JPH0362212B2 - - Google Patents
Info
- Publication number
- JPH0362212B2 JPH0362212B2 JP60186530A JP18653085A JPH0362212B2 JP H0362212 B2 JPH0362212 B2 JP H0362212B2 JP 60186530 A JP60186530 A JP 60186530A JP 18653085 A JP18653085 A JP 18653085A JP H0362212 B2 JPH0362212 B2 JP H0362212B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- optical component
- measured
- optical
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Light Guides In General And Applications Therefor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18653085A JPS6246227A (ja) | 1985-08-24 | 1985-08-24 | 光部品の反射点測定方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18653085A JPS6246227A (ja) | 1985-08-24 | 1985-08-24 | 光部品の反射点測定方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6246227A JPS6246227A (ja) | 1987-02-28 |
| JPH0362212B2 true JPH0362212B2 (enExample) | 1991-09-25 |
Family
ID=16190105
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18653085A Granted JPS6246227A (ja) | 1985-08-24 | 1985-08-24 | 光部品の反射点測定方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6246227A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5694979B2 (ja) * | 2012-03-14 | 2015-04-01 | 日本電信電話株式会社 | 光線路監視装置 |
| JP5886681B2 (ja) * | 2012-04-27 | 2016-03-16 | 日本電信電話株式会社 | 光線路監視装置 |
| JP5991859B2 (ja) * | 2012-06-14 | 2016-09-14 | 日本電信電話株式会社 | 光線路監視装置およびその制御方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2457930A1 (de) * | 1974-12-07 | 1976-06-10 | Licentia Gmbh | Verfahren zur fehlerortung bei glasfaserlichtleitern |
| JPS6086438A (ja) * | 1983-10-18 | 1985-05-16 | Nippon Telegr & Teleph Corp <Ntt> | 光フアイバの試験方法および装置 |
-
1985
- 1985-08-24 JP JP18653085A patent/JPS6246227A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6246227A (ja) | 1987-02-28 |
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