JPS6442477U

JPS6442477U -

Info

Publication number: JPS6442477U
Application number: JP13706787U
Authority: JP
Priority date: 1987-09-08
Filing date: 1987-09-08
Publication date: 1989-03-14
Anticipated expiration: 2002-09-08
Also published as: JPH0634706Y2

Description

[Brief explanation of the drawing]

第１図は、本考案の電子部品検査治具の一部切
り欠き側面図であり、第２図は、第１図の平面図
であり、第３図は、操作レバーを被検査電子部品
にコンタクトプローブが当接する位置とした第１
図のＡ―Ａ矢視断面図であり、第４図は、第１図
のＢ―Ｂ矢視断面図であり、第５図は、第１図の
Ｃ―Ｃ矢視断面図である。１：底面板、２：側面板、３：支柱、４：中間
固定板、５：支持ピン、６：電子部品載置板、７
：第１のバネ、８：コンタクトプローブ、１３：
縦軸、１３ａ：ラツク、１４：可動天板、１４ａ
：押圧部、１５：第２のバネ、１６：水平軸、１
７：平歯車、１９：揺動軸、２０：操作レバー、
２１：係止突起、２２：第３のバネ、２３：係止
板、２４：係止溝。 FIG. 1 is a partially cutaway side view of the electronic component testing jig of the present invention, FIG. 2 is a plan view of FIG. 1, and FIG. The first position is where the contact probe comes into contact.
4 is a sectional view taken along line BB in FIG. 1, and FIG. 5 is a sectional view taken along line CC in FIG. 1. 1: Bottom plate, 2: Side plate, 3: Support column, 4: Intermediate fixing plate, 5: Support pin, 6: Electronic component mounting plate, 7
: first spring, 8: contact probe, 13:
Vertical axis, 13a: Rack, 14: Movable top plate, 14a
: Pressing part, 15: Second spring, 16: Horizontal axis, 1
7: Spur gear, 19: Swing shaft, 20: Operation lever,
21: Locking protrusion, 22: Third spring, 23: Locking plate, 24: Locking groove.

Claims

[Scope of utility model registration request]

A horizontal intermediate fixing plate is installed on the machine frame, and support pins are placed on the top of this intermediate fixing plate to prevent lateral displacement and limit the upward movement distance, allowing the electronic component mounting plate to move vertically. The electronic component mounting plate is elastically biased upward by a first spring so that the electronic component mounting plate faces from below to the inspection point of the electronic component to be tested that is placed on the upper surface of the electronic component mounting plate. A contact probe is arranged on the intermediate fixed plate, a vertical shaft with a rack carved in the machine frame is arranged so as to be movable up and down, and the object placed on the electronic component mounting plate is placed on the upper part of this vertical shaft. A movable top plate having a pressing part that presses the electronic component to be inspected downward is provided, and this movable top plate is elastically biased upward by a second spring to rotate around a horizontal axis on the machine frame. A spur gear is fixedly disposed on the horizontal shaft and meshes with the rack of the vertical shaft, and one end of the spur gear is operated by a swing shaft disposed perpendicular to the axial direction of the horizontal shaft. A lever is arranged to be swingable, a locking protrusion is provided protruding from one side surface of the operating lever in the swinging direction, and a third spring elastically biases the locking protrusion in the protruding direction. , a locking plate with which the locking protrusion makes elastic contact is disposed on the side of the operating lever, and the contact probe is pressed against the electronic component to be tested by rotating the operating lever around the horizontal axis. An electronic component inspection jig, characterized in that a locking groove into which the locking protrusion is inserted is formed in the locking plate at a position.