JPS6248968B2 - - Google Patents
Info
- Publication number
- JPS6248968B2 JPS6248968B2 JP58073195A JP7319583A JPS6248968B2 JP S6248968 B2 JPS6248968 B2 JP S6248968B2 JP 58073195 A JP58073195 A JP 58073195A JP 7319583 A JP7319583 A JP 7319583A JP S6248968 B2 JPS6248968 B2 JP S6248968B2
- Authority
- JP
- Japan
- Prior art keywords
- group
- parts
- weight
- formula
- epoxy resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000203 mixture Substances 0.000 claims description 25
- 239000003822 epoxy resin Substances 0.000 claims description 24
- 229920000647 polyepoxide Polymers 0.000 claims description 24
- 125000001183 hydrocarbyl group Chemical group 0.000 claims description 14
- 239000007822 coupling agent Substances 0.000 claims description 13
- 125000004432 carbon atom Chemical group C* 0.000 claims description 10
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 9
- 239000011256 inorganic filler Substances 0.000 claims description 7
- 229910003475 inorganic filler Inorganic materials 0.000 claims description 7
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 6
- 125000004423 acyloxy group Chemical group 0.000 claims description 4
- 125000003545 alkoxy group Chemical group 0.000 claims description 4
- 125000004430 oxygen atom Chemical group O* 0.000 claims description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 125000003302 alkenyloxy group Chemical group 0.000 claims description 2
- 229910052799 carbon Inorganic materials 0.000 claims 1
- 238000000354 decomposition reaction Methods 0.000 claims 1
- 230000036571 hydration Effects 0.000 claims 1
- 238000006703 hydration reaction Methods 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 17
- 229920005989 resin Polymers 0.000 description 12
- 239000011347 resin Substances 0.000 description 12
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 9
- -1 for example Chemical compound 0.000 description 9
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 9
- 238000000465 moulding Methods 0.000 description 9
- 229910000077 silane Inorganic materials 0.000 description 9
- 239000004593 Epoxy Substances 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- 229920003986 novolac Polymers 0.000 description 7
- 239000003795 chemical substances by application Substances 0.000 description 6
- 150000001875 compounds Chemical class 0.000 description 6
- 239000000843 powder Substances 0.000 description 6
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 5
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 238000005452 bending Methods 0.000 description 4
- 239000006229 carbon black Substances 0.000 description 4
- 230000007797 corrosion Effects 0.000 description 4
- 238000005260 corrosion Methods 0.000 description 4
- 229930003836 cresol Natural products 0.000 description 4
- 239000000945 filler Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 229920001296 polysiloxane Polymers 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 125000003342 alkenyl group Chemical group 0.000 description 3
- 150000001412 amines Chemical class 0.000 description 3
- 239000004203 carnauba wax Substances 0.000 description 3
- 235000013869 carnauba wax Nutrition 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 150000004756 silanes Chemical class 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- 239000006087 Silane Coupling Agent Substances 0.000 description 2
- 235000021355 Stearic acid Nutrition 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000000460 chlorine Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- ZZTCPWRAHWXWCH-UHFFFAOYSA-N diphenylmethanediamine Chemical compound C=1C=CC=CC=1C(N)(N)C1=CC=CC=C1 ZZTCPWRAHWXWCH-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 125000003700 epoxy group Chemical group 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 239000005350 fused silica glass Substances 0.000 description 2
- 125000005843 halogen group Chemical group 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 2
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 2
- 125000001820 oxy group Chemical group [*:1]O[*:2] 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000008117 stearic acid Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- TXDNPSYEJHXKMK-UHFFFAOYSA-N sulfanylsilane Chemical compound S[SiH3] TXDNPSYEJHXKMK-UHFFFAOYSA-N 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- 229930195735 unsaturated hydrocarbon Natural products 0.000 description 2
- KMOUUZVZFBCRAM-OLQVQODUSA-N (3as,7ar)-3a,4,7,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C=CC[C@@H]2C(=O)OC(=O)[C@@H]21 KMOUUZVZFBCRAM-OLQVQODUSA-N 0.000 description 1
- CRSBERNSMYQZNG-UHFFFAOYSA-N 1 -dodecene Natural products CCCCCCCCCCC=C CRSBERNSMYQZNG-UHFFFAOYSA-N 0.000 description 1
- YJTKZCDBKVTVBY-UHFFFAOYSA-N 1,3-Diphenylbenzene Chemical group C1=CC=CC=C1C1=CC=CC(C=2C=CC=CC=2)=C1 YJTKZCDBKVTVBY-UHFFFAOYSA-N 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- KWKAKUADMBZCLK-UHFFFAOYSA-N 1-octene Chemical group CCCCCCC=C KWKAKUADMBZCLK-UHFFFAOYSA-N 0.000 description 1
- STMDPCBYJCIZOD-UHFFFAOYSA-N 2-(2,4-dinitroanilino)-4-methylpentanoic acid Chemical compound CC(C)CC(C(O)=O)NC1=CC=C([N+]([O-])=O)C=C1[N+]([O-])=O STMDPCBYJCIZOD-UHFFFAOYSA-N 0.000 description 1
- LKMJVFRMDSNFRT-UHFFFAOYSA-N 2-(methoxymethyl)oxirane Chemical compound COCC1CO1 LKMJVFRMDSNFRT-UHFFFAOYSA-N 0.000 description 1
- 125000000094 2-phenylethyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- SJECZPVISLOESU-UHFFFAOYSA-N 3-trimethoxysilylpropan-1-amine Chemical compound CO[Si](OC)(OC)CCCN SJECZPVISLOESU-UHFFFAOYSA-N 0.000 description 1
