allowed to pass through or to be stopped depending on whether the stopper is activated or not. The inclined rail carrying the stopper is mounted on the rotary plate together with the stopper, and the shaft that moves the stopper up and down is supported in contact with the elevating body, so it is possible to operate the vertical movement shaft and the rotary plate independently. Therefore, the stopper can be released at any rotational position of the rotary plate and the chips can be distributed and sent out to multiple rails.The above distribution is performed only by the movement of the stopper and the rotary plate, so the movement is simple. As a result, quick and accurate operation can be expected.

[Brief explanation of drawings]

The drawings show one embodiment of the sorting mechanism for IC chips and other chips according to the present invention, in which Fig. 1 is a perspective view, Fig. 2 is a side view, Fig. 3 is a plan view, and Fig. 4 is a diagram showing how it is used. FIG. 2 is a perspective view showing the relationship between various parts of the device when it is incorporated into an IC bin inspection device, which is an example. 1... Base, 2... Rotating shaft, 3... Rotating plate, 4...
... Chips, 5... Inclined rail, 6... Stopper, 7... Vertical movement axis, 8... Lifting body, 9... Sorting rail, 10... Lifting axis. Patent application Hito Sanwa Electronics Co., Ltd. Agent Patent attorney Mukai Izawa Niney N1 Figure 2 Figure 3

Claims (4)

[Claims] (1) An inclined rail for sliding chips such as ICs is installed on a rotating plate supported by a rotating shaft on a base, and a stopper for stopping the chips on the rail is movable up and down and together with the rotating plate. The stopper is rotatably installed, and the vertical axis of the stopper is supported in contact with the elevating body placed below the rotary plate, and two or more distribution rails are installed at appropriate intervals around the rotary plate to receive chips from the inclined rail. Furthermore, the mechanism for sorting chips such as ICs has a configuration in which the lifting body is connected to the lifting shaft to move the stopper up and down independently of the rotation of the rotary plate. (2) The mechanism for sorting chips such as ICs according to claim 1, wherein the stopper is always at a position where the chips are stopped, and moves up and down from the stopped state to the passing state for chips with no abnormality. (3) The mechanism for sorting chips such as ICs according to claim 2, wherein one of the sorting rails is arranged linearly with the inclined rail. (4) The distribution mechanism for chips such as ICs according to any one of claims 1 to 3, wherein the rotating shaft is a rotating shaft of a pulse motor.