JPS6246227A - 光部品の反射点測定方法 - Google Patents

光部品の反射点測定方法

Info

Publication number
JPS6246227A
JPS6246227A JP18653085A JP18653085A JPS6246227A JP S6246227 A JPS6246227 A JP S6246227A JP 18653085 A JP18653085 A JP 18653085A JP 18653085 A JP18653085 A JP 18653085A JP S6246227 A JPS6246227 A JP S6246227A
Authority
JP
Japan
Prior art keywords
measured
semiconductor laser
frequency
frequency interval
deltaf
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18653085A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0362212B2 (enExample
Inventor
Tomoyuki Kikukawa
知之 菊川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP18653085A priority Critical patent/JPS6246227A/ja
Publication of JPS6246227A publication Critical patent/JPS6246227A/ja
Publication of JPH0362212B2 publication Critical patent/JPH0362212B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Light Guides In General And Applications Therefor (AREA)
JP18653085A 1985-08-24 1985-08-24 光部品の反射点測定方法 Granted JPS6246227A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18653085A JPS6246227A (ja) 1985-08-24 1985-08-24 光部品の反射点測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18653085A JPS6246227A (ja) 1985-08-24 1985-08-24 光部品の反射点測定方法

Publications (2)

Publication Number Publication Date
JPS6246227A true JPS6246227A (ja) 1987-02-28
JPH0362212B2 JPH0362212B2 (enExample) 1991-09-25

Family

ID=16190105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18653085A Granted JPS6246227A (ja) 1985-08-24 1985-08-24 光部品の反射点測定方法

Country Status (1)

Country Link
JP (1) JPS6246227A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013190348A (ja) * 2012-03-14 2013-09-26 Nippon Telegr & Teleph Corp <Ntt> 光線路監視装置
JP2013231657A (ja) * 2012-04-27 2013-11-14 Nippon Telegr & Teleph Corp <Ntt> 光線路監視装置
JP2013257296A (ja) * 2012-06-14 2013-12-26 Nippon Telegr & Teleph Corp <Ntt> 光線路監視装置およびその制御方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5183546A (enExample) * 1974-12-07 1976-07-22 Licentia Gmbh
JPS6086438A (ja) * 1983-10-18 1985-05-16 Nippon Telegr & Teleph Corp <Ntt> 光フアイバの試験方法および装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5183546A (enExample) * 1974-12-07 1976-07-22 Licentia Gmbh
JPS6086438A (ja) * 1983-10-18 1985-05-16 Nippon Telegr & Teleph Corp <Ntt> 光フアイバの試験方法および装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013190348A (ja) * 2012-03-14 2013-09-26 Nippon Telegr & Teleph Corp <Ntt> 光線路監視装置
JP2013231657A (ja) * 2012-04-27 2013-11-14 Nippon Telegr & Teleph Corp <Ntt> 光線路監視装置
JP2013257296A (ja) * 2012-06-14 2013-12-26 Nippon Telegr & Teleph Corp <Ntt> 光線路監視装置およびその制御方法

Also Published As

Publication number Publication date
JPH0362212B2 (enExample) 1991-09-25

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