JPS6251052B2 - - Google Patents

Info

Publication number

JPS6251052B2

JPS6251052B2 JP55041541A JP4154180A JPS6251052B2 JP S6251052 B2 JPS6251052 B2 JP S6251052B2 JP 55041541 A JP55041541 A JP 55041541A JP 4154180 A JP4154180 A JP 4154180A JP S6251052 B2 JPS6251052 B2 JP S6251052B2

Authority

JP

Japan

Prior art keywords

relay

inspection

circuit

output

input

Prior art date

1980-03-31

Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Expired

Links

• Espacenet
• Global Dossier
• Discuss

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• 238000012544 monitoring process Methods 0.000 claims description 79
• 230000007547 defect Effects 0.000 claims description 50
• 230000002950 deficient Effects 0.000 claims description 42
• 230000001681 protective effect Effects 0.000 claims description 21
• 238000012545 processing Methods 0.000 claims description 20
• 230000006870 function Effects 0.000 claims description 3
• 238000000034 method Methods 0.000 description 45
• 230000008569 process Effects 0.000 description 43
• 238000001514 detection method Methods 0.000 description 16
• 238000010586 diagram Methods 0.000 description 6
• 238000012423 maintenance Methods 0.000 description 5
• 230000000694 effects Effects 0.000 description 4
• 230000007257 malfunction Effects 0.000 description 4
• 230000004044 response Effects 0.000 description 4
• 230000003111 delayed effect Effects 0.000 description 2
• 230000002159 abnormal effect Effects 0.000 description 1
• 238000006243 chemical reaction Methods 0.000 description 1
• 230000005611 electricity Effects 0.000 description 1
• 230000006872 improvement Effects 0.000 description 1
• 238000012986 modification Methods 0.000 description 1
• 230000004048 modification Effects 0.000 description 1
• 238000004092 self-diagnosis Methods 0.000 description 1
• 238000012360 testing method Methods 0.000 description 1