JPS62235498A - Barrel plating method for electronic parts - Google Patents

Barrel plating method for electronic parts

Info

Publication number
JPS62235498A
JPS62235498A JP7870886A JP7870886A JPS62235498A JP S62235498 A JPS62235498 A JP S62235498A JP 7870886 A JP7870886 A JP 7870886A JP 7870886 A JP7870886 A JP 7870886A JP S62235498 A JPS62235498 A JP S62235498A
Authority
JP
Japan
Prior art keywords
bodies
barrel
plating
rough
specific gravity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7870886A
Other languages
Japanese (ja)
Other versions
JPH0830280B2 (en
Inventor
Masato Doi
眞人 土井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP61078708A priority Critical patent/JPH0830280B2/en
Publication of JPS62235498A publication Critical patent/JPS62235498A/en
Publication of JPH0830280B2 publication Critical patent/JPH0830280B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To form plated layers of a uniform thickness on rough bodies by putting the rough bodies, regulators having a lower specific gravity and a larger size then the rough bodies and electron absorbing bodies made of an anionic conductive metal in a barrel, rotating the barrel and carrying out plating. CONSTITUTION:Many rough bodies 7 to be plated, many regulators (ceramic balls) 10 having a lower specific gravity and a larger size than the rough bodies 7 and many electron absorbing bodies 9 which are electrically conductive small balls smaller than the rough bodies 7 are simultaneously put in a barrel 4. The barrel 4 is immersed in a plating soln. 1 in a plating tank 2 and rotated. Electric current is then supplied between a cathode lead 3 and a metallic anode 5 to plate the rough bodies 7. At this time, the regulators 10, the rough bodies 7 and the electron absorbing bodies 9 are liable to form upper, middle and lower layers, respectively. Since the regulators 10 press down the rough bodies 7 into the layer of the electron absorbing bodies 9, the rough bodies 7 are uniformly provided with minus potential by more frequent contact with the electron absorbing bodies 9. Accordingly, plated layers of a uniform thickness can be formed on the rough bodies 7.

Description

【発明の詳細な説明】[Detailed description of the invention] 【産業上の利用分野】[Industrial application field]

この発明は、電子部品のバレルメッキ方法に関し、バレ
ルに投入された多数個の電子部品の素体表面に、均一か
つ適当な厚さのメッキ層を形成するように改良した方法
に関する。
The present invention relates to a barrel plating method for electronic components, and more particularly to an improved method for forming a plating layer of uniform and appropriate thickness on the surfaces of a large number of electronic components loaded into a barrel.

【従来の技術】[Conventional technology]

チップ抵抗器などの電子部品の電極メッキは、バレルメ
ッキ装置を利用したバレルメッキ法によって行なわれる
。 すなわち、メッキ層を施すべき多数の素体を、ダミーと
俗称される導電金属製率ボールからなる多数個の吸電体
とともにバレル内に投入し、これをメッキ液内で回転さ
せるとともにバレル内に導入された陰極リードとバレル
外に配置された金属陽極間を所定時間通電することによ
り行なわれる。 金属陽極から熔解してイオン化した金属は、上記の陰極
リードないしダミーを介してマイナス電位を与えられた
各素体の表面上に析出し、メッキ層が形成される。 ここで、上記ダミーは、点的な陰極リードから、バレル
内に分散する多数個の素体のすべてにむらなくマイナス
電位を与えるための電気通路としての役割を担っている
Electrode plating of electronic components such as chip resistors is performed by a barrel plating method using a barrel plating device. That is, a large number of elements to be plated are placed in a barrel along with a large number of electricity absorbers made of conductive metal balls, commonly called dummies, and are rotated in a plating solution while being placed inside the barrel. This is done by energizing for a predetermined period of time between the introduced cathode lead and the metal anode placed outside the barrel. The metal melted and ionized from the metal anode is deposited on the surface of each element body to which a negative potential is applied via the cathode lead or dummy, forming a plating layer. Here, the dummy plays the role of an electrical path for uniformly applying a negative potential to all of the numerous element bodies distributed within the barrel from the point cathode lead.

