JPS6269141A - Microhardness tester - Google Patents

Microhardness tester

Info

Publication number
JPS6269141A
JPS6269141A JP21049285A JP21049285A JPS6269141A JP S6269141 A JPS6269141 A JP S6269141A JP 21049285 A JP21049285 A JP 21049285A JP 21049285 A JP21049285 A JP 21049285A JP S6269141 A JPS6269141 A JP S6269141A
Authority
JP
Japan
Prior art keywords
load
indenter
penetration
sample
depth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21049285A
Other languages
Japanese (ja)
Other versions
JPH0648236B2 (en
Inventor
Toshio Sada
登志夫 佐田
Akio Kono
河野 彰夫
Kenichi Kanazawa
金沢 憲一
Yoshio Tashiro
田代 良雄
Hiroharu Yamada
山田 弘治
Masaaki Inoue
井上 政明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
RIKEN Institute of Physical and Chemical Research
Original Assignee
Shimadzu Corp
RIKEN Institute of Physical and Chemical Research
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, RIKEN Institute of Physical and Chemical Research filed Critical Shimadzu Corp
Priority to JP60210492A priority Critical patent/JPH0648236B2/en
Publication of JPS6269141A publication Critical patent/JPS6269141A/en
Publication of JPH0648236B2 publication Critical patent/JPH0648236B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To measure exactly hardness by a penetrating operation of once by constituting the titled tester so that a load applied to an indenter is varied gradually, and on the other hand, the depth of penetration in each load is detected, and correlation of the load and the depths of penetration is detected. CONSTITUTION:A sample S is placed on a sample base, and in a state that an indenter 8 is made to contact to the surface of the sample S, turning of a lever 6 is stopped, and a zero point is set. Subsequently, when a measurement is started, a control device 12 reads out a load data which is stored in a RAM 12a, and outputs it to a solenoid driving circuit 14. As a result, a current which coincides with a set load which is read out is supplied to a solenoid 9, and a set load DELTAP is applied to the indenter 8. The depth of penetration which is generated in this case is detected 11 and outputted to the device 12, and the device 12 smoothens the load value applied to the indenter 8 and the depth of penetration, and thereafter, outputs them to a recording device 15, and the depth of penetration in the load DELTAP is recorded. In such a way, a solenoid current is increased by DELTAI each, the set load is increased by DELTAP each, the depth of penetration of the indenter 8 in each load point is detected successively and recorded 15, an inclination of a curve is measured, and hardness of the sample is measured.

Description

【発明の詳細な説明】 (産業上の利用分In) 本発明は、薄膜試料のビッカース硬度測定に適した微小
硬度計に関する。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Application In) The present invention relates to a microhardness meter suitable for measuring the Vickers hardness of thin film samples.

(従来技術) 金属蒸着膜や半導体基板トの絶縁ll!2等の薄膜の硬
度は、尖端の曲率半径120nm程度の角錐からなる圧
子を100mg−wt程度の一定荷正で薄膜に押込み、
このときの薄膜への喰い込み深さを測定することにより
行なわれていた。
(Prior art) Insulation of metal evaporated films and semiconductor substrates! The hardness of a grade 2 thin film is determined by pressing an indenter made of a pyramid with a radius of curvature of about 120 nm at the tip into the thin film with a constant load of about 100 mg-wt.
This was done by measuring the depth of penetration into the thin film at this time.

すなわち、JAPAN JOURNAL APPLIE
D PHYS+C91972年11月号第758頁に示
されたよ月収第758頁る一ド向きの力(荷重W)とL
向きの力(試料からの抗力R)とのバランスを歪ゲージ
でとりなから圧子尖端の侵入深さを測定する微小硬度計
は。
In other words, JAPAN JOURNAL APPLIE
D As shown on page 758 of the November 1972 issue of PHYS+C9, the force (load W) in the direction of the monthly income on page 758 and L
A microhardness meter measures the penetration depth of the indenter tip by using a strain gauge to balance the force in the direction (resistance R from the sample).