- UUEWCQRISZBELL-UHFFFAOYSA-N 3-trimethoxysilylpropane-1-thiol Chemical compound CO[Si](OC)(OC)CCCS UUEWCQRISZBELL-UHFFFAOYSA-N 0.000 description 1
- XDLMVUHYZWKMMD-UHFFFAOYSA-N 3-trimethoxysilylpropyl 2-methylprop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C(C)=C XDLMVUHYZWKMMD-UHFFFAOYSA-N 0.000 description 1
- VQVIHDPBMFABCQ-UHFFFAOYSA-N 5-(1,3-dioxo-2-benzofuran-5-carbonyl)-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(C(C=2C=C3C(=O)OC(=O)C3=CC=2)=O)=C1 VQVIHDPBMFABCQ-UHFFFAOYSA-N 0.000 description 1
- 229910002012 Aerosil® Inorganic materials 0.000 description 1
- 239000005995 Aluminium silicate Substances 0.000 description 1
- 229930185605 Bisphenol Natural products 0.000 description 1
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- MQJKPEGWNLWLTK-UHFFFAOYSA-N Dapsone Chemical compound C1=CC(N)=CC=C1S(=O)(=O)C1=CC=C(N)C=C1 MQJKPEGWNLWLTK-UHFFFAOYSA-N 0.000 description 1
- SNRUBQQJIBEYMU-UHFFFAOYSA-N Dodecane Natural products CCCCCCCCCCCC SNRUBQQJIBEYMU-UHFFFAOYSA-N 0.000 description 1
- BRLQWZUYTZBJKN-UHFFFAOYSA-N Epichlorohydrin Chemical compound ClCC1CO1 BRLQWZUYTZBJKN-UHFFFAOYSA-N 0.000 description 1
- 241000283220 Odobenus rosmarus Species 0.000 description 1
- FQYUMYWMJTYZTK-UHFFFAOYSA-N Phenyl glycidyl ether Chemical compound C1OC1COC1=CC=CC=C1 FQYUMYWMJTYZTK-UHFFFAOYSA-N 0.000 description 1
- LGRFSURHDFAFJT-UHFFFAOYSA-N Phthalic anhydride Natural products C1=CC=C2C(=O)OC(=O)C2=C1 LGRFSURHDFAFJT-UHFFFAOYSA-N 0.000 description 1
- GOOHAUXETOMSMM-UHFFFAOYSA-N Propylene oxide Chemical compound CC1CO1 GOOHAUXETOMSMM-UHFFFAOYSA-N 0.000 description 1
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- AWMVMTVKBNGEAK-UHFFFAOYSA-N Styrene oxide Chemical compound C1OC1C1=CC=CC=C1 AWMVMTVKBNGEAK-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
- 150000008065 acid anhydrides Chemical class 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 125000002723 alicyclic group Chemical group 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical class [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 1
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 235000012211 aluminium silicate Nutrition 0.000 description 1
- 125000003710 aryl alkyl group Chemical group 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- 239000010425 asbestos Substances 0.000 description 1
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Chemical compound [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 1
- 229910001864 baryta Inorganic materials 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 1
- 125000001246 bromo group Chemical group Br* 0.000 description 1
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- AXCZMVOFGPJBDE-UHFFFAOYSA-L calcium dihydroxide Chemical compound [OH-].[OH-].[Ca+2] AXCZMVOFGPJBDE-UHFFFAOYSA-L 0.000 description 1
- 239000000920 calcium hydroxide Substances 0.000 description 1
- 229910001861 calcium hydroxide Inorganic materials 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 125000001309 chloro group Chemical group Cl* 0.000 description 1
- 239000004927 clay Substances 0.000 description 1
- 229910052570 clay Inorganic materials 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 229910002026 crystalline silica Inorganic materials 0.000 description 1
- 125000004093 cyano group Chemical group *C#N 0.000 description 1
- 125000000753 cycloalkyl group Chemical group 0.000 description 1
- ZWAJLVLEBYIOTI-UHFFFAOYSA-N cyclohexene oxide Chemical compound C1CCCC2OC21 ZWAJLVLEBYIOTI-UHFFFAOYSA-N 0.000 description 1
- FWFSEYBSWVRWGL-UHFFFAOYSA-N cyclohexene oxide Natural products O=C1CCCC=C1 FWFSEYBSWVRWGL-UHFFFAOYSA-N 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 235000014113 dietary fatty acids Nutrition 0.000 description 1
- 229940069096 dodecene Drugs 0.000 description 1
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- FWDBOZPQNFPOLF-UHFFFAOYSA-N ethenyl(triethoxy)silane Chemical compound CCO[Si](OCC)(OCC)C=C FWDBOZPQNFPOLF-UHFFFAOYSA-N 0.000 description 1
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 239000000194 fatty acid Substances 0.000 description 1
- 229930195729 fatty acid Natural products 0.000 description 1
- 150000004665 fatty acids Chemical class 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 230000003301 hydrolyzing effect Effects 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 235000010755 mineral Nutrition 0.000 description 1
- 239000006082 mold release agent Substances 0.000 description 1
- MQWFLKHKWJMCEN-UHFFFAOYSA-N n'-[3-[dimethoxy(methyl)silyl]propyl]ethane-1,2-diamine Chemical compound CO[Si](C)(OC)CCCNCCN MQWFLKHKWJMCEN-UHFFFAOYSA-N 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 150000003003 phosphines Chemical class 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 238000011417 postcuring Methods 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 229910052895 riebeckite Inorganic materials 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- PXQLVRUNWNTZOS-UHFFFAOYSA-N sulfanyl Chemical class [SH] PXQLVRUNWNTZOS-UHFFFAOYSA-N 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- ADXGNEYLLLSOAR-UHFFFAOYSA-N tasosartan Chemical compound C12=NC(C)=NC(C)=C2CCC(=O)N1CC(C=C1)=CC=C1C1=CC=CC=C1C=1N=NNN=1 ADXGNEYLLLSOAR-UHFFFAOYSA-N 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 125000000383 tetramethylene group Chemical group [H]C([H])([*:1])C([H])([H])C([H])([H])C([H])([H])[*:2] 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- 150000003672 ureas Chemical class 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 239000001993 wax Substances 0.000 description 1