【発明が解決しようとする問題点】[Problems to be solved by the invention]

一般にメッキの成長はバレル内の表面層(上層部)にて
起こるといわれているが、上記のようなバレルメッキ方
法においては、通常セラミックを素材とする素体と、金
属でできたダミーの比重が異なるため、たとえバレルが
回転してもダミ一群と素体群が分離して層を形成する傾
向は失なわれない。そのため、バレル内の上層部と下部
の攪拌状態が悪くなり、素体に形成されるメッキ層厚み
に大きなバラツキが生じるという問題がある。 また、チップ抵抗器の電極をメッキにより形成する場合
、メッキ液濃度および通電時間が同じでも、抵抗値の違
いによってこれに形成されるメッキ層厚さが異なる。し
たがって、抵抗値が異なるチップ抵抗器の素体に一定の
厚さの電極をメッキ形成するには、メッキ液濃度を変え
るか、または通電時間ないしは通電電流値を変更する必
要がある。しかしながら、このような調整を既存のバレ
ルメッキ装置において行なうことは非常に面倒であり、
かつ熟練を要し、自動化になじまない面がある。 この発明は、上記のような事情のもとで考え出されたも
ので、バレルに投入される多数個の素体表面に、厚さに
バラツキの少ないメッキ層を形成することができ、かつ
、たとえば投入する素体の抵抗値が異なっても、簡単な
手順によって均一な厚さのメッキ層を形成することがで
きるように改良した電子部品のバレルメッキ方法を提供
することをその課題とする。
It is generally said that plating growth occurs on the surface layer (upper layer) inside the barrel, but in the barrel plating method described above, the specific gravity of the ceramic body and the metal dummy is Even if the barrel rotates, the tendency for the dummy group and the elementary body group to separate and form a layer will not be lost. Therefore, there is a problem in that the agitation condition between the upper and lower parts of the barrel deteriorates, resulting in large variations in the thickness of the plating layer formed on the element body. Furthermore, when electrodes of a chip resistor are formed by plating, even if the plating solution concentration and current application time are the same, the thickness of the plating layer formed thereon differs due to the difference in resistance value. Therefore, in order to plate electrodes of a constant thickness on the elements of chip resistors having different resistance values, it is necessary to change the concentration of the plating solution, or change the energization time or the energization current value. However, it is extremely troublesome to make such adjustments in existing barrel plating equipment.
It also requires skill and is not suitable for automation. This invention was devised under the above circumstances, and it is possible to form a plating layer with little variation in thickness on the surfaces of a large number of element bodies that are put into the barrel, and, An object of the present invention is to provide an improved barrel plating method for electronic components so that a plating layer of uniform thickness can be formed by a simple procedure even if the resistance values of the input elements differ.

【問題を解決するための手段】[Means to solve the problem]

上記の問題を解決するため、本願の第一の発明方法では
、次の技術的手段を講じている。 すなわち、バレルメッキ装置のバレル内に、メッキ層を
形成すべき多数個の素体と、この素体の比重と同等もし
くはそれ以下の比重をもち、かつ大きさが素体と同等も
しくはそれ以上の多数個の調整体と、バレル内の陰イオ
ンを伝導する多数個の金属吸電体とを投入するようにし
ている。 上記調整体の表面に導電コーティングを施すと、本発明
の効果がなお一層高まる。 そして本願の第二の発明方法では、バレルメッキ装置の
バレル内に、メッキ層を形成すべき多数個の素体と、こ
の素体の比重と同等もしくはそれ以下の比重をもち、か
つ大きさが素体と同等もしくはそれ以上であり、表面に
導電コーティングを施こした多数個の調整体とを投入し
ている。
In order to solve the above problem, the first invention method of the present application takes the following technical measures. In other words, in the barrel of a barrel plating device, there are a large number of elements on which plating layers are to be formed, and a material having a specific gravity equal to or less than that of the elements, and a size equal to or larger than the elements. A large number of regulators and a large number of metal current absorbers that conduct anions in the barrel are inserted. When a conductive coating is applied to the surface of the adjustment body, the effects of the present invention are further enhanced. In the second invention method of the present application, in the barrel of the barrel plating device, there are a large number of element bodies on which plating layers are to be formed, and the element bodies have a specific gravity equal to or less than that of the element bodies and have a size. It is equipped with a large number of adjustment bodies that are equal to or greater than the base body and have conductive coatings on their surfaces.