圧子に荷重が加わっていないのとき(W=O)の歪ゲー
ジの出力をEo とし、圧子に所定の荷重Wを加え、そ
のときの歪ゲージの出力)Eとし、次いで、桿(天秤)
全降下して圧子をスキ1に侵入させていき、歪ゲージの
出力が減少してE=Ea に等シ、<なったときの圧子
の侵入深さを、程の他端に設けた変位測定装置により求
めるよさに構成されている。
Let Eo be the output of the strain gauge when no load is applied to the indenter (W=O), then let Eo be the output of the strain gauge when a predetermined load W is applied to the indenter, and then let Eo be the output of the strain gauge when no load is applied to the indenter (W=O).
When the indenter is fully lowered and penetrates into gap 1, the output of the strain gauge decreases to E=Ea, and the displacement depth of the indenter is measured at the other end of the gap. It is configured to the desired quality depending on the device.

しかしながら、圧子に作/rlさせる荷重か極めて小さ
いため、荷1毛付!J−機構等の摩擦によるオフセ、・
・トの影響を受け、付ダした荷Φ、と実際に圧子に作用
する4:1爪との間にノヘラつきを生じる。このため多
数FCすの測定を実施してモ均イ〆1を求める心霊があ
り、1つの試本4についての411定に時間を要すると
いう問題があった。
However, since the load applied to the indenter is extremely small, only one load is required! Offset due to friction of J-mechanism, etc.
・Under the influence of For this reason, there is a desire to carry out measurements on a large number of FCs to obtain a uniform value of 1, and there is a problem in that it takes time to determine 411 for one sample 4.

(目的) 本発明はこのような問題に鑑みてなされたものであって
、その目的とするところは、1回の押込み操作により正
確に硬度を測定することができる微小硬度計を提供する
ことである。
(Purpose) The present invention has been made in view of the above problems, and its purpose is to provide a microhardness meter that can accurately measure hardness with a single pushing operation. be.

(構成) すなわち1本発明が特徴とするところは、第1図に示し
たように、予め定められた増分で変化する電流を出力す
るソレノイド′11i流制御手段1により電磁力発生用
のソレノイド2を制御して圧子3への荷重を連続的に変
化させ、このときの試料Sへの圧子3の喰込み量を変位
検出手段4により検出する一方、ソレノイド電流制御手
段1からの電流増分イσに変位検出手段4からの出力を
荷重−喰込み量相関検出手段5に出力して荷重と喰込み
硅の相関を検出するようにした点にある。
(Structure) In other words, 1. The present invention is characterized by, as shown in FIG. is controlled to continuously change the load on the indenter 3, and the amount of penetration of the indenter 3 into the sample S at this time is detected by the displacement detection means 4, while the current increment σ from the solenoid current control means 1 is Another feature is that the output from the displacement detecting means 4 is output to the load-cutting-in amount correlation detecting means 5 to detect the correlation between the load and the cutting-in amount.

そこで以下に本発明の詳細を図示した実施例に居づいて
説明する。
Therefore, the details of the present invention will be explained below with reference to illustrated embodiments.

