JPS622253B2 - - Google Patents

Info

Publication number
JPS622253B2
JPS622253B2 JP11458582A JP11458582A JPS622253B2 JP S622253 B2 JPS622253 B2 JP S622253B2 JP 11458582 A JP11458582 A JP 11458582A JP 11458582 A JP11458582 A JP 11458582A JP S622253 B2 JPS622253 B2 JP S622253B2
Authority
JP
Japan
Prior art keywords
arm
sample
stylus
parallel
test device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11458582A
Other languages
English (en)
Japanese (ja)
Other versions
JPS593340A (ja
Inventor
Seiichi Uchimura
Shuji Ueda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP57114585A priority Critical patent/JPS593340A/ja
Publication of JPS593340A publication Critical patent/JPS593340A/ja
Publication of JPS622253B2 publication Critical patent/JPS622253B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40Investigating hardness or rebound hardness
    • G01N3/42Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • G01N3/46Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid the indentors performing a scratching movement

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP57114585A 1982-06-30 1982-06-30 引つかき試験装置 Granted JPS593340A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57114585A JPS593340A (ja) 1982-06-30 1982-06-30 引つかき試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57114585A JPS593340A (ja) 1982-06-30 1982-06-30 引つかき試験装置

Publications (2)

Publication Number Publication Date
JPS593340A JPS593340A (ja) 1984-01-10
JPS622253B2 true JPS622253B2 (cg-RX-API-DMAC7.html) 1987-01-19

Family

ID=14641527

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57114585A Granted JPS593340A (ja) 1982-06-30 1982-06-30 引つかき試験装置

Country Status (1)

Country Link
JP (1) JPS593340A (cg-RX-API-DMAC7.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6381239U (cg-RX-API-DMAC7.html) * 1986-11-15 1988-05-28
JP2602905Y2 (ja) * 1991-03-18 2000-02-07 株式会社ブリヂストン 反発弾性試験装置
CN105628527B (zh) * 2016-03-28 2018-07-31 西南交通大学 一种用于划痕试验仪器的自平衡可替换式刮头

Also Published As

Publication number Publication date
JPS593340A (ja) 1984-01-10

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