JPS6241347B2 - - Google Patents
Info
- Publication number
- JPS6241347B2 JPS6241347B2 JP15269080A JP15269080A JPS6241347B2 JP S6241347 B2 JPS6241347 B2 JP S6241347B2 JP 15269080 A JP15269080 A JP 15269080A JP 15269080 A JP15269080 A JP 15269080A JP S6241347 B2 JPS6241347 B2 JP S6241347B2
- Authority
- JP
- Japan
- Prior art keywords
- molded product
- hole
- insulating
- withstand voltage
- ground electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 31
- 239000004020 conductor Substances 0.000 claims description 13
- 239000012212 insulator Substances 0.000 claims description 8
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 4
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 4
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15269080A JPS5776460A (en) | 1980-10-30 | 1980-10-30 | Method for testing dielectric strength of molded article |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15269080A JPS5776460A (en) | 1980-10-30 | 1980-10-30 | Method for testing dielectric strength of molded article |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5776460A JPS5776460A (en) | 1982-05-13 |
JPS6241347B2 true JPS6241347B2 (enrdf_load_stackoverflow) | 1987-09-02 |
Family
ID=15545996
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15269080A Granted JPS5776460A (en) | 1980-10-30 | 1980-10-30 | Method for testing dielectric strength of molded article |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5776460A (enrdf_load_stackoverflow) |
-
1980
- 1980-10-30 JP JP15269080A patent/JPS5776460A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5776460A (en) | 1982-05-13 |