第2図は本発明の一実施例を示すものであって1図中符
号6は、中央部をナイフエフシフにより軸支した積杆で
、一端に角錐状の圧子8が、また他端にはツレ/イド9
と協動じて電磁力を発生する鉄心lOが取付けられ、さ
らに圧子8の上部には支持体により基台に取付けられた
コイル11aとtl;a動して変位検出器11を構成す
るコアー11bが取付けられている。12は、制御装置
であって、予め定められたステップにより荷重を印加す
る荷重プログラムを格納したRAM12aと、荷重の付
与開始からデータ処理に至るル制御を行なうプログラム
を格納したROM12bと、前記ROMI 2 bによ
り作動するCPU12cからなり、アナログ−ディジタ
ル変換器13を介して変位検出器11からの変位信号が
入力し、また後述するソレノイド駆動回路14への信号
の入出力、及び荷重と喰込みμの相関を検出するための
X−Yレコーダを備えた記録装置15に荷重信号と変位
信号を出力するように構成されている。14は、前述の
ソレノイド駆動回路で、制御装置12から出力された荷
重信号を変換するディジタル−アナログ変換器14aと
、この変換器14aからの信号を電流値に変換してソレ
ノイド9に供給する電圧−電流変換器14bと、ソレノ
イド9に供給された電流をディジタル信号に変換して制
御装置12に出力するアナログ−ディジタル変換器14
cからなり、制御装′j!112からの荷重信号に一致
した電流をソレノイドに供給するように構成されている
FIG. 2 shows an embodiment of the present invention, and the reference numeral 6 in FIG. 1 is a stacking rod whose center part is supported by a knife-f-shift, and a pyramid-shaped indenter 8 is attached to one end, and a pyramid-shaped indenter is attached to the other end. /id9
An iron core 10 is attached to generate an electromagnetic force in cooperation with the indenter 8, and a coil 11a and a core 11b, which move and constitute a displacement detector 11, are attached to the upper part of the indenter 8 and are attached to a base with a support. installed. Reference numeral 12 denotes a control device, which includes a RAM 12a that stores a load program for applying a load in predetermined steps, a ROM 12b that stores a program that performs control from the start of applying a load to data processing, and the ROMI 2. The CPU 12c is operated by a CPU 12c, which receives displacement signals from the displacement detector 11 via an analog-digital converter 13, and also inputs and outputs signals to and from a solenoid drive circuit 14, which will be described later, and controls load and biting μ. It is configured to output the load signal and displacement signal to a recording device 15 equipped with an X-Y recorder for detecting correlation. 14 is the aforementioned solenoid drive circuit, which includes a digital-to-analog converter 14a that converts the load signal output from the control device 12, and a voltage that converts the signal from the converter 14a into a current value and supplies it to the solenoid 9. - a current converter 14b and an analog-digital converter 14 that converts the current supplied to the solenoid 9 into a digital signal and outputs it to the control device 12;
It consists of a control device ′j! The solenoid is configured to supply a current consistent with the load signal from 112 to the solenoid.

なお、図中符号16は、積杆6と基台間に接続されたダ
ンパーを、14dは、図示しない荷重レンジ選択スイン
チからの信′−)によりラッチ回路14eを介して駆動
されるレンジ!、IJ換回路をそれぞれ示す。
In the figure, reference numeral 16 denotes a damper connected between the stacking rod 6 and the base, and 14d denotes a range driven by a signal from a load range selection switch (not shown) via a latch circuit 14e. , IJ switching circuits are shown, respectively.

次に、このように構成した装置の動作を第3図に示した
フローチャートに1(づいて説明する。
Next, the operation of the apparatus configured as described above will be explained based on the flowchart shown in FIG.

試料台に試料Sを載置してスタートスイッチを押圧する
と、ソレノイド10に微小電流が供給され、積杆6を回
動させて圧子8を試料S表面に向かって移動させる。こ
の移動により圧子8が試料表面に接触すると、変位検出
器11からトリガ状の信号Pが出力される(第4図)、
制御装置12は、この信号を検知してソレノイド9に供
給している電流値を維持して圧子8を試料表面に接触さ
せた状態で積杆6の回動を停+)させ、同時に変位検出
信号と荷重信号をクリアして零点設定を行なう。
When the sample S is placed on the sample stage and the start switch is pressed, a minute current is supplied to the solenoid 10, which rotates the stacking rod 6 and moves the indenter 8 toward the surface of the sample S. When the indenter 8 comes into contact with the sample surface due to this movement, a trigger-like signal P is output from the displacement detector 11 (Fig. 4).
The control device 12 detects this signal, maintains the current value supplied to the solenoid 9, stops the rotation of the stacking rod 6 with the indenter 8 in contact with the sample surface, and simultaneously detects the displacement. Clear the signal and load signal and set the zero point.

