JPS62280840A - レジスト材料およびパタ−ン形成方法 - Google Patents
レジスト材料およびパタ−ン形成方法Info
- Publication number
- JPS62280840A JPS62280840A JP61126592A JP12659286A JPS62280840A JP S62280840 A JPS62280840 A JP S62280840A JP 61126592 A JP61126592 A JP 61126592A JP 12659286 A JP12659286 A JP 12659286A JP S62280840 A JPS62280840 A JP S62280840A
- Authority
- JP
- Japan
- Prior art keywords
- resist
- layer
- etching
- pattern
- organic polymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000463 material Substances 0.000 title claims abstract description 19
- 238000000034 method Methods 0.000 title claims abstract description 19
- 229920000642 polymer Polymers 0.000 claims abstract description 18
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 claims abstract description 14
- 238000001312 dry etching Methods 0.000 claims abstract description 9
- 229920000620 organic polymer Polymers 0.000 claims description 14
- 239000000758 substrate Substances 0.000 claims description 6
- 125000000217 alkyl group Chemical group 0.000 claims description 4
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 4
- 238000005516 engineering process Methods 0.000 claims description 2
- 238000001459 lithography Methods 0.000 claims description 2
- 239000000126 substance Substances 0.000 claims 2
- 230000000873 masking effect Effects 0.000 claims 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 12
- 238000005530 etching Methods 0.000 abstract description 10
- 229910052710 silicon Inorganic materials 0.000 abstract description 9
- 239000010703 silicon Substances 0.000 abstract description 9
- 239000000203 mixture Substances 0.000 abstract description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract description 4
- 239000001301 oxygen Substances 0.000 abstract description 4
- 229910052760 oxygen Inorganic materials 0.000 abstract description 4
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 238000010894 electron beam technology Methods 0.000 description 5
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- CSNNHWWHGAXBCP-UHFFFAOYSA-L Magnesium sulfate Chemical compound [Mg+2].[O-][S+2]([O-])([O-])[O-] CSNNHWWHGAXBCP-UHFFFAOYSA-L 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 238000004821 distillation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000015654 memory Effects 0.000 description 2
- 239000000178 monomer Substances 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 1
- OZAIFHULBGXAKX-VAWYXSNFSA-N AIBN Substances N#CC(C)(C)\N=N\C(C)(C)C#N OZAIFHULBGXAKX-VAWYXSNFSA-N 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- WETWJCDKMRHUPV-UHFFFAOYSA-N acetyl chloride Chemical compound CC(Cl)=O WETWJCDKMRHUPV-UHFFFAOYSA-N 0.000 description 1
- 239000012346 acetyl chloride Substances 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- RDHPKYGYEGBMSE-UHFFFAOYSA-N bromoethane Chemical compound CCBr RDHPKYGYEGBMSE-UHFFFAOYSA-N 0.000 description 1
- GJCAUTWJWBFMFU-UHFFFAOYSA-N chloro-dimethyl-trimethylsilylsilane Chemical compound C[Si](C)(C)[Si](C)(C)Cl GJCAUTWJWBFMFU-UHFFFAOYSA-N 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- NEXSMEBSBIABKL-UHFFFAOYSA-N hexamethyldisilane Chemical compound C[Si](C)(C)[Si](C)(C)C NEXSMEBSBIABKL-UHFFFAOYSA-N 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 229910052943 magnesium sulfate Inorganic materials 0.000 description 1
- 235000019341 magnesium sulphate Nutrition 0.000 description 1
- -1 methyl ethyl Chemical group 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- FIONWRDVKJFHRC-UHFFFAOYSA-N trimethyl(2-phenylethenyl)silane Chemical compound C[Si](C)(C)C=CC1=CC=CC=C1 FIONWRDVKJFHRC-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
- G03F7/0758—Macromolecular compounds containing Si-O, Si-C or Si-N bonds with silicon- containing groups in the side chains
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61126592A JPS62280840A (ja) | 1986-05-30 | 1986-05-30 | レジスト材料およびパタ−ン形成方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61126592A JPS62280840A (ja) | 1986-05-30 | 1986-05-30 | レジスト材料およびパタ−ン形成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62280840A true JPS62280840A (ja) | 1987-12-05 |
JPH054666B2 JPH054666B2 (enrdf_load_stackoverflow) | 1993-01-20 |
Family
ID=14938998
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61126592A Granted JPS62280840A (ja) | 1986-05-30 | 1986-05-30 | レジスト材料およびパタ−ン形成方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62280840A (enrdf_load_stackoverflow) |
-
1986
- 1986-05-30 JP JP61126592A patent/JPS62280840A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH054666B2 (enrdf_load_stackoverflow) | 1993-01-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4028131B2 (ja) | フォトレジスト重合体とその製造方法、フォトレジスト組成物、及びフォトレジストパターンの形成方法 | |
JPH02289858A (ja) | フォトレジスト・パターンの製造方法 | |
JPS6052845A (ja) | パタ−ン形成材料 | |
US4764247A (en) | Silicon containing resists | |
EP0439289A2 (en) | Pattern-forming method and radiation resist for use when working this pattern-forming method | |
JPS6049647B2 (ja) | 光又は放射線硬化性ポリオルガノシロキサン組成物 | |
JPH04350657A (ja) | レジスト材 | |
JPS6360892B2 (enrdf_load_stackoverflow) | ||
JPH05249681A (ja) | 酸分解性化合物及びそれを含有するポジ型感放射線性レジスト組成物 | |
JPS62280839A (ja) | レジスト材料およびパタ−ン形成方法 | |
JPS62280840A (ja) | レジスト材料およびパタ−ン形成方法 | |
US4795692A (en) | Negative-working polymers useful as X-ray or E-beam resists | |
JPH08193167A (ja) | 感光性樹脂組成物 | |
JPH04107561A (ja) | レジスト組成物 | |
JPS6347752A (ja) | レジスト材料およびパタ−ン形成方法 | |
JPS6347753A (ja) | レジスト材料およびパタ−ン形成方法 | |
JPS5979247A (ja) | 遠紫外線または電子線感応用レジスト | |
JPS62135823A (ja) | レジスト組成物およびパタ−ン形成方法 | |
JPS62135822A (ja) | レジスト組成物およびパタ−ン形成方法 | |
JPS62177005A (ja) | ケイ素原子を含むスチレン系重合体およびパタ−ン形成方法 | |
JPS6120031A (ja) | レジスト材料およびその製造方法 | |
US4678850A (en) | Halogenated polystyrenes for electron beam, X-ray and photo resists | |
JPS62177004A (ja) | ケイ素原子を含むスチレン系重合体およびパタ−ン形成方法 | |
JPS59121042A (ja) | ネガ型レジスト組成物 | |
JPH04159553A (ja) | 感光性樹脂組成物 |