JPS56126241A - Method and apparatus for introducing a sample into an analyzer - Google Patents

Method and apparatus for introducing a sample into an analyzer

Info

Publication number
JPS56126241A
JPS56126241A JP2950980A JP2950980A JPS56126241A JP S56126241 A JPS56126241 A JP S56126241A JP 2950980 A JP2950980 A JP 2950980A JP 2950980 A JP2950980 A JP 2950980A JP S56126241 A JPS56126241 A JP S56126241A
Authority
JP
Japan
Prior art keywords
nozzle
analyzer
column
sample
concentration chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2950980A
Other languages
English (en)
Other versions
JPS6257067B2 (ja
Inventor
Arata Tsuge
Iwao Fujishima
Kuniyuki Kitagawa
Masaaki Yanagisawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jasco Corp
Original Assignee
Japan Spectroscopic Co Ltd
Nihon Bunko Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Spectroscopic Co Ltd, Nihon Bunko Kogyo KK filed Critical Japan Spectroscopic Co Ltd
Priority to JP2950980A priority Critical patent/JPS56126241A/ja
Publication of JPS56126241A publication Critical patent/JPS56126241A/ja
Publication of JPS6257067B2 publication Critical patent/JPS6257067B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0454—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for vaporising using mechanical energy, e.g. by ultrasonic vibrations

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2950980A 1980-03-07 1980-03-07 Method and apparatus for introducing a sample into an analyzer Granted JPS56126241A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2950980A JPS56126241A (en) 1980-03-07 1980-03-07 Method and apparatus for introducing a sample into an analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2950980A JPS56126241A (en) 1980-03-07 1980-03-07 Method and apparatus for introducing a sample into an analyzer

Publications (2)

Publication Number Publication Date
JPS56126241A true JPS56126241A (en) 1981-10-03
JPS6257067B2 JPS6257067B2 (ja) 1987-11-28

Family

ID=12278058

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2950980A Granted JPS56126241A (en) 1980-03-07 1980-03-07 Method and apparatus for introducing a sample into an analyzer

Country Status (1)

Country Link
JP (1) JPS56126241A (ja)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61193062A (ja) * 1985-02-21 1986-08-27 Okazaki Kokuritsu Kyodo Kenkyu Kikouchiyou 液体クロマトグラフ・質量分析器直結用インタ−フエ−ス装置
JPS62289259A (ja) * 1986-05-08 1987-12-16 スペクトラム　コントロール　インコーポレーテツド モノマー液体の霧化及び気化蒸着装置
US4730111A (en) * 1983-08-30 1988-03-08 Research Corporation Ion vapor source for mass spectrometry of liquids
JPS6395348A (ja) * 1986-10-11 1988-04-26 Takao Tsuda 液体クロマトグラフから質量分析計への試料導入方法およびその導入器
US4814612A (en) * 1983-08-30 1989-03-21 Research Corporation Method and means for vaporizing liquids for detection or analysis
US4861989A (en) * 1983-08-30 1989-08-29 Research Corporation Technologies, Inc. Ion vapor source for mass spectrometry of liquids
WO2001073328A1 (de) * 2000-03-25 2001-10-04 GSF - Forschungszentrum für Umwelt und Gesundheit GmbH Pulsbares kapillarventil
US6927517B2 (en) * 2000-11-17 2005-08-09 Societe De Mecanique Magnetique Rotary machine with axial stop incorporating a current generator
JP2006153603A (ja) * 2004-11-29 2006-06-15 Hitachi High-Technologies Corp キャピラリーカラム接続部材及びエレクトロスプレーイオン源
JP2012054172A (ja) * 2010-09-03 2012-03-15 Nihon Univ 質量分析装置用試料導入装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0399171A (ja) * 1989-09-11 1991-04-24 Matsushita Electric Ind Co Ltd ヒートポンプ式空気調和機
CN1331400C (zh) * 2005-11-10 2007-08-15 上海交通大学 复合光触媒抗菌剂的制备方法

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4730111A (en) * 1983-08-30 1988-03-08 Research Corporation Ion vapor source for mass spectrometry of liquids
US4814612A (en) * 1983-08-30 1989-03-21 Research Corporation Method and means for vaporizing liquids for detection or analysis
US4861989A (en) * 1983-08-30 1989-08-29 Research Corporation Technologies, Inc. Ion vapor source for mass spectrometry of liquids
JPS61193062A (ja) * 1985-02-21 1986-08-27 Okazaki Kokuritsu Kyodo Kenkyu Kikouchiyou 液体クロマトグラフ・質量分析器直結用インタ−フエ−ス装置
JPS62289259A (ja) * 1986-05-08 1987-12-16 スペクトラム　コントロール　インコーポレーテツド モノマー液体の霧化及び気化蒸着装置
JPS6395348A (ja) * 1986-10-11 1988-04-26 Takao Tsuda 液体クロマトグラフから質量分析計への試料導入方法およびその導入器
WO2001073328A1 (de) * 2000-03-25 2001-10-04 GSF - Forschungszentrum für Umwelt und Gesundheit GmbH Pulsbares kapillarventil
US6854712B2 (en) 2000-03-25 2005-02-15 Gsf - Forschungszentrum For Unwelt Und Gesundheit Gmbh Capillary valve that can be pulsed
US6927517B2 (en) * 2000-11-17 2005-08-09 Societe De Mecanique Magnetique Rotary machine with axial stop incorporating a current generator
JP2006153603A (ja) * 2004-11-29 2006-06-15 Hitachi High-Technologies Corp キャピラリーカラム接続部材及びエレクトロスプレーイオン源
JP4521255B2 (ja) * 2004-11-29 2010-08-11 株式会社日立ハイテクノロジーズ キャピラリーカラム接続部材及びエレクトロスプレーイオン源
JP2012054172A (ja) * 2010-09-03 2012-03-15 Nihon Univ 質量分析装置用試料導入装置

Also Published As

Publication number Publication date
JPS6257067B2 (ja) 1987-11-28

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