このような予備操作が終Yした段階で、最大荷屯、荷重
の増加速度、変位レンジ笠の試験条件を設定して図示し
ない測定開始スイッチを抑圧すると、制御装置12は、
RAM12aに格納された荷重データを読出してソレノ
イド駆動回路14に出力する。これによりソレノイド9
には読出された設定荷重に一致する電流が供給され、圧
子8に第1段階の設定荷重ΔPが掛る。圧子8はこの荷
重ΔPを受けて試料Sの硬度に対応する喰い込み量を持
って試1−1Sに侵入する。このとき生じる喰い込み丑
は変位検出器11により検出されて制御装置12に出力
される。制御装置12は、圧子8に付与している荷重値
と喰い込み州を乎滑化したのち記録装置15に出力し、
荷重ΔPにおける喰い込み量を記録する。この記録が絆
rした時点で、ソレノイド駆動電流をΔIだけ増力口さ
せ荷重2ΔPとし、荷重2ΔPにおける喰い込み量を記
録する。
When such preliminary operations are completed, test conditions for maximum load capacity, load increase rate, and displacement range shade are set and a measurement start switch (not shown) is pressed, and the control device 12
The load data stored in the RAM 12a is read out and output to the solenoid drive circuit 14. This causes solenoid 9
A current corresponding to the read set load is supplied to the indenter 8, and the first stage set load ΔP is applied to the indenter 8. The indenter 8 receives this load ΔP and enters into the sample 1-1S with a biting amount corresponding to the hardness of the sample S. The biting that occurs at this time is detected by the displacement detector 11 and output to the control device 12. The control device 12 outputs the load value and the biting state applied to the indenter 8 to the recording device 15 after smoothing them.
Record the biting amount at load ΔP. When this recording reaches completion, the solenoid drive current is increased by ΔI to set the load to 2ΔP, and the amount of bite at the load of 2ΔP is recorded.

なお、この初期荷重の印加時点において摩擦等によりオ
フセットQが生じたとしても荷!丘を増加していく段階
において摩擦力に打勝って圧子に試験荷重が掛り始め、
以後は荷重の増加につれて試料の硬度に対応する喰い込
み量をもって圧子8が変位していく。
Note that even if an offset Q occurs due to friction etc. at the time of application of this initial load, the load will be lost! As the hill increases, the frictional force is overcome and the test load begins to be applied to the indenter.
Thereafter, as the load increases, the indenter 8 is displaced by a biting amount corresponding to the hardness of the sample.

以下、このようにしてソ1/ノイド電流をΔIずつ増加
させて設定荷重をΔPずつ増加させながら各荷重点にお
ける圧子8の喰い込みにを順次検出して記録装置15に
より記録する。これにより、記録紙上には第5図に示し
たように荷重を横軸に、また喰い込み賃を縦軸とする曲
線が描かれることになる。云うまでもなく、記録紙に描
かれた曲線の傾きは、試料の硬度と相関関係を持つから
、曲線の傾きを測定することにより試料の硬度を知るこ
とができる。
Thereafter, in this manner, the indentation of the indenter 8 at each load point is sequentially detected and recorded by the recording device 15 while increasing the solenoid current by ΔI and increasing the set load by ΔP. As a result, a curve is drawn on the recording paper, as shown in FIG. 5, with the load on the horizontal axis and the cut-in amount on the vertical axis. Needless to say, the slope of the curve drawn on the recording paper has a correlation with the hardness of the sample, so the hardness of the sample can be determined by measuring the slope of the curve.

このようにL2て、試験荷重が、ニジ定されたh量大荷
重に′L11達すると、この荷Φ、を所定時間士・−ル
ドした後、荷重を除去して喰い込みH,5を検出して硬
度を算出してプリントアウトする。
In this way, when the test load reaches the predetermined h amount large load 'L11 at L2, this load Φ is held for a predetermined time, the load is removed, and the biting H,5 is detected. Calculate the hardness and print it out.

なお、この実施例においては、荷重と喰い込み一■との
相関関係を記録紙に描かせるようにしているが、ディス
゛/レイ装胃等に表4:Xすることもでき、さらにはC
P Uにより演算させるようにできることは云うまでも
ない。
In this embodiment, the correlation between the load and the biting depth is drawn on the recording paper, but Table 4:
Needless to say, it is possible to perform calculations using PU.

また、−に述の実施例においては、圧r−と試#1の接
触時点を変位検出器からの信弓により検出しているが、
圧子を挟んで受光素子と発光素イーを配設して接触時に
おける光量度化から検出することもできる。
In addition, in the embodiment described in -, the point of contact between the pressure r- and sample #1 is detected by the bow from the displacement detector;
It is also possible to arrange a light-receiving element and a light-emitting element E with an indenter in between, and detect from the intensity of light upon contact.