【作用】[Effect]

調整体は、その比重が素体と同等かもしくは小さく、か
つ素体と同等かもしくは大きい外形をもっているので、
素体とともにバレル内に投入してバレルを回転させると
、調整体層が素体層より上位に位置する傾向が生まれる
。この傾向を維持しながら素体および調整体がバレル内
を循環型はんされるときに、調整体は、素体を、それよ
り下方に層を形成する金属吸電体層にもぐり込ませる作
用をなす。 また、上記調整体に導電コーティングを施す場合には、
調整体自体がイオンを吸収するため、被電着面積の増加
となり素体のメッキ厚さを抑制する作用をなす。
The adjustment body has a specific gravity equal to or smaller than the element body, and an outer shape equal to or larger than the element body, so
When the element is put into the barrel together with the element and the barrel is rotated, the adjustment layer tends to be positioned above the element layer. When the element body and adjustment body are circulated in the barrel while maintaining this tendency, the adjustment body has the effect of causing the element body to sink into the metal electric absorber layer forming a layer below it. to do. In addition, when applying a conductive coating to the above adjustment body,
Since the adjustment body itself absorbs ions, the area to be electrodeposited increases and the plating thickness of the element body is suppressed.

【効果】【effect】

したがって、調整体により上層部に位置する素体層を下
部にもぐり込ませ、バレル内部の攪拌を良くすることで
メッキ厚さのバラツキを小さくすることができ、また、
厚さの調整が可能になる。 また、調整体の投入量によって、イオン吸収効果を変化
させることができるので、素体の量に対する調整体の投
入量を変えることによって、実質的にメッキ層厚さを調
整することができる。たとえば、素体の抵抗値が異なる
場合にメッキ層厚さを均一にするには、従来、通電電流
値あるいは通電時間を調整する必要があったが、本発明
によれば、素体の抵抗値によって、その素体の量に対す
る調整体の投入量を調節することによって、通電電流値
あるいは通電時間を管理してこれらを変更しなくとも、
均一な厚さのメッキ層を形成することができる。
Therefore, by using the adjusting body to push the element layer located in the upper part into the lower part and improving the agitation inside the barrel, it is possible to reduce the variation in plating thickness.
The thickness can be adjusted. Further, since the ion absorption effect can be changed by changing the amount of the adjusting body added, the thickness of the plating layer can be substantially adjusted by changing the amount of the adjusting body added relative to the amount of the element body. For example, in order to make the plating layer thickness uniform when the resistance value of the element body is different, it was conventionally necessary to adjust the current value or the energization time, but according to the present invention, the resistance value of the element body By adjusting the amount of regulator added to the amount of element, it is possible to control the energizing current value or energizing time without changing these.
A plating layer of uniform thickness can be formed.

【実施例の説明】[Explanation of Examples]