- 125000005023 xylyl group Chemical group 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
- 235000014692 zinc oxide Nutrition 0.000 description 1
Description
本発明はエポキシ樹脂組成物、特には電子部品
の封止に好適とされる耐湿性にすぐれ、信頼性の
高い製品を得ることができる組成物を提供しよう
とするものである。
最近の半導体装置は従来のセラミツク、キヤン
封止型のものと比較した場合、大量生産性にすぐ
れ、しかも低価格な製品が得られる樹脂封止方式
のものが多くなりつつあり、この封止樹脂として
は、電気特性、機械物性等にすぐれるエポキシ樹
脂の使用が増大している。
しかしながら、エポキシ樹脂に代表される樹脂
で封止を行つた半導体装置は、セラミツク、キヤ
ン封止型のものと比較して吸湿性を有し、また樹
脂とフレームとの界面を通しての水の進入も多い
という問題があるほか、これらの樹脂中には加水
分解性のClをはじめとするイオン性不純物が残
存しており、これらが水との相互作用により半導
体装置のリーク電流を増大させたり、アルミニウ
ム電極の腐触等をひきおこし信頼性低下の大きな
原因となつている。
このため、上記したようなエポキシ樹脂につい
ては、これで封止した半導体装置の耐湿性の不足
に起因する不良を防止する目的で種々改良が試み
られ、これには例えば封止材料中のイオン性不純
物を除去したり、イオン性物質をトラツプするよ
うな添加剤を添加すること等が提案されている
が、これらによつてもイオン性物質を完全、かつ
確実に除去あるいはトラツプすることは実質的に
不可能であり、初期の目的を達成することができ
ないという不利がある。
他方、この種の封止材料の耐湿性を改良するた
めにはシランカツプリング剤の添加が有効なもの
とされ、半導体装置封止用エポキシ樹脂組成物用
のシランカツプリング剤としては、エポキシ系シ
ラン、メルカプト系シラン、アミン系シランある
いは不飽和炭化水素系シラン等が知られている。
そして、このエポキシ系シランとしては、例えば
3―グリシドキシプロピルトリメトキシシラン、
2―(3,4―エポキシシクロヘキシル)エチル
トリメトキシシランが使用されているが、これら
のシラン中のエポキシ基はいずれもエポキシ樹脂
との反応性に劣ることから成形時にバリが発生し
たり、またその添加量の増加につれて電気特性が
低下するという欠点があるほか、これらのエポキ
シシランを添加した硬化性エポキシ樹脂はシリコ
ンチツプとの接着性が不充分であるため、これを
用いて封止した半導体装置は苛酷な条件下での耐
湿テストで不良が発生しやすいという欠点があつ
た。また、このメルカプト系シランとしては例え
ば3―メルカプトプロピルトリメトキシシランが
用いられるが、このものは悪臭が強く実用上問題
があり、さらにアミン系シランとしては例えば、
γ―アミノプロピルトリメトキシシランやN―
(2アミノエチル)―3―アミノプロピルメチル
ジメトキシシランなどが使用されており、これを
含む組成物はシリコンチツプとの接着性が良く、
耐湿性やアルミ電極への腐蝕という問題点も少な
いという有利性をもつものであるけれども、これ
には保存安定性が極めてわるいという不利があ
る。なお、この不飽和炭化水素系シランとしては
例えばビニルトリエトキシシラン、3―メタアク
リロキシプロピルトリメトキシシランが用いられ
ているが、これらはフエノール硬化性エポキシ樹
脂と反応する官能基を有しないため、カツプリン
グ剤としての機能を十分に発揮させることは困難
である。
本発明は上記した不利を解決した電子部品封止
に適した硬化性エポキシ樹脂組成物に関するもの
で、これはA)硬化性エポキシ樹脂100重量部、
B)無機質充填剤100〜500重量部、およびC)一
般式 R1(―Z―A)n〔こゝにR1は水素原子また
は炭素数1〜20の非置換または置換炭化水素、A
は一般式
The present invention aims to provide an epoxy resin composition, particularly a composition suitable for encapsulating electronic components, which has excellent moisture resistance and can yield highly reliable products. Recently, more and more semiconductor devices are being encapsulated with resin, which is superior in mass productivity and can produce products at low cost when compared to conventional ceramic and can encapsulation types. The use of epoxy resins, which have excellent electrical properties, mechanical properties, etc., is increasing. However, semiconductor devices sealed with resins such as epoxy resins are more hygroscopic than ceramic or can-sealed types, and are also less prone to water intrusion through the interface between the resin and the frame. In addition to the problem of large amounts of ionic impurities remaining in these resins, including hydrolyzable Cl, these interact with water and increase the leakage current of semiconductor devices. This causes corrosion of the electrodes and is a major cause of reduced reliability. For this reason, various improvements have been made to the above-mentioned epoxy resins in order to prevent defects caused by insufficient moisture resistance in semiconductor devices sealed with these resins. It has been proposed to remove impurities or add additives to trap ionic substances, but these methods cannot actually completely and reliably remove or trap ionic substances. The disadvantage is that it is impossible to achieve the initial goal. On the other hand, in order to improve the moisture resistance of this type of encapsulation material, the addition of a silane coupling agent is considered to be effective, and as a silane coupling agent for epoxy resin compositions for encapsulating semiconductor devices, epoxy-based Silane, mercapto silane, amine silane, unsaturated hydrocarbon silane, etc. are known.
Examples of the epoxy silane include 3-glycidoxypropyltrimethoxysilane,
2-(3,4-epoxycyclohexyl)ethyltrimethoxysilane is used, but since the epoxy groups in these silanes have poor reactivity with epoxy resins, burrs may occur during molding, and In addition to the drawback that electrical properties deteriorate as the amount of epoxy silane added increases, curable epoxy resins containing these epoxy silanes have insufficient adhesion to silicon chips, so semiconductors encapsulated using them The device had the drawback of being prone to failures during humidity tests under harsh conditions. Further, as the mercapto-based silane, for example, 3-mercaptopropyltrimethoxysilane is used, but this has a strong odor and is problematic in practice, and as the amine-based silane, for example,
γ-Aminopropyltrimethoxysilane and N-
(2-aminoethyl)-3-aminopropylmethyldimethoxysilane is used, and compositions containing this have good adhesion to silicon chips.
Although it has the advantage of being less prone to problems such as moisture resistance and corrosion of aluminum electrodes, it has the disadvantage of extremely poor storage stability. Note that vinyltriethoxysilane and 3-methacryloxypropyltrimethoxysilane are used as the unsaturated hydrocarbon silane, but since these do not have a functional group that reacts with the phenol-curable epoxy resin, It is difficult to fully demonstrate its function as a coupling agent. The present invention relates to a curable epoxy resin composition suitable for encapsulating electronic components that solves the above-mentioned disadvantages.
