JPS626179B2 - - Google Patents
Info
- Publication number
- JPS626179B2 JPS626179B2 JP52101825A JP10182577A JPS626179B2 JP S626179 B2 JPS626179 B2 JP S626179B2 JP 52101825 A JP52101825 A JP 52101825A JP 10182577 A JP10182577 A JP 10182577A JP S626179 B2 JPS626179 B2 JP S626179B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- inspection
- circuit
- field
- level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sorting Of Articles (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10182577A JPS5434886A (en) | 1977-08-24 | 1977-08-24 | Inspector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10182577A JPS5434886A (en) | 1977-08-24 | 1977-08-24 | Inspector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5434886A JPS5434886A (en) | 1979-03-14 |
JPS626179B2 true JPS626179B2 (enrdf_load_stackoverflow) | 1987-02-09 |
Family
ID=14310877
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10182577A Granted JPS5434886A (en) | 1977-08-24 | 1977-08-24 | Inspector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5434886A (enrdf_load_stackoverflow) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5669537A (en) * | 1979-11-12 | 1981-06-10 | Fuji Electric Co Ltd | Defect inspection device |
JPS595940A (ja) * | 1982-07-01 | 1984-01-12 | Ketsuto Kagaku Kenkyusho:Kk | 粒状物の不良粒検出方法およびその装置 |
JPS60178910U (ja) * | 1984-05-09 | 1985-11-28 | 林薬品機械株式会社 | 欠け錠剤検査装置 |
JPS6130750A (ja) * | 1984-07-23 | 1986-02-13 | Miyuuchiyuaru:Kk | 固型製剤品の外観検査方法 |
JP6154406B2 (ja) * | 2015-01-14 | 2017-06-28 | 株式会社ダイシン | 搬送物検査システム及び搬送装置 |
JP6189978B2 (ja) * | 2016-01-08 | 2017-08-30 | 株式会社ダイシン | 搬送物判別制御システム及び搬送装置 |
JP7244823B2 (ja) * | 2019-01-15 | 2023-03-23 | 株式会社ダイシン | 搬送管理システム及び搬送装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3746784A (en) * | 1971-08-16 | 1973-07-17 | Ball Corp | Electronic defect detecting apparatus |
-
1977
- 1977-08-24 JP JP10182577A patent/JPS5434886A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5434886A (en) | 1979-03-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5033015A (en) | Automated system for testing an imaging sensor | |
JPH04166751A (ja) | びんの欠陥検査方法 | |
GB2104214A (en) | Inspection system | |
JP4013551B2 (ja) | 透孔内異物検査方法及び透孔内異物検査装置 | |
JPS626179B2 (enrdf_load_stackoverflow) | ||
US4240107A (en) | Apparatus and method for pattern information processing | |
US4310850A (en) | Solid-state video camera having a video signal processor | |
KR20040076255A (ko) | 구리박 검사장치, 구리박 검사방법, 결함검사장치,결함검사방법 | |
JPH08313454A (ja) | 画像処理装置 | |
JPH0694660A (ja) | 表面欠陥検査方法及び装置 | |
JPH038504B2 (enrdf_load_stackoverflow) | ||
JP3506161B2 (ja) | 農水産物の外観検査装置 | |
JPH11248643A (ja) | 透明フィルムの異物検査装置 | |
JP3332175B2 (ja) | 周期性パターンの欠陥検査方法 | |
JPS63149547A (ja) | 壜の検査装置 | |
KR830001829B1 (ko) | 결합 검출용 검사장치 | |
EP0428626B1 (en) | Automated system for testing an imaging sensor | |
JP3218909B2 (ja) | 検査方法およびその装置 | |
JPS6216372B2 (enrdf_load_stackoverflow) | ||
JPS6373139A (ja) | 表面検査装置 | |
JPH0829357A (ja) | 自動化ライン外観検査装置 | |
JP3035578B2 (ja) | 検査条件決定装置、検査装置及びシャッタ速度決定装置 | |
JPH0551944B2 (enrdf_load_stackoverflow) | ||
Asundi et al. | Automated visual inspection of moving objects | |
JPS6216373B2 (enrdf_load_stackoverflow) |