以下、この発明の実施例を図面を参照して具体的に説明
する。 バレルメッキ装置6は、メッキ液1を貯留するメッキ[
2と、このメッキ槽2内に?+ ’tRされて回転する
有孔バレル4とを備えて構成される。通常このバレル4
は、メッキ槽2の縁に設けられる電極サドルに対して着
脱可能に装着されるようになっており、電極サドルに電
気的に接続される陰極リード3がバレル4内部に導入さ
れる。また、金属陽極5がバレル4外のメッキ液lに浸
漬される。 上記電極サドルおよび金属陽極5は、図示しない整流器
の陰陽各端子に接続される。 本発明のメッキ方法では、上記のバレル4内に、メッキ
層を形成すべき多数個の素体7と、この素体7より小さ
い導電性小ボールでできた多数個の吸電体9と、上記素
体7より比重が小さく、かつ外形が大きい多数個の調整
体10とを同時に投入し、かつこれをメッキ槽2内に浸
漬して回転させ、かつ陰極リード3と金属陽極5間を通
電することにより行なう。チップ抵抗器の電極にメッキ
を施す場合には、第2図に示すように、基板に厚膜形成
により形成されたAg/Pd(銀・パラジウム)系の内
部電極被膜11に、Ntにッケル)またはCu(銅)の
保護メッキ[13を施す工程を行なった後、Sn/Pb
 (はんだ)またはSn(錫)系のメッキN14を施す
。したがって、Ag/Pdの内部電極被膜が形成された
チップ、またはさらにNiまたはSnメブキが施こされ
たものが、本発明における素体となる。また、調整体1
0としては、上記チップ抵抗器がセラミック基板を基材
としてることから、セラミック製のボールを用いると好
適である。 第1図に示すように、これら素体7、調整体10および
吸電体9を同時投入したバレルを回転させると、上から
、調整体10の層、素体7の屓および吸電体9の層が形
成されるという傾向が生じる。調整体10は、その外形
が素体7より大きくかつ比重が小さく、吸電体9は金属
ボールでできていて比重が素体7より大きいと同時に外
形が素体より小さいからである。バレル4を回転させる
と、調整体10、素体7および吸電体9は、上記の傾向
を維持したまま、それぞれが循環攪はんされるのである
が、このとき、調整体10が素体7を吸電体9の層内に
押し下げる作用をし、素体7が吸電体9に接触する機会
が増えて一様にマイナス電位を与えられ、その結果、素
体層の各所における素体7のメッキ層厚さにバラツキや
ムラが生じることが回避される。 また、上記調整体10に導電コーティングを施すことに
より生ずるイオン吸収作用は調整体lOの投入量によっ
てその度合が変化するので、通電時間および通電量が一
定であっても、調整体10の投入量によってメッキ層厚
さを調節することができ、メッキ層が均一化し本発明の
効果が増大する。たとえば、チップ抵抗器の場合、抵抗
値が小さいものにメッキを施す場合には調整体投入量を
多くし、逆に抵抗値が大きいものにメッキを施す場合に
は調整体投入量を少なくすることにより、メッキ層厚さ
を均一とすることができる。 このように本発明の電子装置のバレルメッキ方法は、多
数個投入される素体に形成されるメッキ層の厚みのバラ
ツキが少なくなり、製品品質が一定するのみならず、バ
レルメッキ装置の通電装置を調整したりするという面倒
な操作を必要とすことなく、メッキ層厚さを実質的に調
節することができる。 さらに、上記調整体10に導電コーティングを施す場合
には、金属基の吸電体9の投入を省略することができる
。すなわち、調整体10自体が陰極リードから素体への
電気通路となるとともに、バレル内部の攪拌を良好にし
てその結果、素体に対し、厚さのバラツキの少ないメッ
キ層を形成することができるのである。この場合、バレ
ル内容物の総重量が非常に小さくなり、取り扱いが便利
になるという効果を発揮する。
Embodiments of the present invention will be specifically described below with reference to the drawings. The barrel plating device 6 stores the plating solution 1 [
2 and inside this plating tank 2? + 'tR and rotates a perforated barrel 4. Usually this barrel 4
is adapted to be removably attached to an electrode saddle provided at the edge of the plating tank 2, and a cathode lead 3 electrically connected to the electrode saddle is introduced into the barrel 4. Further, the metal anode 5 is immersed in the plating solution l outside the barrel 4. The electrode saddle and metal anode 5 are connected to negative and negative terminals of a rectifier (not shown). In the plating method of the present invention, a large number of element bodies 7 on which plating layers are to be formed, and a large number of current absorbers 9 made of conductive small balls smaller than the element bodies 7 are placed in the barrel 4, A large number of adjusting bodies 10 having a smaller specific gravity and a larger external shape than the element body 7 are simultaneously introduced, and they are immersed and rotated in the plating tank 2, and electricity is applied between the cathode lead 3 and the metal anode 5. Do by doing. When plating the electrodes of a chip resistor, as shown in FIG. Or after carrying out the step of applying Cu (copper) protective plating [13], Sn/Pb
(solder) or Sn (tin) based plating N14 is applied. Therefore, a chip on which an internal electrode coating of Ag/Pd is formed, or one further coated with Ni or Sn coating, becomes the element body in the present invention. In addition, adjustment body 1
