JPS6252399B2 - - Google Patents

Info

Publication number
JPS6252399B2
JPS6252399B2 JP58054303A JP5430383A JPS6252399B2 JP S6252399 B2 JPS6252399 B2 JP S6252399B2 JP 58054303 A JP58054303 A JP 58054303A JP 5430383 A JP5430383 A JP 5430383A JP S6252399 B2 JPS6252399 B2 JP S6252399B2
Authority
JP
Japan
Prior art keywords
spare
data
regular
memory
row
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58054303A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59178698A (ja
Inventor
Hidetake Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP58054303A priority Critical patent/JPS59178698A/ja
Publication of JPS59178698A publication Critical patent/JPS59178698A/ja
Publication of JPS6252399B2 publication Critical patent/JPS6252399B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP58054303A 1983-03-30 1983-03-30 半導体記憶装置 Granted JPS59178698A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58054303A JPS59178698A (ja) 1983-03-30 1983-03-30 半導体記憶装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58054303A JPS59178698A (ja) 1983-03-30 1983-03-30 半導体記憶装置

Publications (2)

Publication Number Publication Date
JPS59178698A JPS59178698A (ja) 1984-10-09
JPS6252399B2 true JPS6252399B2 (ko) 1987-11-05

Family

ID=12966800

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58054303A Granted JPS59178698A (ja) 1983-03-30 1983-03-30 半導体記憶装置

Country Status (1)

Country Link
JP (1) JPS59178698A (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0235697A (ja) * 1988-07-26 1990-02-06 Nec Corp メモリ回路
JP2001273788A (ja) 2000-03-29 2001-10-05 Hitachi Ltd 半導体記憶装置

Also Published As

Publication number Publication date
JPS59178698A (ja) 1984-10-09

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