B) 100 to 500 parts by weight of an inorganic filler, and C) General formula R 1 (-Z-A) n [where R 1 is a hydrogen atom or an unsubstituted or substituted hydrocarbon having 1 to 20 carbon atoms, A
is a general formula
【式】(R2,R4は水素
原子または炭素数1〜10の非置換または置換1価
炭化水素基、R3は炭素数1〜6の2価炭化水素
基、Xはアルコキシ基、アルケニルオキシ基、ア
シロキシ基または水酸基)で示される基、Zは酸
素原子または[Formula] (R 2 , R 4 is a hydrogen atom or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 10 carbon atoms, R 3 is a divalent hydrocarbon group having 1 to 6 carbon atoms, X is an alkoxy group, alkenyl (oxy group, acyloxy group or hydroxyl group), Z is an oxygen atom or
【式】(R5は水素原子または炭
素数1〜10の非置換または置換1価炭化水素基)
で示される基、mは1〜2の整数〕で示される化
合物あるいはその加水分解物から選択されるカツ
プリング剤0.05〜10重量部とからなることを特徴
とするものである。
これを説明すると、本発明者らは電子部品の封
止用に使用される硬化性エポキシ樹脂組成物に関
する上述の不利を解決する方法について種々検討
した結果、エポキシ樹脂に添加するカツプリング
剤として前記した式R1(―Z―A)nで示されるシ
リコーン化合物またはその加水分解物を用いる
と、この組成物は極めてすぐれた耐湿性を示すと
共に、このものは保存安定性もよいこと、またこ
の組成物で封止した半導体装置をはじめとする各
種の電子部品にはアルミニウム配線の腐蝕も少な
いということを見出し、したがつてこの組成物を
封止剤として適用したIC、LSI、トランジスター
などの半導体装置にはすぐれた信頼性が得られる
こと、またこの組成物は各種塗料、注型用、一般
成形用、電気絶縁用、積層板用などに広く広用可
能とされることを確認して本発明を完成させた。
以下本発明に係る組成物について詳細に説明す
る。
まず本発明において使用するA)成分としての
硬化性エポキシ樹脂とは、1分子中に2個以上の
エポキシ基を有するエポキシ樹脂と各種硬化剤と
からなる硬化可能なエポキシ樹脂であつて、この
エポキシ樹脂には後述するようなフエノール系硬
化剤によつて硬化させることが可能な限り、分子
構造、分子量等に特に制限はなく従来から知られ
ている種々のものを使用することができ、これに
は例えばエピクロルヒドリンとビスフエノールを
はじめとする各種ノボラツク樹脂から合成される
エポキシ樹脂、脂環式エポキシ樹脂あるいは塩素
や臭素原子等のハロゲン原子を導入したエポキシ
樹脂等をあげることができるが、これらはその使
用にあたつては必ずしも1種のみに限定されるも
のではなく2種もしくはそれ以上を混合して使用
してもよい。
なお、上記したA)成分にモノエポキシ化合物
を適宜併用することは差支えなく、このモノエポ
キシ化合物としてはスチレンオキシド、シクロヘ
キセンオキシド、プロピレンオキシド、メチルグ
リシジルエーテル、エチルグリシジルエーテル、
フエニルグリシジルエーテル、アリルグリシジル
エーテル、オクチレンオキシド、ドデセンオキシ
ドなどが例示される。
また、このエポキシ樹脂を硬化させるための硬
化剤としては従来公知の種々のものを使用するこ
とができ、これには例えばジアミノジフエニルメ
タン、ジアミノジフエニルスルホン、メタフエニ
レンジアミンなどで代表されるアミン系硬化剤、
無水フタル酸、無水ピロメリツト酸、無水ベンゾ
フエノンテトラカルボン酸などの酸無水物系触
媒、あるいはフエノールノボラツク、クレゾール
ノボラツク等の1分子中に2個以上の水酸基を有
するものをあげることができ、これにはまた上記
した硬化剤とエポキシ樹脂との反応を促進させる
目的で各種硬化促進剤、例えばイミダゾールある
いはその誘導体、三級アミン系誘導体、ホスフイ
ン系誘導体、シクロアミジン誘導体、尿素誘導体
などを併用してもよい。
B)成分である無機質充填剤としては、代表的
なものとして結晶性あるいは非結晶性シリカをあ
げることができ、これにはエアロジル(デグツサ
社製商品名)、ウルトラジル(デグツサ社製商品
名)等の市販超微粉末シリカ(通常1〜30μmの
平均粒径を有するもの)、セライト(ジヨンマン
ビル社製商品名)、イムシル(イリノイスミネラ
ル社製商品名)、結晶性あるいは非結晶性石英粉
末(通常1〜30μmの平均粒径を有するもの)等
が例示される。しかし、これらの超微粉末シリカ
は補強性にはすぐれているが増粘が著しく流動性
を阻害するため、注型あるいはモールデイング成
型用には石英系粉末を選択使用することがよく、
これによればすぐれた諸特性を付与することがで
きる。
さらに、この充填剤については、本発明に係る
組成物の用途、目的等に応じては上記したシリカ
系以外の充填剤も使用することができ、これには
タルク、マイカ、クレー、カオリン、炭酸カルシ
ウム、アルミナ、亜鉛華、バライタ、ガラスバル
ーン、ガラス繊維、水酸化アルミニウム、水酸化
カルシウム、アスベスト、酸化チタン、酸化鉄、
窒化けい素等をあげることができ、これらはその
2種以上を併用してもよい。
なお、このB)成分としての無機質充填剤はこ
れをA)成分としてのエポキシ樹脂100重量部に
対し500重量部以上添加すると、その分散が困難
となるばかりでなく、加工性、低応力、耐クラツ
ク性などの物性において満足すべき結果を与えな
いようになるので、これはA)成分100重量部に
対し100〜500重量部の範囲で使用することがよ
い。
つぎにC)成分としてのカツプリング剤は本発
明の組成物の耐湿性向上に効果を発揮するもので
あり、これは式 R1(―Z―A)nで示され、R1は
水素原子または炭素数1〜20の非置換または置換
炭化水素基、Aは一般式
[Formula] (R 5 is a hydrogen atom or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 10 carbon atoms)
0.05 to 10 parts by weight of a coupling agent selected from a group represented by the following formula, m being an integer of 1 to 2, or a hydrolyzate thereof. To explain this, the present inventors have studied various ways to solve the above-mentioned disadvantages regarding curable epoxy resin compositions used for encapsulating electronic parts, and have found that the above-mentioned coupling agent added to epoxy resins is When the silicone compound represented by the formula R 1 (-Z-A) n or its hydrolyzate is used, this composition exhibits extremely excellent moisture resistance and also has good storage stability. It has been discovered that there is little corrosion of aluminum wiring in various electronic parts such as semiconductor devices sealed with materials, and therefore semiconductor devices such as ICs, LSIs, transistors, etc. using this composition as a sealant have been found. The present invention was developed after confirming that excellent reliability can be obtained and that this composition can be widely used for various paints, casting, general molding, electrical insulation, laminates, etc. completed. The composition according to the present invention will be explained in detail below. First, the curable epoxy resin as component A) used in the present invention is a curable epoxy resin consisting of an epoxy resin having two or more epoxy groups in one molecule and various curing agents. As the resin, there are no particular restrictions on molecular structure, molecular weight, etc., and various conventionally known resins can be used as long as they can be cured with a phenolic curing agent as described below. For example, epoxy resins synthesized from various novolac resins such as epichlorohydrin and bisphenol, alicyclic epoxy resins, and epoxy resins into which halogen atoms such as chlorine or bromine atoms are introduced can be cited. When used, it is not necessarily limited to only one type, but a mixture of two or more types may be used. In addition, there is no problem in appropriately using a monoepoxy compound in combination with the above-mentioned A) component, and examples of this monoepoxy compound include styrene oxide, cyclohexene oxide, propylene oxide, methyl glycidyl ether, ethyl glycidyl ether,