0, since the chip resistor is based on a ceramic substrate, it is preferable to use a ceramic ball. As shown in FIG. 1, when the barrel into which the element body 7, the adjustment body 10, and the electricity absorber 9 are simultaneously charged is rotated, the layer of the adjustment body 10, the bottom of the element body 7, and the electricity absorption body 9 are arranged in order from above. There is a tendency for layers to form. This is because the adjustment body 10 has a larger external shape and a smaller specific gravity than the element body 7, and the electric absorber 9 is made of a metal ball and has a larger specific gravity than the element body 7 and a smaller outer shape than the element body. When the barrel 4 is rotated, the adjustment body 10, the element body 7, and the electricity absorber 9 are each circulated and agitated while maintaining the above-mentioned tendency. 7 into the layer of the electric absorber 9, the chance of the element body 7 coming into contact with the electric absorber 9 increases, and a negative potential is applied uniformly, and as a result, the element body in various parts of the element layer Variations and unevenness in the thickness of the plating layer No. 7 can be avoided. Furthermore, the degree of ion absorption effect produced by applying a conductive coating to the regulating body 10 changes depending on the amount of the regulating body 10 added, so even if the energization time and the amount of current are constant, the amount of the regulating body 10 charged As a result, the thickness of the plating layer can be adjusted, making the plating layer uniform, and increasing the effects of the present invention. For example, in the case of a chip resistor, when plating something with a small resistance value, increase the amount of regulator used, and conversely, when plating something with a large resistance value, reduce the amount of regulator used. Accordingly, the thickness of the plating layer can be made uniform. As described above, the barrel plating method for electronic devices of the present invention not only reduces the variation in the thickness of the plating layer formed on the elements that are loaded in large numbers and maintains a constant product quality, but also improves the energizing device of the barrel plating device. The plating layer thickness can be substantially adjusted without the need for troublesome operations such as adjusting the plating layer thickness. Furthermore, when applying a conductive coating to the adjusting body 10, it is possible to omit adding the metal-based electricity absorbing body 9. That is, the adjusting body 10 itself serves as an electrical path from the cathode lead to the element body, and also improves agitation inside the barrel, thereby making it possible to form a plating layer with less variation in thickness on the element body. It is. In this case, the total weight of the contents of the barrel becomes very small, making handling convenient.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例の断面図、第2図は素体と
してのチップ抵抗器の拡大断面図である。 4・・・バレル、6・・・バレルメッキ装置、?・・・
素体、8・・・メッキ層、9・・・吸電体、10・・・
調整体。
FIG. 1 is a sectional view of an embodiment of the present invention, and FIG. 2 is an enlarged sectional view of a chip resistor as an element body. 4...barrel, 6...barrel plating equipment, ? ...
Element body, 8... Plated layer, 9... Electricity absorber, 10...
Adjustment body.

