JPS6245664B2 - - Google Patents
Info
- Publication number
- JPS6245664B2 JPS6245664B2 JP52056062A JP5606277A JPS6245664B2 JP S6245664 B2 JPS6245664 B2 JP S6245664B2 JP 52056062 A JP52056062 A JP 52056062A JP 5606277 A JP5606277 A JP 5606277A JP S6245664 B2 JPS6245664 B2 JP S6245664B2
- Authority
- JP
- Japan
- Prior art keywords
- ions
- gas
- orifice
- vacuum chamber
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 150000002500 ions Chemical class 0.000 claims description 145
- 230000005684 electric field Effects 0.000 claims description 42
- 238000000034 method Methods 0.000 claims description 14
- 238000001816 cooling Methods 0.000 claims description 7
- 238000012546 transfer Methods 0.000 claims description 2
- 230000005686 electrostatic field Effects 0.000 claims 1
- 239000007789 gas Substances 0.000 description 93
- 238000006243 chemical reaction Methods 0.000 description 12
- 238000013467 fragmentation Methods 0.000 description 8
- 238000006062 fragmentation reaction Methods 0.000 description 8
- 230000035939 shock Effects 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 238000005086 pumping Methods 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 5
- 238000000354 decomposition reaction Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 239000000376 reactant Substances 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000012159 carrier gas Substances 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 230000007935 neutral effect Effects 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- 230000009471 action Effects 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 238000010884 ion-beam technique Methods 0.000 description 3
- 238000004949 mass spectrometry Methods 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- YZCKVEUIGOORGS-NJFSPNSNSA-N Tritium Chemical compound [3H] YZCKVEUIGOORGS-NJFSPNSNSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- NNPPMTNAJDCUHE-UHFFFAOYSA-N isobutane Chemical compound CC(C)C NNPPMTNAJDCUHE-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 229910052722 tritium Inorganic materials 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 108010083687 Ion Pumps Proteins 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- 238000000065 atmospheric pressure chemical ionisation Methods 0.000 description 1
- 238000005345 coagulation Methods 0.000 description 1
- 230000015271 coagulation Effects 0.000 description 1
- 239000000110 cooling liquid Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- KEUKAQNPUBYCIC-UHFFFAOYSA-N ethaneperoxoic acid;hydrogen peroxide Chemical compound OO.CC(=O)OO KEUKAQNPUBYCIC-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000005596 ionic collisions Effects 0.000 description 1
- 239000001282 iso-butane Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 230000002459 sustained effect Effects 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5606277A JPS53142294A (en) | 1977-05-17 | 1977-05-17 | Method and apparatus for focusing ions |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5606277A JPS53142294A (en) | 1977-05-17 | 1977-05-17 | Method and apparatus for focusing ions |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS53142294A JPS53142294A (en) | 1978-12-11 |
JPS6245664B2 true JPS6245664B2 (US20030220297A1-20031127-C00074.png) | 1987-09-28 |
Family
ID=13016585
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5606277A Granted JPS53142294A (en) | 1977-05-17 | 1977-05-17 | Method and apparatus for focusing ions |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53142294A (US20030220297A1-20031127-C00074.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0281379U (US20030220297A1-20031127-C00074.png) * | 1988-12-14 | 1990-06-22 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07118295B2 (ja) * | 1985-10-30 | 1995-12-18 | 株式会社日立製作所 | 質量分析計 |
JP2002042721A (ja) * | 2000-07-19 | 2002-02-08 | Anelva Corp | イオン付着質量分析装置 |
JP2010153278A (ja) * | 2008-12-26 | 2010-07-08 | Hitachi High-Technologies Corp | 荷電粒子線加工装置 |
US9437410B2 (en) * | 2011-11-21 | 2016-09-06 | Dh Technologies Development Pte. Ltd. | System and method for applying curtain gas flow in a mass spectrometer |
US11133167B2 (en) * | 2018-03-02 | 2021-09-28 | Dh Technologies Development Pte. Ltd. | Integrated low cost curtain plate, orifice PCB and ion lens assembly |
-
1977
- 1977-05-17 JP JP5606277A patent/JPS53142294A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0281379U (US20030220297A1-20031127-C00074.png) * | 1988-12-14 | 1990-06-22 |
Also Published As
Publication number | Publication date |
---|---|
JPS53142294A (en) | 1978-12-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4121099A (en) | Method and apparatus for focussing and declustering trace ions | |
JP3176918B2 (ja) | 微量成分分析装置および方法 | |
US5270542A (en) | Apparatus and method for shaping and detecting a particle beam | |
JP3493460B2 (ja) | プラズマ質量スペクトロメータ | |
US6278110B1 (en) | Orthogonal ion sampling for APCI mass spectrometry | |
US4531056A (en) | Method and apparatus for the mass spectrometric analysis of solutions | |
JP5281223B2 (ja) | 質量分析において反応/衝突セルへのイオン源ガスの進入を防止するための装置及び方法 | |
US6639216B2 (en) | Orthogonal ion sampling for APCI mass spectrometry | |
JP3791783B2 (ja) | イオン付着質量分析装置、イオン化装置、およびイオン化方法 | |
JP2018521471A (ja) | 質量分析装置並びに該装置においてイオンの損失及び次段の真空負荷を低減するために用いられる方法 | |
JP3385327B2 (ja) | 三次元四重極質量分析装置 | |
JPH08222181A (ja) | キャリヤ−ガス中のサンプル分子の検出方法と装置 | |
JPH0512664B2 (US20030220297A1-20031127-C00074.png) | ||
JP3189652B2 (ja) | 質量分析装置 | |
JPH11345591A (ja) | サイクロイド質量分析計及びそれに使用されるイオナイザ― | |
US20010054685A1 (en) | Conditioning of an ion beam for injection into a time-of-flight mass spectrometer | |
US8368012B2 (en) | Guiding charged droplets and ions in an electrospray ion source | |
JP3385707B2 (ja) | 質量分析装置 | |
JPS6245664B2 (US20030220297A1-20031127-C00074.png) | ||
JPH1012188A (ja) | 大気圧イオン化イオントラップ質量分析方法及び装置 | |
US5256874A (en) | Gridded electron reversal ionizer | |
US9589782B2 (en) | Charged droplets generating apparatus including a gas conduit for laminarization of gas flows | |
GB1584459A (en) | Method of focussing trace ions and apparatus for analyzing trace ions when used in the method | |
JPH11288683A (ja) | 大気圧イオン化質量分析計 | |
JP2000100375A (ja) | 質量分析計及びその静電レンズ |