Examples include phenyl glycidyl ether, allyl glycidyl ether, octylene oxide, and dodecene oxide. Furthermore, various conventionally known curing agents can be used for curing this epoxy resin, such as diaminodiphenylmethane, diaminodiphenyl sulfone, metaphenylenediamine, etc. amine curing agent,
Examples include acid anhydride catalysts such as phthalic anhydride, pyromellitic anhydride, benzophenonetetracarboxylic anhydride, and those having two or more hydroxyl groups in one molecule such as phenol novolak and cresol novolak. In addition, various curing accelerators such as imidazole or its derivatives, tertiary amine derivatives, phosphine derivatives, cycloamidine derivatives, urea derivatives, etc. are used in combination to accelerate the reaction between the above-mentioned curing agent and the epoxy resin. You may. Typical examples of the inorganic filler that is component B) include crystalline or non-crystalline silica, including Aerosil (trade name manufactured by Degutsusa) and Ultrasil (trade name manufactured by Degutsusa). commercially available ultrafine powdered silica (usually having an average particle size of 1 to 30 μm), Celite (trade name manufactured by John Manville), Imusil (trade name manufactured by Illinois Minerals), crystalline or amorphous quartz powder ( Examples include those having an average particle diameter of usually 1 to 30 μm. However, although these ultrafine silica powders have excellent reinforcing properties, their thickening significantly impairs fluidity, so quartz-based powders are often selected for use in casting or molding.
According to this, various excellent properties can be imparted. Furthermore, regarding this filler, fillers other than the above-mentioned silica-based fillers can be used depending on the use, purpose, etc. of the composition according to the present invention, such as talc, mica, clay, kaolin, carbonate Calcium, alumina, zinc white, baryta, glass balloon, glass fiber, aluminum hydroxide, calcium hydroxide, asbestos, titanium oxide, iron oxide,
Examples include silicon nitride, and two or more of these may be used in combination. If more than 500 parts by weight of the inorganic filler as component B is added to 100 parts by weight of the epoxy resin as component A, it will not only be difficult to disperse, but also have poor processability, low stress, and resistance. Since this may not give satisfactory results in terms of physical properties such as crack resistance, it is preferable to use this in an amount of 100 to 500 parts by weight per 100 parts by weight of component A). Next, the coupling agent as component C) is effective in improving the moisture resistance of the composition of the present invention, and is represented by the formula R 1 (-Z-A) n , where R 1 is a hydrogen atom or Unsubstituted or substituted hydrocarbon group having 1 to 20 carbon atoms, A is a general formula
【式】(R2,R4は水素原子また
は炭素数1〜10の非置換または置換1価炭化水素
基、R3は炭素数1〜6の2価炭化水素基、Xは
アルコキシ基、アルケニルオキシ基、アシロキシ
基または水酸基)で示される基、Zは酸素原子ま
たは[Formula] (R 2 , R 4 is a hydrogen atom or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 10 carbon atoms, R 3 is a divalent hydrocarbon group having 1 to 6 carbon atoms, X is an alkoxy group, alkenyl (oxy group, acyloxy group or hydroxyl group), Z is an oxygen atom or
【式】(R5は水素原子または炭素数1〜
10の非置換または置換1価炭化水素基)で示され
る基、mは1〜2の整数で示されるものとされ
る。
このR1としてはメチル基、エチル基、プロピ
ル基、iSO―プロピル基、ブチル基、t―ブチル
基、オクチル基、ドデシル基などのアルキル基、
シクロペンチル基、シクロヘキシル基などのシク
ロアルキル基、ビニル基、アリル基などのアルケ
ニル基、2―フエニルエチル基などのアラルキル
基、フエニル基、トリル基、ナフチル基、キシリ
ル基などのアリール基、あるいはこれらの基の水
素原子の一部もしくは全部が塩素原子などのハロ
ゲン原子、シアノ基などで置換された基などから
選択される非置換または置換1価炭化水素基また
は式[Formula] (R 5 is a hydrogen atom or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 10 carbon atoms), m is an integer of 1 to 2. This R 1 includes alkyl groups such as methyl group, ethyl group, propyl group, iSO-propyl group, butyl group, t-butyl group, octyl group, and dodecyl group;
Cycloalkyl groups such as cyclopentyl group and cyclohexyl group, alkenyl groups such as vinyl group and allyl group, aralkyl groups such as 2-phenylethyl group, aryl groups such as phenyl group, tolyl group, naphthyl group, xylyl group, or these groups An unsubstituted or substituted monovalent hydrocarbon group or formula selected from groups in which some or all of the hydrogen atoms of are substituted with halogen atoms such as chlorine atoms, cyano groups, etc.
