JPS6258779U - - Google Patents
Info
- Publication number
- JPS6258779U JPS6258779U JP15029585U JP15029585U JPS6258779U JP S6258779 U JPS6258779 U JP S6258779U JP 15029585 U JP15029585 U JP 15029585U JP 15029585 U JP15029585 U JP 15029585U JP S6258779 U JPS6258779 U JP S6258779U
- Authority
- JP
- Japan
- Prior art keywords
- floating plate
- main body
- socket
- stopper
- guide pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Connecting Device With Holders (AREA)
Description
第１図は本考案のＩＣソケツトの縦断面図、第
２図はフローテイングプレートが上昇した状態の
一部分の拡大断面図、第３図ａ，ｂは大型及び小
型ＩＣを使用する場合の比較図である。
１……本体、２……スプリングローブ、３……
ガイドピン、３ａ……ストツパ、４……フローテ
イングプレート、６……ＩＣ、７……カバー板、
８……押え部材。
Figure 1 is a vertical sectional view of the IC socket of the present invention, Figure 2 is an enlarged sectional view of a portion of the socket with the floating plate raised, and Figures 3a and b are comparison diagrams when using large and small ICs. It is. 1...Main body, 2...Spring robe, 3...
Guide pin, 3a... Stopper, 4... Floating plate, 6... IC, 7... Cover plate,
8... Pressing member.
Claims (1)
の本体上に上下動可能に取付けられかつ上方へ弾
圧されているフローテイングプレートと、このフ
ローテイングプレート上に検査されるべきＩＣを
挟んで載置されるカバー板とを備えたＩＣソケツ
トにおいて、 前記フローテイングプレートを上下方向にのみ
可動せしめるガイドピンの上端のストツパを着脱
可能な構造とし、前記フローテイングプレートを
交換可能な構造としたことを特徴とするＩＣソケ
ツト。[Claims for Utility Model Registration] A main body provided with a plurality of spring probes, a floating plate mounted on the main body so as to be movable up and down and pressed upward, and a device to be inspected on the floating plate. In an IC socket equipped with a cover plate on which an IC is placed, the stopper at the upper end of a guide pin that allows the floating plate to move only in the vertical direction has a removable structure, and the floating plate is replaceable. An IC socket characterized by its structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15029585U JPS6258779U (en) | 1985-09-30 | 1985-09-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15029585U JPS6258779U (en) | 1985-09-30 | 1985-09-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6258779U true JPS6258779U (en) | 1987-04-11 |
Family
ID=31066304
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15029585U Pending JPS6258779U (en) | 1985-09-30 | 1985-09-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6258779U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6442477U (en) * | 1987-09-08 | 1989-03-14 | ||
| JP2006331666A (en) * | 2005-05-23 | 2006-12-07 | Nec Electronics Corp | Ic socket |
| JP2009152000A (en) * | 2007-12-19 | 2009-07-09 | Nec Electronics Corp | Socket for semiconductor device |
| CN104297535A (en) * | 2013-07-16 | 2015-01-21 | 日置电机株式会社 | Probe unit and substrate inspection device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5153164U (en) * | 1974-10-16 | 1976-04-22 | ||
| JPS57560A (en) * | 1980-05-31 | 1982-01-05 | Nippon Denpa Kk | Tester for electric apparatus having connecting pin |
| JPS5824871A (en) * | 1981-08-06 | 1983-02-14 | Fujitsu Ltd | Package measuring jig for semiconductor |
-
1985
- 1985-09-30 JP JP15029585U patent/JPS6258779U/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5153164U (en) * | 1974-10-16 | 1976-04-22 | ||
| JPS57560A (en) * | 1980-05-31 | 1982-01-05 | Nippon Denpa Kk | Tester for electric apparatus having connecting pin |
| JPS5824871A (en) * | 1981-08-06 | 1983-02-14 | Fujitsu Ltd | Package measuring jig for semiconductor |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6442477U (en) * | 1987-09-08 | 1989-03-14 | ||
| JP2006331666A (en) * | 2005-05-23 | 2006-12-07 | Nec Electronics Corp | Ic socket |
| JP2009152000A (en) * | 2007-12-19 | 2009-07-09 | Nec Electronics Corp | Socket for semiconductor device |
| CN104297535A (en) * | 2013-07-16 | 2015-01-21 | 日置电机株式会社 | Probe unit and substrate inspection device |
| JP2015021726A (en) * | 2013-07-16 | 2015-02-02 | 日置電機株式会社 | Probe unit and substrate inspection device |