JPS6237549B2 - - Google Patents

Info

Publication number
JPS6237549B2
JPS6237549B2 JP53045684A JP4568478A JPS6237549B2 JP S6237549 B2 JPS6237549 B2 JP S6237549B2 JP 53045684 A JP53045684 A JP 53045684A JP 4568478 A JP4568478 A JP 4568478A JP S6237549 B2 JPS6237549 B2 JP S6237549B2
Authority
JP
Japan
Prior art keywords
gate
voltage
transistor
threshold voltage
mos transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53045684A
Other languages
English (en)
Japanese (ja)
Other versions
JPS54137286A (en
Inventor
Yoshiharu Fujimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP4568478A priority Critical patent/JPS54137286A/ja
Publication of JPS54137286A publication Critical patent/JPS54137286A/ja
Publication of JPS6237549B2 publication Critical patent/JPS6237549B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0248Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0266Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Protection Of Static Devices (AREA)
  • Amplifiers (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
JP4568478A 1978-04-17 1978-04-17 Semiconductor device Granted JPS54137286A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4568478A JPS54137286A (en) 1978-04-17 1978-04-17 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4568478A JPS54137286A (en) 1978-04-17 1978-04-17 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS54137286A JPS54137286A (en) 1979-10-24
JPS6237549B2 true JPS6237549B2 (zh) 1987-08-13

Family

ID=12726212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4568478A Granted JPS54137286A (en) 1978-04-17 1978-04-17 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS54137286A (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0087155B1 (en) * 1982-02-22 1991-05-29 Kabushiki Kaisha Toshiba Means for preventing the breakdown of an insulation layer in semiconductor devices
DE3586268T2 (de) * 1984-05-03 1993-02-25 Digital Equipment Corp Eingangs-schutzanordnung fuer vlsi-schaltungsanordnungen.
JPS61283155A (ja) * 1985-06-07 1986-12-13 Mitsubishi Electric Corp 半導体装置の入力保護回路
US5436183A (en) * 1990-04-17 1995-07-25 National Semiconductor Corporation Electrostatic discharge protection transistor element fabrication process
JP3587537B2 (ja) 1992-12-09 2004-11-10 株式会社半導体エネルギー研究所 半導体装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5181579A (zh) * 1975-01-16 1976-07-16 Hitachi Ltd

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5181579A (zh) * 1975-01-16 1976-07-16 Hitachi Ltd

Also Published As

Publication number Publication date
JPS54137286A (en) 1979-10-24

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