【式】【formula】
で示される2価の炭化水素基などが例示され、こ
のAとしての一般式 Examples include divalent hydrocarbon groups represented by the general formula A.
【式】におけ
るR2,R4としては上記R1と同様のもののうち炭
素数1〜10の非置換または置換1価炭化水素基
が、R3としてはメチレン基、エチレン基、プロ
ピレン基、ブチレン基などの2価炭化水素基が例
示されるが、このXはアルコキシ基、アルケニル
オキシ基、アシロキシ基または水酸基とされる。
この式 R1(―Z―A)nで示されるカツプリン
グ剤としては下記:
のものが例示されるが、これらはそれを加水分解
して得られるシロキサン化合物であつてもよく、
このシロキサン化合物もカツプリング剤としての
効果をもつものである。しかし、このカツプリン
グ剤としてはその分子中に少なくとも1ケの加水
分解し得る基を残存させたものとすることがよ
く、この加水分解可能基はけい素原子に結合した
水酸基であつてもよいし、これはまた他の加水分
解可能なシランとの混合物とし、それらを共加水
分解させたものであつてもよい。
このC)成分としてのカツプリング剤の使用量
は、これを前記した無機質充填剤100重量部に対
し0.05重量部以下とすると耐湿性の向上効果があ
まり見られず、これを10重量部以上とすると硬化
物のガラス転移点が低くなり、またこれが硬化物
表面に滲出するようになるので、これは無機質充
填剤100重量部当り0.05〜10重量部の範囲、好ま
しくは0.5〜6重量部の範囲とすることがよい。
なお、このC)成分の添加方法は、特にこれを定
める必要はなく、これはインテグラルブレンド、
無機質充填剤表面への付着のいずれで行なつても
よい。
本発明の組成物は上記したA)、B)および
C)成分を配合することによつて容易に得ること
ができるが、これには従来この種の組成物に用い
られているエポキシ系シラン、メルカプト系シラ
ン、アミン系シラン等のシリコーン化合物、アル
ミニウム化合物、アルキルチタネート化合物など
を添加してもよく、さらにはこの用途、目的に応
じて本発明の目的を阻害しない範囲において、カ
ーボンブラツク、黒鉛、ウオラスナイトなどの充
填剤、脂肪酸、ワツクスなどの離型剤、各種着色
剤、難燃剤、可撓性付与剤などを添加してもよ
い。
つぎに本発明の実施例をあげるが、例中におけ
る部はいずれも重量部を、また式中におけるMe
はメチル基、Etはエチル基を示したものであ
り、各例中における測定値はそれぞれ下記の方法
による測定結果を示したものである。
(1) 体積抵抗率;
直径100mm、厚さ2mmの円板を成形し(成形温
度175℃、成形時間2分、成形圧力70Kg/cm2)、こ
れを180℃で4時間ポストキユアし、ついでJIS
K6911に準じて初期抵抗値を算出し、さらにプレ
ツシヤークツカー(121℃、2.2atm)に200時間
放置し抵抗値を算出した。
(2) 曲げ強さ;
100×10×4(mm)の抗折棒を成形し(成形条
件;上記と同じ)180℃で4時間ポストキユアし
た後JIS K6911に準じて初期値を測定し、さらに
プレツシヤークツカー(121℃、2.2atm)に200
時間放置し曲げ強さを測定した。
(3) Siチツプとの接着性;
一辺が4mmで厚さが0.3mmの大きさのSiチツプ
を14PIN DIPのフレームにマウントした後、上記
した組成物で成形封止し(成形条件;上記と同
じ)、180℃で4時間ポストキユアーを行つた。そ
の後Siチツプを破壊しないようにして封止樹脂を
割り、Siチツプの表面と樹脂の接着の度合を調べ
〇、△、×の表示をもつて示した。
〇…きわめて良好
△…良好
×…不良
(4) 成形性;
直径100mm、厚さ2mmの円板を成形し(成形条
件;上記と同じ)、この成形の際の金型の隙間に
発生するバリ、および成形物表面へのシリコーン
化合物の滲出の有無を調べた。
〇…バリ、滲出なし
×…バリ、滲出あり
実施例1〜7、比較例1〜3
クレゾールノボラツク型エポキシ樹脂(チバ社
製、商品名ECN―1280)70部、フエノールノボ
ラツク樹脂(群栄化学社製、商品名MP―120)30
部、トリフエニルホスフイン2部、カルナバワツ
クス1部、カーボンブラツク1部、シリカ粉末
300部および下記に示した各種のシリコーン化合
物1.5部または2.5部を60〜100℃に加熱した8イ
ンチのミキシング2本ロールで3〜6分間混練し
たのち、冷却し、ついで粉砕した。In [Formula], R 2 and R 4 are unsubstituted or substituted monovalent hydrocarbon groups having 1 to 10 carbon atoms among the same as R 1 above, and R 3 is a methylene group, ethylene group, propylene group, butylene group. A divalent hydrocarbon group such as a group is exemplified, and X is an alkoxy group, an alkenyloxy group, an acyloxy group, or a hydroxyl group. The coupling agent represented by this formula R 1 (-Z-A) n is as follows: These are exemplified by siloxane compounds, but these may also be siloxane compounds obtained by hydrolyzing them,
This siloxane compound also has an effect as a coupling agent. However, this coupling agent preferably has at least one hydrolyzable group remaining in its molecule, and this hydrolyzable group may be a hydroxyl group bonded to a silicon atom. , it may also be a mixture with other hydrolyzable silanes and co-hydrolyzed with them. Regarding the amount of coupling agent used as component C), if it is less than 0.05 parts by weight per 100 parts by weight of the above-mentioned inorganic filler, the effect of improving moisture resistance will not be seen much, and if it is more than 10 parts by weight, Since the glass transition point of the cured product will be low and this will ooze out onto the surface of the cured product, the amount should be in the range of 0.05 to 10 parts by weight, preferably in the range of 0.5 to 6 parts by weight, per 100 parts by weight of the inorganic filler. It is good to do.
