JPS625639A - Lift-off method - Google Patents

Lift-off method

Info

Publication number
JPS625639A
JPS625639A JP14536585A JP14536585A JPS625639A JP S625639 A JPS625639 A JP S625639A JP 14536585 A JP14536585 A JP 14536585A JP 14536585 A JP14536585 A JP 14536585A JP S625639 A JPS625639 A JP S625639A
Authority
JP
Japan
Prior art keywords
layer
substrate
polyimide
film
lift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14536585A
Other languages
Japanese (ja)
Other versions
JPH0685398B2 (en
Inventor
Masayuki Shono
昌幸 庄野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP14536585A priority Critical patent/JPH0685398B2/en
Publication of JPS625639A publication Critical patent/JPS625639A/en
Publication of JPH0685398B2 publication Critical patent/JPH0685398B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To enable the form action of a polyimide layer of an overhanging structure by patterning the first layer made of polyimide formed on a substrate in the desired shape, so forming the second layer made of polyimide having smaller bonding force to the substrate than the first layer to coat it, and then organically treating it. CONSTITUTION:The first layer 2 of polyimide is formed on a substrate 1. A resist film 3 is selectively laminated on the layer 2. then, the layer 2 of trapezoidal section directly under the film 3 is allowed to remain and the other layer 2 is removed by etching with an etchant. Then, after the film 3 on the layer 2 is removed, the second layer 4 and the second resist film 5 made of polyimide are formed on the substrate 1. Then, with the film 5 as a mask the layer 4 except the portion directly under the film 5 is removed by etching and the film 5 is then removed. Subsequently, the end 4a of the layer 4 secured to the substrate 1 is separated from the substrate 1, and formed in an overhanging structure for the substrate 1.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明はリフトオフ法に関する。[Detailed description of the invention] (b) Industrial application field The present invention relates to a lift-off method.

(ロ)従来の技術 現在の半導体プロセスでは、フォトエツチング法でのパ
ターニングが困難な物質は、リフトオフ法を用いてパタ
ーニングを行う事が多い。
(B) Prior art In current semiconductor processes, materials that are difficult to pattern using photoetching are often patterned using lift-off.

リフトオフ法を用いる場合、通常フォトレジスト等をリ
フトオフ材に用いるが、レジストでは、高温の熱処理に
よって変質するため、熱処理前てリフトオフを行わなけ
ればならない。ところが、電極のアロイ後、ボンダビリ
ティ−の改善のためAI、4等を再度蒸着する場合には
、熱処理後にリフトオフを行う必要がある。
When using the lift-off method, a photoresist or the like is usually used as a lift-off material, but resist is altered by high-temperature heat treatment, so lift-off must be performed before heat treatment. However, if AI, 4, etc. are to be deposited again to improve bondability after alloying the electrode, it is necessary to perform lift-off after heat treatment.

リフトオフ材として金属やS i02などのオキサイド
膜を用いた場合は、熱処理後のリフトオフが可能である
が、金属を用いた場合、下地と熱処理時てアはイする危
険があり、またS i02などのオキサイド膜はリフト
オフ材以外の場所に用いられている場合使用できない。
If a metal or an oxide film such as Si02 is used as the lift-off material, lift-off is possible after heat treatment. However, if metal is used, there is a risk of contact with the base during heat treatment, and if the material is The oxide film cannot be used if it is used in areas other than lift-off materials.

ポリイミドは、400℃程度の熱処理後もエツチングが
可能で、化学的に安定であるため、熱処理後のリフトオ
フが可能な材料である。
Polyimide can be etched even after heat treatment at about 400° C. and is chemically stable, so it is a material that can be lifted off after heat treatment.

(ハ)発明が解決しようとする問題点 熱るてジャーナル エレクトロケミカル ンサイアティ
:ソリッドーステイト サイエンス アンド テクノロ
ジー(Jo+14rnal  Electrochem
ical  5ociety:  SQL I D−8
TATE5CIENCE   AND   TECHN
OLOGY)、Jaunary  1983 + Vo
l、130 、No 、1゜P129−P134に記載
されているようにポリイミドは化学エツチングするとそ
の断面形状は台形となり(第2図)、リフトオフに理想
的なオーバーハング構造(断面逆台形)(第3図)とな
らない。尚、第2図及び第3図中(11)(12)¥′
i夫々基板及びリフトオフ材を示す。
(c) The problem that the invention attempts to solve.
ical 5ociety: SQL ID-8
TATE5CIENCE AND TECHN
OLOGY), January 1983 + Vo
1, 130, No, 1゜As described in P129-P134, when polyimide is chemically etched, its cross-sectional shape becomes trapezoidal (Fig. 2), and an overhang structure (inverted trapezoidal cross-section) ideal for lift-off (Fig. Figure 3). In addition, (11) (12) ¥' in Figures 2 and 3
i indicates the substrate and lift-off material, respectively.

