JPS6257067B2 - - Google Patents

Info

Publication number
JPS6257067B2
JPS6257067B2 JP55029509A JP2950980A JPS6257067B2 JP S6257067 B2 JPS6257067 B2 JP S6257067B2 JP 55029509 A JP55029509 A JP 55029509A JP 2950980 A JP2950980 A JP 2950980A JP S6257067 B2 JPS6257067 B2 JP S6257067B2
Authority
JP
Japan
Prior art keywords
sample
nozzle
jet
working gas
gasified
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55029509A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56126241A (en
Inventor
Arata Tsuge
Iwao Fujishima
Kunyuki Kitagawa
Masaaki Yanagisawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jasco Corp
Original Assignee
Nihon Bunko Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Bunko Kogyo KK filed Critical Nihon Bunko Kogyo KK
Priority to JP2950980A priority Critical patent/JPS56126241A/ja
Publication of JPS56126241A publication Critical patent/JPS56126241A/ja
Publication of JPS6257067B2 publication Critical patent/JPS6257067B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0454Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for vaporising using mechanical energy, e.g. by ultrasonic vibrations

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2950980A 1980-03-07 1980-03-07 Method and apparatus for introducing a sample into an analyzer Granted JPS56126241A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2950980A JPS56126241A (en) 1980-03-07 1980-03-07 Method and apparatus for introducing a sample into an analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2950980A JPS56126241A (en) 1980-03-07 1980-03-07 Method and apparatus for introducing a sample into an analyzer

Publications (2)

Publication Number Publication Date
JPS56126241A JPS56126241A (en) 1981-10-03
JPS6257067B2 true JPS6257067B2 (enrdf_load_stackoverflow) 1987-11-28

Family

ID=12278058

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2950980A Granted JPS56126241A (en) 1980-03-07 1980-03-07 Method and apparatus for introducing a sample into an analyzer

Country Status (1)

Country Link
JP (1) JPS56126241A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0399171A (ja) * 1989-09-11 1991-04-24 Matsushita Electric Ind Co Ltd ヒートポンプ式空気調和機
CN1331400C (zh) * 2005-11-10 2007-08-15 上海交通大学 复合光触媒抗菌剂的制备方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4814612A (en) * 1983-08-30 1989-03-21 Research Corporation Method and means for vaporizing liquids for detection or analysis
US4730111A (en) * 1983-08-30 1988-03-08 Research Corporation Ion vapor source for mass spectrometry of liquids
US4861989A (en) * 1983-08-30 1989-08-29 Research Corporation Technologies, Inc. Ion vapor source for mass spectrometry of liquids
JPS61193062A (ja) * 1985-02-21 1986-08-27 Okazaki Kokuritsu Kyodo Kenkyu Kikouchiyou 液体クロマトグラフ・質量分析器直結用インタ−フエ−ス装置
JPH0722727B2 (ja) * 1986-05-08 1995-03-15 スペクトラム コントロール インコーポレーテツド モノマー液体の霧化及び気化蒸着装置
JP2528837B2 (ja) * 1986-10-11 1996-08-28 孝雄 津田 液体クロマトグラフから質量分析計への試料導入方法およびその導入器
DE10014962A1 (de) 2000-03-25 2001-10-04 Gsf Forschungszentrum Umwelt Pulsbares Kapillarventil
FR2817088B1 (fr) * 2000-11-17 2003-02-21 Mecanique Magnetique Sa Machine tournante a butee axiale magnetique integrant une generatrice de courant
JP4521255B2 (ja) * 2004-11-29 2010-08-11 株式会社日立ハイテクノロジーズ キャピラリーカラム接続部材及びエレクトロスプレーイオン源
JP5663725B2 (ja) * 2010-09-03 2015-02-04 学校法人日本大学 質量分析装置用試料導入装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0399171A (ja) * 1989-09-11 1991-04-24 Matsushita Electric Ind Co Ltd ヒートポンプ式空気調和機
CN1331400C (zh) * 2005-11-10 2007-08-15 上海交通大学 复合光触媒抗菌剂的制备方法

Also Published As

Publication number Publication date
JPS56126241A (en) 1981-10-03

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