It should be noted that the method of adding component C) does not need to be determined in particular;
It may be carried out by adhering to the surface of the inorganic filler. The composition of the present invention can be easily obtained by blending the above-described components A), B), and C), and includes epoxy silane, which has been conventionally used in this type of composition, Silicone compounds such as mercapto silanes and amine silanes, aluminum compounds, alkyl titanate compounds, etc. may be added, and depending on the use and purpose, carbon black, graphite, Fillers such as walrus night, fatty acids, mold release agents such as wax, various coloring agents, flame retardants, flexibility imparting agents, etc. may be added. Next, examples of the present invention will be given. In the examples, all parts are parts by weight, and in the formula, Me
represents a methyl group and Et represents an ethyl group, and the measured values in each example represent the results of measurement by the following methods. (1) Volume resistivity: A disk with a diameter of 100 mm and a thickness of 2 mm is molded (molding temperature: 175°C, molding time: 2 minutes, molding pressure: 70 kg/cm 2 ), post-cured at 180°C for 4 hours, and then JIS
The initial resistance value was calculated according to K6911, and the resistance value was further calculated after being left in a pressure tanker (121°C, 2.2 atm) for 200 hours. (2) Bending strength: After forming a bending rod of 100 x 10 x 4 (mm) (forming conditions; same as above) and post-curing at 180℃ for 4 hours, the initial value was measured according to JIS K6911, and 200 to Plescher Kutska (121℃, 2.2atm)
The bending strength was measured after being left for a period of time. (3) Adhesion with Si chips: After mounting a Si chip with a side of 4 mm and a thickness of 0.3 mm on a 14PIN DIP frame, it was molded and sealed with the above composition (molding conditions: (same) and post cured at 180°C for 4 hours. After that, the sealing resin was broken without destroying the Si chip, and the degree of adhesion between the surface of the Si chip and the resin was examined and indicated by ○, △, and ×. 〇…Very good △…Good ×…Poor (4) Formability: A disk with a diameter of 100 mm and a thickness of 2 mm was molded (molding conditions: same as above), and the burrs generated in the gap between the molds during this molding were , and the presence or absence of exudation of the silicone compound onto the surface of the molded product was examined. 〇...Flash, no oozing ×...Flash, oozing Examples 1 to 7, Comparative Examples 1 to 3 70 parts of cresol novolac type epoxy resin (manufactured by Ciba, trade name ECN-1280), phenol novolac resin (Gunei Manufactured by Kagakusha, product name MP-120) 30
1 part triphenylphosphine, 1 part carnauba wax, 1 part carbon black, silica powder
300 parts and 1.5 parts or 2.5 parts of various silicone compounds shown below were kneaded for 3 to 6 minutes using two 8-inch mixing rolls heated to 60 to 100°C, cooled, and then ground.
【表】
つぎにこのようにして得た組成物1)〜10)に
ついて前記した方法によつてその保存安定性、接
着性、成形性をしらべると共に、その硬化物につ
いての体積抵抗率、曲げ強度を測定したところ、
つぎの第1表に示したとおりの結果が得られた。[Table] Next, the storage stability, adhesion, and moldability of the compositions 1) to 10) obtained in this manner were investigated using the methods described above, and the volume resistivity and bending strength of the cured products were investigated. When measured,
The results shown in Table 1 below were obtained.
【表】
実施例8〜13、比較例4
エポキシ当量220のエポキシクレゾールノボラ
ツク樹脂(日本化薬社製、商品名EOCN―102)
64.5部に、テトラヒドロ無水フタル酸35.5部、前
記実施例1で使用したカツプリング剤1.5部、溶
融シリカ250部、カーボンブラツク1部、カルナ
バワツクス1部、ステアリン酸1.5部およびC11Z
アジン(四国化成社製、商品名)0.8部を加
え、実施例1と同様に処理して組成物No.11を作つ
た。
また、上記のエポキシクレゾールノボラツク樹
脂100部にジアミノジフエニルメタン25部、前記
実施例1で使用したカツプリング剤1.5部、結晶
性石英粉230部およびステアリン酸2部を加え、
実施例1と同様に処理して組成物12を作り、さら
にフエノールボラツク型エポキシ樹脂(日本化薬
社製、商品名EPPN)65部に実施例1で使用した
フエノールノボラツク樹脂35部トリフエニルホス
フイン1部、カルナバワツクス1部、カーボンブ
ラツク1部、溶融石英粉末300部および実施例1
で使用したカツプリング剤を下記第2表に示した
量で添加し、実施例1と同様に処理して組成物13
〜17を作つた。
第 2 表
組成物No. カツプリング剤添加量(部)
13 0.5
14 2.0
15 5.0
16 10.0
17 0.04
つぎに、これらの組成物No.11〜No.17について、
実施例1と同様にしてそれらの物性をしらべたと
ころ、つぎの第3表に示すとおりの結果が得られ
た。[Table] Examples 8 to 13, Comparative Example 4 Epoxy cresol novolak resin with an epoxy equivalent of 220 (manufactured by Nippon Kayaku Co., Ltd., trade name EOCN-102)
64.5 parts, 35.5 parts of tetrahydrophthalic anhydride, 1.5 parts of the coupling agent used in Example 1, 250 parts of fused silica, 1 part of carbon black, 1 part of carnauba wax, 1.5 parts of stearic acid, and C 11 Z
0.8 part of azine (manufactured by Shikoku Kasei Co., Ltd., trade name) was added and treated in the same manner as in Example 1 to prepare Composition No. 11. Further, 25 parts of diaminodiphenylmethane, 1.5 parts of the coupling agent used in Example 1, 230 parts of crystalline quartz powder, and 2 parts of stearic acid were added to 100 parts of the above epoxy cresol novolak resin,
Composition 12 was prepared in the same manner as in Example 1, and further added to 65 parts of phenol volak type epoxy resin (manufactured by Nippon Kayaku Co., Ltd., trade name: EPPN) and 35 parts of the phenol volak resin used in Example 1, triphenyl. 1 part phosphine, 1 part carnauba wax, 1 part carbon black, 300 parts fused silica powder and Example 1
The coupling agent used in Example 1 was added in the amount shown in Table 2 below, and treated in the same manner as in Example 1 to obtain Composition 13.
I made ~17. Table 2 Composition No. Amount of coupling agent added (parts) 13 0.5 14 2.0 15 5.0 16 10.0 17 0.04 Next, regarding these compositions No. 11 to No. 17,
When their physical properties were examined in the same manner as in Example 1, the results shown in Table 3 below were obtained.