Claims (3)

【特許請求の範囲】[Claims] (1)バレルメッキ装置によって電子部品にメッキ層を
形成する方法であって、バレルメッキ装置のバレル内に
、メッキ層を形成すべき多数個の素体と、この素体の比
重と同等もしくはそれ以下の比重をもち、かつ大きさが
素体と同等もしくはそれ以上の多数個の調整体と、バレ
ル内の陰イオンを伝導する多数個の金属吸電体とを投入
することを特徴とする、電子部品のバレルメッキ方法。
(1) A method of forming a plating layer on an electronic component using a barrel plating device, in which a large number of elements on which the plating layer is to be formed are placed in the barrel of the barrel plating device, and the specific gravity of the element is equal to or higher than that of the element. It is characterized by introducing a large number of adjusting bodies having the following specific gravity and a size equal to or larger than the element body, and a large number of metal electricity absorbing bodies that conduct the anions in the barrel, Barrel plating method for electronic components.
(2)上記調整体の表面に導電性コーティングを施した
ことを特徴とする、特許請求の範囲第1項に記載の方法
(2) The method according to claim 1, wherein a conductive coating is applied to the surface of the adjusting body.
(3)バレルメッキ装置によって電子部品にメッキ層を
形成する方法であって、バレルメッキ装置のバレル内に
、メッキ層を形成すべき多数個の素体と、この素体の比
重と同等もしくはそれ以下の比重をもち、大きさが素体
と同等もしくはそれ以上で、かつ表面に導電性コーティ
ングを施こした多数個の調整体とを投入することを特徴
とする、バレルメッキ方法。
(3) A method of forming a plating layer on an electronic component using a barrel plating device, in which a large number of elements on which the plating layer is to be formed are placed in the barrel of the barrel plating device, and the specific gravity of the element is equal to or higher than that of the element. A barrel plating method characterized by introducing a large number of adjustment bodies having the following specific gravity, the size of which is equal to or larger than the base body, and whose surface is coated with a conductive coating.
JP61078708A 1986-04-04 1986-04-04 Barrel plating method for electronic parts Expired - Fee Related JPH0830280B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61078708A JPH0830280B2 (en) 1986-04-04 1986-04-04 Barrel plating method for electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61078708A JPH0830280B2 (en) 1986-04-04 1986-04-04 Barrel plating method for electronic parts

Publications (2)

Publication Number Publication Date
JPS62235498A true JPS62235498A (en) 1987-10-15
JPH0830280B2 JPH0830280B2 (en) 1996-03-27

Family

ID=13669363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61078708A Expired - Fee Related JPH0830280B2 (en) 1986-04-04 1986-04-04 Barrel plating method for electronic parts

Country Status (1)

Country Link
JP (1) JPH0830280B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0247803A (en) * 1988-08-10 1990-02-16 Taiyo Yuden Co Ltd Manufacture of film resistor
GB2259523A (en) * 1991-09-13 1993-03-17 Murata Manufacturing Co Electroplating miniature parts in bulk
US6322685B1 (en) * 1998-05-13 2001-11-27 International Business Machines Corporation Apparatus and method for plating coatings on to fine powder materials and use of the powder therefrom
JP2008248272A (en) * 2007-03-29 2008-10-16 Tdk Corp Plating apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5368632A (en) * 1976-12-01 1978-06-19 Fujitsu Ltd Barrel plating treatment method
JPS57161094A (en) * 1981-03-31 1982-10-04 Suzuki Motor Co Ltd Barrel plating method
JPS5842799A (en) * 1981-09-04 1983-03-12 Fujitsu Ltd Barrel plating method
JPS6115999A (en) * 1984-07-02 1986-01-24 Rohm Co Ltd Dummy for barrel plating and method for subjecting electronic parts to barrel plating

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5368632A (en) * 1976-12-01 1978-06-19 Fujitsu Ltd Barrel plating treatment method
JPS57161094A (en) * 1981-03-31 1982-10-04 Suzuki Motor Co Ltd Barrel plating method
JPS5842799A (en) * 1981-09-04 1983-03-12 Fujitsu Ltd Barrel plating method
JPS6115999A (en) * 1984-07-02 1986-01-24 Rohm Co Ltd Dummy for barrel plating and method for subjecting electronic parts to barrel plating

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0247803A (en) * 1988-08-10 1990-02-16 Taiyo Yuden Co Ltd Manufacture of film resistor
GB2259523A (en) * 1991-09-13 1993-03-17 Murata Manufacturing Co Electroplating miniature parts in bulk
JPH0570999A (en) * 1991-09-13 1993-03-23 Murata Mfg Co Ltd Method for plating small-size part
GB2259523B (en) * 1991-09-13 1995-04-26 Murata Manufacturing Co Method of plating miniature parts
US6322685B1 (en) * 1998-05-13 2001-11-27 International Business Machines Corporation Apparatus and method for plating coatings on to fine powder materials and use of the powder therefrom
JP2008248272A (en) * 2007-03-29 2008-10-16 Tdk Corp Plating apparatus

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