に)問屋点を解決するための手段 本発明/′i祈る点に鑑みてなされたもので、その構成
的特徴は基板上にポリイミドからなる′f!IJl春を
形成する第1工程、該第1,層を所望形状にパターンニ
ングする第2工程、該第2工程においてパターンニング
された上記第1層を被覆するように上記第1層に較べて
基板との固着力が小なるポリイミドからなる第2層を上
記基板上に形成する第3工程、該!43工程の後有機処
理を行なう事により上記第2層を上記基板に対してオー
バハング構造とする第4工程を備えたことにある。
2) Means for Solving the Problems of Wholesalers The present invention has been made in view of the above-mentioned problems, and its structural feature is that it consists of polyimide on a substrate. a first step of forming an IJl spring; a second step of patterning the first layer into a desired shape; A third step of forming a second layer made of polyimide, which has a low adhesion to the substrate, on the substrate; The present invention further includes a fourth step of forming the second layer into an overhanging structure with respect to the substrate by performing an organic treatment after the step No. 43.

(ホ)作用 このような方法によりポリイミドからなる層をオーバー
ハング構造とすることが可能であるつ(へ)実施例 第1図は本発明の実施例を示す工程別断面図である。
(e) Effect: It is possible to form a layer made of polyimide into an overhanging structure by using such a method.

第1図(a)は第1工程を示し、例えばGaAs単結晶
からなる基板(lj上に例えば東し株式会社製の5P−
510からなるポリイミドの第111+2層を形成する
。具体的には、まず基板(Ij上にアミノシランからな
るVラン系カップリング材をスピナー塗布(5000〜
6000pp+n、30秒)し、続いて5P−510を
スピナー塗布(4000〜50001)pm、30秒〕
する。その後170〜180℃、20〜30分の条件で
ベーキング処理することにより、響厚約1μmの@1層
(2)が形成できる。
FIG. 1(a) shows the first step, in which a substrate made of, for example, GaAs single crystal (for example, 5P-
A 111+2 layer of polyimide consisting of 510 is formed. Specifically, first, a V-run coupling material made of aminosilane was applied onto the substrate (Ij) using a spinner (5000 ~
6000pp+n, 30 seconds), then apply 5P-510 with a spinner (4000-50001)pm, 30 seconds]
do. Thereafter, by baking at 170 to 180° C. for 20 to 30 minutes, @1 layer (2) with a thickness of about 1 μm can be formed.

!!1図(b)は第2工程を示し、第1層(2)上にフ
ォトリングラフィ技術を用いて選択的にレジスト膜(3
)を積層する。その後無水とドフジン:エチレンジアミ
ン=7:3のエツチング液を用いて1分間エツチングす
る(第3工程)ことをでより弼1図(C)に示す、70
くレジスト膜i31 !![下の・祈面台形状の第1嗜
(2)を残して他のp;1・護(2)はエツチング除去
される。
! ! Figure 1(b) shows the second step, in which a resist film (3) is selectively formed on the first layer (2) using photolithography technology.
) are stacked. After that, etching was carried out for 1 minute using an etching solution containing anhydrous and dofusine: ethylenediamine = 7:3 (third step), as shown in Figure 1 (C).
Ku resist film i31! ! [The other parts (2) are removed by etching, leaving the first part (2) of the trapezoidal shape below.

@ 17(d)r/if)”< 4 工、Elを示し、
第11+2)上ルジスロ鵡3)を除去し九後基板(1)
上にポリイミドからなる第2.1(41及び第2のレジ
スト膜(6)を1杉成する。
@17(d)r/if)”< 4 Engineering, El is shown,
11th + 2) Remove the upper Luzithro parrot 3) and the 9th board (1)
A second resist film (41) and a second resist film (6) made of polyimide are formed thereon.

