JPS6271510U - - Google Patents
Info
- Publication number
- JPS6271510U JPS6271510U JP16313485U JP16313485U JPS6271510U JP S6271510 U JPS6271510 U JP S6271510U JP 16313485 U JP16313485 U JP 16313485U JP 16313485 U JP16313485 U JP 16313485U JP S6271510 U JPS6271510 U JP S6271510U
- Authority
- JP
- Japan
- Prior art keywords
- dimension measuring
- measuring device
- optical dimension
- operating information
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 10
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- 230000005856 abnormality Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985163134U JPH048325Y2 (enExample) | 1985-10-24 | 1985-10-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985163134U JPH048325Y2 (enExample) | 1985-10-24 | 1985-10-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6271510U true JPS6271510U (enExample) | 1987-05-07 |
| JPH048325Y2 JPH048325Y2 (enExample) | 1992-03-03 |
Family
ID=31091050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985163134U Expired JPH048325Y2 (enExample) | 1985-10-24 | 1985-10-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH048325Y2 (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS587372U (ja) * | 1981-07-06 | 1983-01-18 | 沖電気工業株式会社 | 過電流保護回路付レ−ザダイオ−ド駆動回路 |
-
1985
- 1985-10-24 JP JP1985163134U patent/JPH048325Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS587372U (ja) * | 1981-07-06 | 1983-01-18 | 沖電気工業株式会社 | 過電流保護回路付レ−ザダイオ−ド駆動回路 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH048325Y2 (enExample) | 1992-03-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4061427A (en) | Laser extensometer | |
| JPH01291102A (ja) | 光学式センサ装置 | |
| KR900013476A (ko) | 방사선 출사 장치의 모니터 감도 결정 방법 및 이 장치의 제어 시스템 | |
| JP2675827B2 (ja) | レーザ走査装置 | |
| JPS6271510U (enExample) | ||
| JPS6271511U (enExample) | ||
| JPS6311634Y2 (enExample) | ||
| JPH0191264U (enExample) | ||
| KR200144344Y1 (ko) | 파이프 내부검사장치의 레이저다이오드 출력 제어회로 | |
| JPH0325135U (enExample) | ||
| SU1575141A1 (ru) | Устройство контрол ресурса квантово-электронных передающих модулей | |
| JPH0638069B2 (ja) | 示差屈折計 | |
| JPS6065659A (ja) | 半導体レ−ザ光源装置 | |
| JPS6177709A (ja) | 表面粗さ計測装置 | |
| JPH051991B2 (enExample) | ||
| JPS63124971A (ja) | レ−ザ−ダイオ−ド駆動制御装置 | |
| SU1471069A1 (ru) | Устройство дл измерени геометрических параметров поверхностей | |
| JPH0534564U (ja) | 光熱レンズ分析装置 | |
| JPS6031294B2 (ja) | ビディオ信号安定化装置 | |
| SU144316A1 (ru) | Прибор дл контрол неровноты нити | |
| KR200217139Y1 (ko) | 적외발광소자2차광제거장치 | |
| JP2831539B2 (ja) | 光学式寸法測定装置 | |
| JP3110139B2 (ja) | 光ファイバ温度センサ | |
| JPS6255180U (enExample) | ||
| JPS61239690A (ja) | 半導体レ−ザ装置 |