(効果) 以り、説明したように未発明によれば、圧fに+J″j
−する荷重を徐々に変化させる一方、各荷重における喰
い込み;11−を検出して荷・丘と喰い込みFdの相関
関係を検出するようにしたの〒、圧子移動機構等に生じ
る摩擦によるオフヤ;・トに拘わりなく、1回の押込み
操作により試おlの硬度を正確に測定することができる
。また1個所での測定により正確なデータを得ることが
できるため、試料面への圧子の設定等の予備操作に要す
る時間を大幅にmWすることができるばかりでなく、同
一の測定点で荷重を変化させて測定するため、深さ方向
の硬度分布を測定することが可能となる。
(Effect) As explained above, according to the invention, the pressure f is +J″j
11- is detected at each load, and the correlation between the load/hill and the biting Fd is detected. ;-The hardness of the sample can be accurately measured with a single pushing operation, regardless of the size. In addition, since accurate data can be obtained by measuring at one location, not only can the time required for preliminary operations such as setting the indenter on the sample surface be significantly reduced, but also the load can be applied at the same measurement point. Since the measurement is performed by changing the hardness, it is possible to measure the hardness distribution in the depth direction.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の構成を明示するブロック図、第2図は
本発明の実施例を示すブロフク図、第3図は同上装置の
動作を示すフローチャート、第4図は同上装置の動作を
示す波形図、及び第51−4は同上装置の出力を示す特
性図である。 6・・・・積杆    8・・・・圧子9・・・・ソレ
ノイド 11・・・・変位検出器12・・・・制御装置
 14・・・・ソレノイド駆動回路15・・・・記録装
置 出願人 理化学研究所(ほか1名) 代理人 弁理士  eり 川 慶 治 回     木  村  勝  彦 第1図 〃力〃〃〃ケブ 一ト    何l 第2図
Fig. 1 is a block diagram clearly showing the configuration of the present invention, Fig. 2 is a block diagram showing an embodiment of the invention, Fig. 3 is a flowchart showing the operation of the same device, and Fig. 4 is a block diagram showing the operation of the same device. A waveform diagram and No. 51-4 are characteristic diagrams showing the output of the same device. 6...Stacking rod 8...Indenter 9...Solenoid 11...Displacement detector 12...Control device 14...Solenoid drive circuit 15...Recording device application Person RIKEN (and 1 other person) Agent Patent attorney Keiji Kawa Katsuhiko Kimura Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 電磁力発生手段からの荷重を受ける圧子と、該圧子の変
位を検出する変位検出手段を備えるとともに、予め定め
られた増分で変化する電流を前記電磁力発生手段に出力
するソレノイド電流制御手段と、前記増分毎に前記変位
検出手段からの出力を検出して荷重と喰込み量の相関を
出力する相関検出手段からなる微小硬度計。
a solenoid current control means that includes an indenter receiving a load from the electromagnetic force generation means and a displacement detection means for detecting displacement of the indenter, and outputs a current that changes in predetermined increments to the electromagnetic force generation means; A microhardness meter comprising a correlation detection means for detecting the output from the displacement detection means for each increment and outputting a correlation between the load and the biting amount.
JP60210492A 1985-09-24 1985-09-24 Micro hardness tester Expired - Lifetime JPH0648236B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60210492A JPH0648236B2 (en) 1985-09-24 1985-09-24 Micro hardness tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60210492A JPH0648236B2 (en) 1985-09-24 1985-09-24 Micro hardness tester

Publications (2)

Publication Number Publication Date
JPS6269141A true JPS6269141A (en) 1987-03-30
JPH0648236B2 JPH0648236B2 (en) 1994-06-22

Family

ID=16590244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60210492A Expired - Lifetime JPH0648236B2 (en) 1985-09-24 1985-09-24 Micro hardness tester

Country Status (1)

Country Link
JP (1) JPH0648236B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008180669A (en) * 2007-01-26 2008-08-07 Mitsutoyo Corp Hardness testing machine

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3195590B2 (en) 1999-04-27 2001-08-06 日東電工株式会社 Flexible wiring board

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5879249U (en) * 1981-11-24 1983-05-28 セイコーエプソン株式会社 Variable load hardness tester

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5879249U (en) * 1981-11-24 1983-05-28 セイコーエプソン株式会社 Variable load hardness tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008180669A (en) * 2007-01-26 2008-08-07 Mitsutoyo Corp Hardness testing machine

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