JPS6252948U - - Google Patents

Info

Publication number
JPS6252948U
JPS6252948U JP14560685U JP14560685U JPS6252948U JP S6252948 U JPS6252948 U JP S6252948U JP 14560685 U JP14560685 U JP 14560685U JP 14560685 U JP14560685 U JP 14560685U JP S6252948 U JPS6252948 U JP S6252948U
Authority
JP
Japan
Prior art keywords
circuit
data
output
test
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14560685U
Other languages
English (en)
Japanese (ja)
Other versions
JPH056669Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985145606U priority Critical patent/JPH056669Y2/ja
Publication of JPS6252948U publication Critical patent/JPS6252948U/ja
Application granted granted Critical
Publication of JPH056669Y2 publication Critical patent/JPH056669Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP1985145606U 1985-09-24 1985-09-24 Expired - Lifetime JPH056669Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985145606U JPH056669Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1985-09-24 1985-09-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985145606U JPH056669Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1985-09-24 1985-09-24

Publications (2)

Publication Number Publication Date
JPS6252948U true JPS6252948U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-04-02
JPH056669Y2 JPH056669Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-02-19

Family

ID=31057301

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985145606U Expired - Lifetime JPH056669Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1985-09-24 1985-09-24

Country Status (1)

Country Link
JP (1) JPH056669Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011220881A (ja) * 2010-04-12 2011-11-04 Kawasaki Microelectronics Inc 半導体集積回路のテスト回路およびテスト方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57210640A (en) * 1981-06-18 1982-12-24 Matsushita Electric Ind Co Ltd Large scale integrated circuit
JPS60169147A (ja) * 1984-02-13 1985-09-02 Nec Corp 半導体集積回路

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57210640A (en) * 1981-06-18 1982-12-24 Matsushita Electric Ind Co Ltd Large scale integrated circuit
JPS60169147A (ja) * 1984-02-13 1985-09-02 Nec Corp 半導体集積回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011220881A (ja) * 2010-04-12 2011-11-04 Kawasaki Microelectronics Inc 半導体集積回路のテスト回路およびテスト方法

Also Published As

Publication number Publication date
JPH056669Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-02-19

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