JPS6232406B2 - - Google Patents

Info

Publication number
JPS6232406B2
JPS6232406B2 JP51102520A JP10252076A JPS6232406B2 JP S6232406 B2 JPS6232406 B2 JP S6232406B2 JP 51102520 A JP51102520 A JP 51102520A JP 10252076 A JP10252076 A JP 10252076A JP S6232406 B2 JPS6232406 B2 JP S6232406B2
Authority
JP
Japan
Prior art keywords
point
lens
mask
sections
projector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51102520A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5229252A (en
Inventor
Rorensu Deimatsuteo Hooru
Aroishiusu Rosu Josefu
Kenesu Sutaan Hawaado
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dynell Electronics Corp
Original Assignee
Dynell Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dynell Electronics Corp filed Critical Dynell Electronics Corp
Publication of JPS5229252A publication Critical patent/JPS5229252A/ja
Publication of JPS6232406B2 publication Critical patent/JPS6232406B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/02Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g. controlling overlapping of pictures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2536Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
JP51102520A 1975-08-27 1976-08-27 Method of determining space position of point on surface of matter Granted JPS5229252A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/608,265 US4175862A (en) 1975-08-27 1975-08-27 Arrangement for sensing the geometric characteristics of an object

Publications (2)

Publication Number Publication Date
JPS5229252A JPS5229252A (en) 1977-03-04
JPS6232406B2 true JPS6232406B2 ( ) 1987-07-14

Family

ID=24435735

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51102520A Granted JPS5229252A (en) 1975-08-27 1976-08-27 Method of determining space position of point on surface of matter

Country Status (13)

Country Link
US (2) US4175862A ( )
JP (1) JPS5229252A ( )
BE (1) BE845465A ( )
CA (1) CA1079965A ( )
CH (1) CH611016A5 ( )
DE (1) DE2637905A1 ( )
DK (1) DK386576A ( )
ES (1) ES451007A1 ( )
FR (1) FR2322358A1 ( )
GB (1) GB1570091A ( )
IT (1) IT1073688B ( )
NL (1) NL7609498A ( )
SE (2) SE432021B ( )

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012508370A (ja) * 2008-11-07 2012-04-05 ソシエテ ド テクノロジー ミシュラン 能動的立体視によるタイヤ表面の凹凸評価

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JP2008537190A (ja) * 2005-01-07 2008-09-11 ジェスチャー テック,インコーポレイテッド 赤外線パターンを照射することによる対象物の三次元像の生成
JP4953589B2 (ja) * 2005-05-25 2012-06-13 株式会社ミツトヨ エンコーダの原点信号生成方法及び装置
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JP6104662B2 (ja) * 2013-03-25 2017-03-29 株式会社東芝 計測装置、方法及びプログラム
US10620709B2 (en) 2013-04-05 2020-04-14 Ultrahaptics IP Two Limited Customized gesture interpretation
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CN111489382B (zh) * 2019-01-28 2023-03-31 合肥美亚光电技术股份有限公司 编码条纹图的获取以及基于结构光的重构的方法和装置
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Publication number Priority date Publication date Assignee Title
JP2012508370A (ja) * 2008-11-07 2012-04-05 ソシエテ ド テクノロジー ミシュラン 能動的立体視によるタイヤ表面の凹凸評価

Also Published As

Publication number Publication date
NL7609498A (nl) 1977-03-01
ES451007A1 (es) 1977-08-16
SE432021B (sv) 1984-03-12
FR2322358B1 ( ) 1981-11-27
US4145991A (en) 1979-03-27
SE7609326L (sv) 1977-02-28
CA1079965A (en) 1980-06-24
FR2322358A1 (fr) 1977-03-25
JPS5229252A (en) 1977-03-04
SE8204577D0 (sv) 1982-08-04
SE8204577L (sv) 1982-08-04
CH611016A5 ( ) 1979-05-15
IT1073688B (it) 1985-04-17
US4175862A (en) 1979-11-27
DK386576A (da) 1977-02-28
DE2637905A1 (de) 1977-03-10
BE845465A (fr) 1976-12-16
GB1570091A (en) 1980-06-25

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