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JPH0312976Y2
(forum.php)
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1987-02-19 |
1991-03-26 |
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1992-06-11 |
2002-04-30 |
Cascade Microtech, Inc. |
Wafer probe station having environment control enclosure
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1992-06-11 |
1994-09-06 |
Cascade Microtech, Inc. |
Wafer probe station having integrated guarding, Kelvin connection and shielding systems
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1995-04-14 |
1996-10-01 |
Cascade Microtech, Inc. |
System for evaluating probing networks
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1997-05-28 |
2001-05-15 |
Cascade Microtech, Inc. |
Probe holder for low current measurements
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1996-08-08 |
1999-06-22 |
Cascade Microtech, Inc. |
Membrane probing system with local contact scrub
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1997-06-06 |
1999-12-14 |
Cascade Microtech, Inc. |
Probe station having inner and outer shielding
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1999-06-30 |
2002-09-03 |
Cascade Microtech, Inc. |
Probe station thermal chuck with shielding for capacitive current
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2000-02-25 |
2005-01-04 |
Cascade Microtech, Inc. |
Membrane probing system
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2000-09-05 |
2005-11-15 |
Cascade Microtech, Inc. |
Chuck for holding a device under test
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2000-09-05 |
2005-07-05 |
Cascade Microtech, Inc. |
Probe station
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DE20114544U1
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2000-12-04 |
2002-02-21 |
Cascade Microtech, Inc., Beaverton, Oreg. |
Wafersonde
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2001-05-04 |
2005-11-29 |
Cascade Microtech, Inc. |
Fiber optic wafer probe
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2001-08-21 |
2008-04-08 |
Cascade Microtech, Inc. |
Membrane probing system
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2002-01-25 |
2004-08-17 |
Cascade Microtech, Inc. |
Probe station
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2002-05-23 |
2008-10-22 |
캐스케이드 마이크로테크 인코포레이티드 |
피시험 디바이스를 테스트하기 위한 프로브
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2002-11-08 |
2005-01-25 |
Cascade Microtech, Inc. |
Probe station with low noise characteristics
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2002-11-13 |
2004-04-20 |
Cascade Microtech, Inc. |
Probe for combined signals
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2002-11-25 |
2007-07-31 |
Cascade Microtech, Inc. |
Probe station with low inductance path
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2002-12-13 |
2005-03-01 |
Cascade Microtech, Inc. |
Guarded tub enclosure
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2003-05-06 |
2007-05-22 |
Cascade Microtech, Inc. |
Switched suspended conductor and connection
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2003-05-23 |
2009-02-17 |
Cascade Microtech, Inc. |
Chuck for holding a device under test
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2003-05-23 |
2006-06-06 |
Sharp Laboratories Of America, Inc. |
Shielded probe for testing a device under test
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2003-12-24 |
2007-03-06 |
Cascade Microtech, Inc. |
Chuck with integrated wafer support
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2004-06-07 |
2005-12-22 |
Cascade Microtech, Inc. |
Thermal optical chuck
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2004-06-14 |
2008-02-12 |
Cascade Microtech, Inc. |
Localizing a temperature of a device for testing
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KR101157449B1
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2004-07-07 |
2012-06-22 |
캐스케이드 마이크로테크 인코포레이티드 |
멤브레인 서스펜디드 프로브를 구비한 프로브 헤드
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2004-09-13 |
2007-05-30 |
Cascade Microtech, Inc. |
Double sided probing structures
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JP2006207768A
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*
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2005-01-31 |
2006-08-10 |
Kayaba Ind Co Ltd |
シールチェック機能を備えた接続構造
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2005-01-31 |
2009-05-19 |
Cascade Microtech, Inc. |
Interface for testing semiconductors
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2005-06-08 |
2008-11-11 |
Cascade Microtech, Inc. |
Probe for high frequency signals
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2005-06-13 |
2012-11-21 |
カスケード マイクロテック インコーポレイテッド |
広帯域能動／受動差動信号プローブ
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2006-06-09 |
2009-10-27 |
Cascade Microtech, Inc. |
Differential signal probe with integral balun
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2006-06-12 |
2008-10-28 |
Cascade Microtech, Inc. |
On-wafer test structures for differential signals
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2006-06-12 |
2008-07-22 |
Cascade Microtech, Inc. |
Test structure and probe for differential signals
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2008-11-21 |
2013-04-02 |
Cascade Microtech, Inc. |
Replaceable coupon for a probing apparatus
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