具体的にけ壕ず基板(11上に5P−510をスピナー
塗布(4000〜5000ppm、30秒)し、次いで
170〜180℃、20〜30分の条件でベーキング処
理するこ七1てより−If約1μmの゛第2層(4)を
形成し、その褒フォトリゾグラフィ技術を用いて第11
1211江上の第2曽14)表面に′第2のレジスト膜
(5)を選択的に形成する。
Specifically, 5P-510 is applied with a spinner (4000 to 5000 ppm, 30 seconds) onto the trenchless substrate (11), and then baked at 170 to 180°C for 20 to 30 minutes. A second layer (4) of approximately 1 μm is formed, and then an eleventh layer is formed using photolithography technology.
1211 A second resist film (5) is selectively formed on the surface of the second layer 14).

尚、第2.1+41idカツプリング材を介さず基板(
lI上に形成されて(/−するため、膏1層(2)に較
べてエツチング剤等の侵透に対する低抗性(固着力)が
弱い0 第1図(e)は第5工程を示し、上記第2のVシストf
i+51’iマスクとしてエツチングを行ないレジスト
膜(5)直下以外の第21−+4+を除去し、その後第
2のレジスト膜+5)を除去する。尚、上記エツチング
は#S3工程と同一のエツチング液を用いて用なう。
In addition, the substrate (
1 (e) shows the fifth step. , the second V cyst f
Etching is performed using the i+51'i mask to remove the 21-+4+ portions other than those immediately below the resist film (5), and then the second resist film +5) is removed. Note that the above etching is performed using the same etching solution as in step #S3.

第1図(f)は第6エ程を示し、有機処理を施すことに
よシ、基板(])と固盾した第2台(4)の端部(4a
 ) (4a )を基板(1)から剥がし基板[1jに
対してオーバーハング構造となす。具体的にば、まずア
セトンで3分間超音波洗浄を行ない基板(1)上の水分
を除去する。次いで煮沸されたトリクレンで3分間超音
波洗浄を行なうことにより基板(11と第2層(4)と
の固着力が弱まり上記オーバーハング構造が得られる。
FIG. 1(f) shows the sixth step, in which the end portion (4a
) (4a) is peeled off from the substrate (1) to form an overhang structure with respect to the substrate [1j]. Specifically, first, ultrasonic cleaning is performed using acetone for 3 minutes to remove moisture on the substrate (1). Next, by performing ultrasonic cleaning for 3 minutes with boiled trichlorene, the adhesion between the substrate (11) and the second layer (4) is weakened, and the above-mentioned overhang structure is obtained.

その後、アセトン3分間超音e洗浄、メタノ−/I/3
分間超音波洗浄、5分間流水洗浄、イソプロピルアルコ
ール洗浄、乾燥の各工程を経て基板(1)上のトリクレ
ンを完全に除去する。
Then, ultrasonic e-cleaning for 3 minutes with acetone, methanol/I/3
The trichlene on the substrate (1) is completely removed through the steps of ultrasonic cleaning for 5 minutes, running water for 5 minutes, isopropyl alcohol cleaning, and drying.

第1図(g)は第7エ程を示し、基板(1)上面に金等
の蒸着物(6)を蒸着する。斯る蒸着においては、上記
オーバーハング構造を有する第2j!lt+lの端部(
4a)(4a)が基板(1>の1部に対して廂として作
用する丸め祈る端部(4a)(4a)直下の基板tlj
上には蒸着物(6)は堆積しない。また、第2層(4)
上の蒸着物(6)と基板+1)上の蒸着物(6)との間
に段差ができ、@ 2 苦t+lの端部(4a )it
下は開孔(7)となる。
FIG. 1(g) shows the seventh step, in which a deposit (6) of gold or the like is deposited on the upper surface of the substrate (1). In such vapor deposition, the second j! lt+l end (
4a) (4a) is the rounded end portion (4a) where (4a) acts as a wall for a part of the substrate (1);
No vapor deposits (6) are deposited on top. Also, the second layer (4)
A step is formed between the deposited material (6) on the upper part and the deposited material (6) on the substrate +1), and the end part (4a) of @ 2 +1) is formed.
The bottom is an opening (7).

