JPS6245664B2 - - Google Patents

Info

Publication number
JPS6245664B2
JPS6245664B2 JP52056062A JP5606277A JPS6245664B2 JP S6245664 B2 JPS6245664 B2 JP S6245664B2 JP 52056062 A JP52056062 A JP 52056062A JP 5606277 A JP5606277 A JP 5606277A JP S6245664 B2 JPS6245664 B2 JP S6245664B2
Authority
JP
Japan
Prior art keywords
ions
gas
orifice
vacuum chamber
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52056062A
Other languages
English (en)
Japanese (ja)
Other versions
JPS53142294A (en
Inventor
Bii Furenchi Jon
Emu Riido Neiru
Ei Batsukurei Janetsuto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Toronto
Original Assignee
University of Toronto
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Toronto filed Critical University of Toronto
Priority to JP5606277A priority Critical patent/JPS53142294A/ja
Publication of JPS53142294A publication Critical patent/JPS53142294A/ja
Publication of JPS6245664B2 publication Critical patent/JPS6245664B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP5606277A 1977-05-17 1977-05-17 Method and apparatus for focusing ions Granted JPS53142294A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5606277A JPS53142294A (en) 1977-05-17 1977-05-17 Method and apparatus for focusing ions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5606277A JPS53142294A (en) 1977-05-17 1977-05-17 Method and apparatus for focusing ions

Publications (2)

Publication Number Publication Date
JPS53142294A JPS53142294A (en) 1978-12-11
JPS6245664B2 true JPS6245664B2 (US20030220297A1-20031127-C00074.png) 1987-09-28

Family

ID=13016585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5606277A Granted JPS53142294A (en) 1977-05-17 1977-05-17 Method and apparatus for focusing ions

Country Status (1)

Country Link
JP (1) JPS53142294A (US20030220297A1-20031127-C00074.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0281379U (US20030220297A1-20031127-C00074.png) * 1988-12-14 1990-06-22

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07118295B2 (ja) * 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計
JP2002042721A (ja) * 2000-07-19 2002-02-08 Anelva Corp イオン付着質量分析装置
JP2010153278A (ja) * 2008-12-26 2010-07-08 Hitachi High-Technologies Corp 荷電粒子線加工装置
US9437410B2 (en) * 2011-11-21 2016-09-06 Dh Technologies Development Pte. Ltd. System and method for applying curtain gas flow in a mass spectrometer
US11133167B2 (en) * 2018-03-02 2021-09-28 Dh Technologies Development Pte. Ltd. Integrated low cost curtain plate, orifice PCB and ion lens assembly

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0281379U (US20030220297A1-20031127-C00074.png) * 1988-12-14 1990-06-22

Also Published As

Publication number Publication date
JPS53142294A (en) 1978-12-11

Similar Documents

Publication Publication Date Title
US4121099A (en) Method and apparatus for focussing and declustering trace ions
JP3176918B2 (ja) 微量成分分析装置および方法
US5270542A (en) Apparatus and method for shaping and detecting a particle beam
JP3493460B2 (ja) プラズマ質量スペクトロメータ
US6278110B1 (en) Orthogonal ion sampling for APCI mass spectrometry
US4531056A (en) Method and apparatus for the mass spectrometric analysis of solutions
JP5281223B2 (ja) 質量分析において反応/衝突セルへのイオン源ガスの進入を防止するための装置及び方法
US6639216B2 (en) Orthogonal ion sampling for APCI mass spectrometry
JP3791783B2 (ja) イオン付着質量分析装置、イオン化装置、およびイオン化方法
JP2018521471A (ja) 質量分析装置並びに該装置においてイオンの損失及び次段の真空負荷を低減するために用いられる方法
JP3385327B2 (ja) 三次元四重極質量分析装置
JPH08222181A (ja) キャリヤ−ガス中のサンプル分子の検出方法と装置
JPH0512664B2 (US20030220297A1-20031127-C00074.png)
JP3189652B2 (ja) 質量分析装置
JPH11345591A (ja) サイクロイド質量分析計及びそれに使用されるイオナイザ―
US20010054685A1 (en) Conditioning of an ion beam for injection into a time-of-flight mass spectrometer
US8368012B2 (en) Guiding charged droplets and ions in an electrospray ion source
JP3385707B2 (ja) 質量分析装置
JPS6245664B2 (US20030220297A1-20031127-C00074.png)
JPH1012188A (ja) 大気圧イオン化イオントラップ質量分析方法及び装置
US5256874A (en) Gridded electron reversal ionizer
US9589782B2 (en) Charged droplets generating apparatus including a gas conduit for laminarization of gas flows
GB1584459A (en) Method of focussing trace ions and apparatus for analyzing trace ions when used in the method
JPH11288683A (ja) 大気圧イオン化質量分析計
JP2000100375A (ja) 質量分析計及びその静電レンズ