【表】【table】
【表】
実施例 14
シリコンチツプに膜厚1μ、線巾10μのアルミ
ニウム配線を施こし、これを14PINのフレームに
マウントした後、実施例1〜5、比較例1〜3で
使用した組成物1〜5および8〜10で成形封止
し、180℃で時間ポストキユアーを行ない、つい
でこれをプレツシヤークツカー(140℃水蒸気圧
3.1Kg/cm2)に放置してこのアルミニウム配線の
腐蝕によるオープン不良を測定したところ、つぎ
の第4表に示すとおりの結果が得られた。なお、
表中の数字はこの結果を不良数/母数で示したも
のである。[Table] Example 14 After applying aluminum wiring with a film thickness of 1μ and a line width of 10μ to a silicon chip and mounting it on a 14PIN frame, composition 1 used in Examples 1 to 5 and Comparative Examples 1 to 3 was applied. 5 and 8 to 10, post-cured at 180℃ for an hour, and then placed in a pressurizer (140℃ water vapor pressure).
3.1 Kg/cm 2 ), and open defects due to corrosion of the aluminum wiring were measured, and the results shown in Table 4 below were obtained. In addition,
The numbers in the table represent the results as number of defectives/parameter.
Claims (1)
子または炭素数1〜20の非置換または置換炭化
水素基、Aは一般式
【式】(R2,R4は水素原子ま たは炭素数1〜10の非置換または置換1価炭化水
素基、R3は炭素数1〜6の2価炭化水素基、X
はアルコキシ基、アルケニルオキシ基、アシロキ
シ基または水酸基)で示される基、Z
は酸素原子または【式】(R5は水素原子ま たは炭素数1〜10の非置換または置換1価炭化水
素基)で示される基、mは1〜2の整数〕で示さ
れる化合物あるいはその加水分解物から選択され
るカツプリング剤 0.05〜10重量部 とからなることを特徴とする硬化性エポキシ樹脂
組成物。[Claims] 1 A Curable epoxy resin 100 parts by weight B Inorganic filler 100 to 500 parts by weight C General formula R 1 (-Z-A) n [Here, R 1 is a hydrogen atom or a carbon number of 1 to 1] 20 unsubstituted or substituted hydrocarbon groups , A is the general formula 6 divalent hydrocarbon group, X
is a group represented by an alkoxy group, alkenyloxy group, acyloxy group or hydroxyl group, Z
is an oxygen atom or a group represented by the formula (R 5 is a hydrogen atom or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 10 carbon atoms), m is an integer of 1 to 2] or a hydration thereof A curable epoxy resin composition comprising 0.05 to 10 parts by weight of a coupling agent selected from decomposition products.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7319583A JPS59197421A (en) | 1983-04-26 | 1983-04-26 | Curable epoxy resin composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7319583A JPS59197421A (en) | 1983-04-26 | 1983-04-26 | Curable epoxy resin composition |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59197421A JPS59197421A (en) | 1984-11-09 |
JPS6248968B2 true JPS6248968B2 (en) | 1987-10-16 |
Family
ID=13511113
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7319583A Granted JPS59197421A (en) | 1983-04-26 | 1983-04-26 | Curable epoxy resin composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59197421A (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63110212A (en) * | 1986-10-27 | 1988-05-14 | Toshiba Chem Corp | Sealing resin composition |
US5220047A (en) * | 1990-09-17 | 1993-06-15 | Union Carbide Chemicals & Plastics Technology Corporation | Carbamate silicon compounds as latent coupling agents and process for preparation and use |
JP4672135B2 (en) * | 2000-12-15 | 2011-04-20 | 旭化成イーマテリアルズ株式会社 | Alkoxysilane compound and photosensitive resin composition |
DE102005026085A1 (en) * | 2005-06-07 | 2006-12-14 | Construction Research & Technology Gmbh | Silane-modified urea derivatives, processes for their preparation and their use as rheology aids |
JP5565220B2 (en) * | 2010-09-03 | 2014-08-06 | 横浜ゴム株式会社 | Moisture curable resin composition |
WO2016093383A1 (en) * | 2014-12-09 | 2016-06-16 | 한국생산기술연구원 | Thermosetting alkoxysilyl compound having two or more alkoxysilyl groups, composition and cured product comprising same, use thereof, and method for preparing alkoxysilyl compound |
US20230043080A1 (en) * | 2021-07-19 | 2023-02-09 | Momentive Performance Materials Inc. | Silane coupling agents to improve resin adhesion |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55153357A (en) * | 1979-05-18 | 1980-11-29 | Hitachi Ltd | Manufacturing method of resin sealed semiconductor device |
JPS5657792A (en) * | 1979-10-15 | 1981-05-20 | Shin Etsu Chem Co Ltd | Preparation of ureido group-containing alkoxysilane |
JPS5679150A (en) * | 1979-11-30 | 1981-06-29 | Daikin Ind Ltd | Epoxy composition containing fluorine |
JPS56122145A (en) * | 1980-02-29 | 1981-09-25 | Shin Etsu Chem Co Ltd | Resin composition for sealing semiconductor device |
JPS56136816A (en) * | 1980-03-31 | 1981-10-26 | Shin Etsu Chem Co Ltd | Epoxy resin composition |
-
1983
- 1983-04-26 JP JP7319583A patent/JPS59197421A/en active Granted
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55153357A (en) * | 1979-05-18 | 1980-11-29 | Hitachi Ltd | Manufacturing method of resin sealed semiconductor device |
JPS5657792A (en) * | 1979-10-15 | 1981-05-20 | Shin Etsu Chem Co Ltd | Preparation of ureido group-containing alkoxysilane |
JPS5679150A (en) * | 1979-11-30 | 1981-06-29 | Daikin Ind Ltd | Epoxy composition containing fluorine |
JPS56122145A (en) * | 1980-02-29 | 1981-09-25 | Shin Etsu Chem Co Ltd | Resin composition for sealing semiconductor device |
JPS56136816A (en) * | 1980-03-31 | 1981-10-26 | Shin Etsu Chem Co Ltd | Epoxy resin composition |
Also Published As
Publication number | Publication date |
---|---|
JPS59197421A (en) | 1984-11-09 |
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