第1図(h)は最終工程を示し、第3工稈で用いたエツ
チング液を用いてポリイミドからなる第1、第2層(2
H4層を除去し第2層(4)上の蒸着物(θ)を選択的
にリフトオフする。祈るエツチングにおいては1記開孔
(7)を介してエツチング液が第2@t41に達するの
で効率良くリフトオフが行なえる。
Figure 1 (h) shows the final step, in which the first and second layers (2
The H4 layer is removed and the deposit (θ) on the second layer (4) is selectively lifted off. In the etching process, the etching liquid reaches the second hole (t41) through the first hole (7), so that lift-off can be carried out efficiently.

尚、本実施例ではイ1響(2)として東し株式会社製の
5P−510をカップリング材を用りて基板(1)上に
形成したが、例えば東し株式会社製の5P−710,8
10等のポリイミドのように高接着材料であればカップ
リング材は不要である。また、このような高接着性のポ
リイミドを第1 習f21の材料として用いる際には第
2層(4)の材料としては低接着性のポリイミドを用い
る必要がある。
In this example, 5P-510 manufactured by Toshi Co., Ltd. was formed on the substrate (1) as I1 Hibiki (2) using a coupling material, but for example, 5P-710 manufactured by Toshi Co., Ltd. ,8
If the material is a highly adhesive material such as polyimide such as No. 10, a coupling material is not necessary. Furthermore, when such a highly adhesive polyimide is used as the material for the first layer (4), it is necessary to use a low adhesive polyimide as the material for the second layer (4).

(ト)発明の効果 本発明によれば、リフトオフ材としてポリイミドを用い
た際にもリフトオフに最適なオーバーハング構造とする
ことが可能である。
(G) Effects of the Invention According to the present invention, even when polyimide is used as the lift-off material, it is possible to obtain an overhang structure that is optimal for lift-off.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)〜(h)け本発明の実施例を示す工程別断
面図、第2図及び第3図はリフトオフ材の形状を示す’
W+而図面あるっ
Figures 1 (a) to (h) are cross-sectional views showing steps of embodiments of the present invention, and Figures 2 and 3 show the shape of the lift-off material.
W+There is a drawing

Claims (1)

【特許請求の範囲】[Claims] (1)基板上にポリイミドからなる第1層を形成する第
1工程、該第1層を所望形状にパターンニングする第2
工程、該第2工程においてパターンニングされた上記第
1層を被覆するように上記第1層に較べて基板との固着
力が小なるポリイミドからなる第2層を上記基板上に形
成する第3工程、該第3工程の後有機処理を行なう事に
より上記第2層を上記基板に対してオーバハング構造と
する第4工程を備えたことを特徴とするリフトオフ法。
(1) A first step of forming a first layer made of polyimide on a substrate, and a second step of patterning the first layer into a desired shape.
a third step of forming a second layer made of polyimide, which has a smaller adhesion force to the substrate than the first layer, on the substrate so as to cover the first layer patterned in the second step; and a fourth step of forming the second layer into an overhanging structure with respect to the substrate by performing an organic treatment after the third step.
JP14536585A 1985-07-02 1985-07-02 Lift-off method Expired - Lifetime JPH0685398B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14536585A JPH0685398B2 (en) 1985-07-02 1985-07-02 Lift-off method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14536585A JPH0685398B2 (en) 1985-07-02 1985-07-02 Lift-off method

Publications (2)

Publication Number Publication Date
JPS625639A true JPS625639A (en) 1987-01-12
JPH0685398B2 JPH0685398B2 (en) 1994-10-26

Family

ID=15383522

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14536585A Expired - Lifetime JPH0685398B2 (en) 1985-07-02 1985-07-02 Lift-off method

Country Status (1)

Country Link
JP (1) JPH0685398B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160023906A (en) 2014-05-29 2016-03-03 지세다이 가가쿠자이료효카 기쥬츠겡큐구미아이 Standard film for correction of water vapor permeability measurement device, method for manufacturing same, standard film set for correction, and correction method using same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160023906A (en) 2014-05-29 2016-03-03 지세다이 가가쿠자이료효카 기쥬츠겡큐구미아이 Standard film for correction of water vapor permeability measurement device, method for manufacturing same, standard film set for correction, and correction method using same

Also Published As

Publication number Publication date
JPH0685398B2 (en) 1994-10-26

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